Showing results: 106 - 120 of 342 items found.
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KLA-Tencor Corp
An error-free reticle (also known as a photomask or mask) represents a critical element in achieving high semiconductor device yields, since reticle defects or pattern placement errors can be replicated in many die on production wafers. Reticles are built upon blanks: substrates of quartz deposited with absorber films. KLA’s portfolio of reticle inspection, metrology and data analytics systems help blank, reticle and IC manufacturers identify reticle defects and pattern placement errors, thereby reducing yield risk.
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Qinhuangdao Boostsolar Photovoltaic Equipment Co., Ltd
- Automatically generate the current date folder. Under the current date folder, hidden cracks, virtual welds, fragments, and other folders are automatically generated. The image is automatically saved as a file named after the barcode, stored in the current date folder. If the component is defective, click the corresponding defect button, and the component image will be automatically stored in the corresponding defect folder. - A password is required before setting parameters. - Select the automatic mode, and the image will be captured automat ically After the component is transferred into place.
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Qinhuangdao Boostsolar Photovoltaic Equipment Co., Ltd
- Automatically generate the current date folder. Under the current date folder, hidden cracks, virtual welds, fragments, and other folders are automatically generated. The image is automatically saved as a file named after the barcode, stored in the current date folder. If the component is defective, click the corresponding defect button, and the component image will be automatically stored in the corresponding defect folder. - A password is required before setting parameters. - Select the automatic mode, and the image will be captured automat ically After the component is transferred into place.
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VS6845A -
Industrial Vision Technology Pte Ltd.
With its unique optical design technology, the System detects and classifies defects that affect yield and uses advanced photoluminescence (PL) technology to enable real-time monitoring of MOCVD production processes.
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testo AG
Thermography tools are indispensable when it comes to non-contact detection of thermal differences. Thermal imagers can be used to find defects in buildings, discover damage during maintenance, or analyze thermal processes.
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QA Mentor, Inc.
Our principal goal is to catch defects (e.g., database design, source data, ETL process, data quality) early, to help reduce your costs and lower your risks.
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Marantz Electronic Ltd.
Metrological Full 3D AOI is achieved by measuring all 3 dimensions (X, Y and Height) to detect every measurable solder and component defect pre-reflow and/or post reflow soldering.
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MDb-01 -
Hachmann Innovative Elektronik
MicroDetect basic is a handy, exact and simply useable voltage detector and interface-tester. Its automatic, thorough self-test ensures reliable function. The permanently enabled interface-tester warns against defect interfaces.
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7505-K006 -
Chroma ATE Inc.
The Chroma 7505-K006 Cylindrical Battery Cell Automated Optical Inspection System equipped with high-resolution camera can perform 2D defect detection that is suitable for inspecting various sizes of cylindrical batteries on the mainstream market.
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Zenith LiTE -
Koh Young Technology
Minimizes Shadow Problems with 4way projectionEasy Programming with parametric approachReal time defect diagnosis and root cause removalrortified 2D features using 9 channel RGB lights100% 3D measurement inspection.
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UNIVANS Co., Ltd.
IC Package It is a device to install INTERFACE between TESTER and DEVICE during TEST to check electrical defects such as O / S (Open, Short) test, mounting test, BURN-IN TEST and RLC TEST, The device
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Angara 2.0 -
ViTec Co. Ltd
The automated labeling quality control system is designed to identify and reject pharmaceutical labels that have defects in permanent printing (applied in a printing house) and variable printing (applied by an industrial printer as part of a labeling machine).
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Pickering Interfaces Ltd.
Pickering's PCI Fault/Signal Insertion Switch Cards feature a breakout arrangement that allows faults to be attached to the sensor lines, this includes the breaking of a connection or the adding of defect all of which can simulate connectivity problems in the system.
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LIGHTsPEED -
Unity Semiconductor SAS
High throughput• Nanometer scale sensitivity• Autofocus• Full haze characterization• Multisize capability• Pits / Particle distinction• High lifetime / low CoO solid state laser• Advanced Automatic Defect Classification
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qTest Manager -
QASymphony
Automatically sync project requirements structures with test case structures.Link requirements to test cases and defects for complete tractability.Create, baseline and modify requirements with proper version control.Visualize testing progress with our custom dashboard.
