Showing results: 226 - 240 of 601 items found.
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SM-5006 -
MCH Instruments Co.,Ltd.
is used for the early test in the development of electrical products, troubleshooting of CATV/MATV system as well as the test and trouble diagnosis of cellular phone system. Combined with the near field probes of Mz530, it can detect the missing fields of radio frequency
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SM-5011 -
MCH Instruments Co.,Ltd.
is used for the early test in the development of electrical products, troubleshooting of CATV/MATV system as well as the test and trouble diagnosis of cellular phone system. Combined with the near field probes of Mz530, it can detect the missing fields of radio frequency
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SM-5010 -
MCH Instruments Co.,Ltd.
Is used for the early test in the development of electrical products, troubleshooting of CATV/MATV system as well as the test and trouble diagnosis of cellular phone system. Combined with the near field probes of Mz530, it can detect the missing fields of radio frequency
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SM-5005 -
MCH Instruments Co.,Ltd.
Is used for the early test in the development of electrical products, troubleshooting of CATV/MATV system as well as the test and trouble diagnosis of cellular phone system. Combined with the near field probes of Mz530, it can detect the missing fields of radio frequency
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142-1 -
Electronic Specialties Inc.
This 64 inch pair of test leads connects with many different testing accessories and probes. Especially those found in typical test lead kits and assortments. The ends terminate in universal size 4mm banana plugs.
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FT Flexitest Family -
ABB Ltd.
The ABB FT test kit comes with a convenient carrying case to hold your hand held meter, test plugs patch cords, clips, and test probes in neat order. Patch cords are highly durable and flexible. Test switch accessories include: Test plugs Test kits Covers Interlocking bars Miscellaneous
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PortaTest -
Schleich Gmbh
Portatesters are easy to use. Based on the test standard, you select the corresponding test sequence. Then, the required test probe and the electrode gap for the selected test standard is displayed. The setting gauge, included in the scope of delivery, facilitates the adjustment of the electrode gap. Afterwards you fill the insulating oil in the test vessel and close the test chamber.
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Direct Dock -
SV Probe, Inc.
Direct dock style wafer probing allows for a higher bandwidth, increased pin density and testing more devices in parallel. Direct dock probe cards also support the growing movement of traditional final test to wafer probe which allows for known good die (KGD) and reduced cost of ownership.
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AP031 -
Teledyne LeCroy
The HVD3000A series of high voltage differential probes cover the fullest range of applications, from 120/240 V switch-mode power supplies through 600 V class and 5 kV electrical apparatus. The table below provides a list of recommended probe models based on specific device under test applications.
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1965 -
Peaceful Thriving Enterprise Co Ltd
*Pocket clip.*Bright LED indication.*No test leads required.*Screwdriver voltage probe.*Check voltage on 12-440V AC.*With UL and RoHS Approval.*Two LR44, 1.5V batteries included.*Tests for voltage, continuity and polarity.
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Criterion Instruments Limited
PORTABLE OIL TEST. Test voltage rises up with 3 different speeds. Interchangeable oil cups sit in cradle contacts inside a test chamber with safety high-voltage interlock and hinged grounded metal lid with 2 windows to see the arc across the probes.
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UWE Electronics
A lot of companies build test sockets. But only our test sockets are populated with our own proprietary probe technology, developed internally. This assures you that when you purchase one of our test sockets, you are using the most advanced interconnect available.
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VC43™/VC43EAF™ -
Celadon
VC43™/VC43EAF™ probe cards offer a larger format version of the popular VC20. In addition to saving time, another advantage of the modularity is the ability to leave the interface in place and simply install the VC43™ topside using Celadon’s twist and lock insertion tool which minimizes the possibility of triboelectric or interconnect issues that can occur during typical probe card changes. The VC43™ can be used for production parametric test, modeling, characterization, and wafer level reliability testing. Cards can be configured up to 104 probes in either single or dual layer with near vertical probes to minimize scrub lengths on pads allowing the VC43s to probe pads as small as 30 microns.
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Aerodyn Engineering, Inc.
AEI offers industry leading aerothermal rake and probe design and manufacuring. Aerodyn's unique combination of extensive in-house capabilities and close-knit structure allows challenging and time pressured rake and probe jobs to be handled. AEI welcomes anything from simple make-to-print jobs to elaborate design/fabricate/proof test projects.
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A.T.i. Software GmbH
Analog components (resistance, capacitance, inductance, diodes, transistors, etc.) as well as complex digital components can be tested in the ICT. Compared to other test methods (e.g. flying probe), the in-circuit test enables very short test times (= high assembly throughput) combined with a very high test coverage.