- Pickering Interfaces Inc.
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PXI Fault Insertion Insertion Switch Modules
Our PXI Fault Insertion Insertion Switch Modules feature a breakout arrangement that allows faults to be attached to the sensor lines, this includes the breaking of a connection or the adding of defect – all of which can simulate connectivity problems in the system.
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PXI Fault Insertion Matrix Modules
All of our fault insertion matrices feature a breakout arrangement that allows faults to be attached to the sensor lines via the Y axis. This includes the breaking of a connection or the adding of a series defect – all of which can simulate connectivity problems in the system. The three pin breakout versions allow the connection to be swapped for a “bad” sensor simulation.
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PCI Fault Insertion Switch Cards
Pickering's PCI Fault/Signal Insertion Switch Cards feature a breakout arrangement that allows faults to be attached to the sensor lines, this includes the breaking of a connection or the adding of defect all of which can simulate connectivity problems in the system.
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Static Analysis Tool
CodeSonar
Automated static analysis designed for zero-tolerance defect environments. CodeSonar, GrammaTech''s flagship static analysis software, identifies programming bugs that can result in system crashes, memory corruption, leaks, data races, and security vulnerabilities. By analyzing both source code and binaries, CodeSonar empowers developers to eliminate the most costly and hard-to-find defects early in the application development lifecycle.
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Environmental Stress Screening (ESS) Chamber
ESS
Developed to help electronics manufacturers detect product defects and production flaws, Environmental Stress Screening (ESS) forces infancy product failures that would otherwise occur after final assembly and product delivery. ESS’s goal is to improve profitability by eliminating defective products. ESS Systems can meet individual performance needs, product loading, and throughput requirements. Thermotron has the experience to provide the best solution for ESS testing at your company.
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MicroPhase I LRP - Dual Phase Voltage Detector / Phase Comparator
MP1-02P
Hachmann Innovative Elektronik
MicroPhase I LRP is an easily operated phase comparator, dual voltage detector and maintenance tester. Its automatic, thorough self-test ensures reliable function. The permanently enabled interface-testers warn against defect interfaces. Thanks to the "LRP-switch" the threshold value can be lowered from 2,5 µA (HR, MR, LR and LRM) to 1,0 µA (LRP).
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High-speed In-Line 3D CT Inspection System
X-eye 6300
Automatically inspects the defects of products in customer's line with high-speed 3D CT tomography.Able to inspect every defects of Double-sided PCBA & BGA mounted components precisely by solving overlapped X-ray image issue.Inspection speed of 3 sec/1FOV from loading to automatic Good/NG judgement.
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Translating process images into significant tool-defect reduction
Trans-Imager
Real-time, tool-specific defectivity data. Now there is a way to monitor defectivity on individual processing tools – automatically – in real-time. Microtronic’s new Trans-Imager software module is able to take high-resolution images directly from your processing equipment and immediately detect and displaymacro wafer defects – transferring all of that information into our powerful and long-proven ProcessGuard software which provides a wealth of defect management and analysis. This new capabili...show more -
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Front-end
With geometries getting smaller, macro inspection becomes both more challenging and crucial for defect-free and high-yield wafer manufacturing. The variety of defects calls for detection optimization, fast screening and categorization of the high volume manufacturing environment, while maintaining high throughput.
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3D Sensors (Main Screen)
surfaceCONTROL
surfaceCONTROL sensors are used for 3D measurements and surface inspections. The sensors use the fringe projection principle to detect diffuse reflecting surface and to generate a 3D point cloud. This point cloud is subsequently evaluated in order to recognize geometry, extremely small defects and discontinuities on the surface. Sensors with different measurement areas are available. This enables the inspection of the finest of structures on components as well as shape deviations on large-area attachments. Powerful software packages are available for evaluation and parameter setting.
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UV Cameras
Solar blind UV cameras are imaging devices optimized to detect ultraviolet light of wavelengths below about 280nm. Such cameras are insensitive against sunlight due to negligible sensitivity to visible and long wavelength UV light. Solar blind UV cameras are used in a series of applications like corona detection, fire detection, combustion analysis, plasma research, testing UV lamps, etc. However, highly sensitive corona detection is the main mass application and these devices are of crucial im...show more -
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Isolation Tester UIP
The devices of the UIP (Union Isolations Prüfer) isolation tester series are used to test the pore-free condition of corrosion protection coatings of pipes, vessels or plant system parts. The battery-powered device generates test voltages between 5 kV and 30 kV, which are applied to the grounded test object via test electrodes. The location of a defect is signalized by a spark-over with an additional audible warning.
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Composite Damage Checker
35RDC
The handheld 35RDC is a simple Go/No-Go ultrasonic instrument designed to detect subsurface defects caused by impact damage on solid laminate aircraft composite structures. The 35RDC features a backlit LCD that displays the word GOOD if no subsurface damage is found or the word BAD when it detects subsurface damage.
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Sorter
IV-200I
IV-200I is a sorter for package in pocket tape that features a lot summary information. This product is used for mapping data with Defect Code Data/Report as well as exporting data or report archiving. IV-200I works well with an In.D X-ray Image Analyser.
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Ceramics and Glass Inspection Systems
Due to their special material properties, ceramic and glass components are the basis of many high-tech products. The same properties make the production complex and costly. Substrate defects that lead to failure of finished components should be avoided at all costs. For this reason, early automated optical inspection is essential.For the inspection of sapphire and quartz glass Intego has developed systems to detect both external and internal defects and can also provide cutting suggestions. Usin...show more -
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Defect Inspection Systems
Candela® defect inspection systems detect and classify a wide range of critical defects on compound semiconductor substrates (GaN, GaAs, InP, sapphire, SiC, etc.) and hard disk drives, with high sensitivity at production throughputs.
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In-Sight Vision System
D900
The In-Sight D900 is a smart camera powered by In-Sight ViDi software designed specifically to run deep learning applications. This embedded solution helps factory automation customers easily solve challenging industrial OCR, assembly verification, and random defect detection applications anywhere on the line that have gone uninspected because they are often too difficult to program with traditional, rule-based machine vision tools.
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AOI & SPI, Test Systems
SigmaX SPI
Most defects in the circuit-board assembly are due to the solder paste or the process of printing solder paste. Since the transition to lead-free soldering, a whole new spectrum of problems has emerged in older paste printing and its due processes. Incomplete coalescence of ball grid array (BGA) spheres and solder paste deposits are failure modes that have increased in frequency since the transition to lead-free soldering. The SigmaXs inspection technology is unaffected by varying materials, surface conditions, or colors. The system profiles the board to generate accurate 3D shapes far superior to other brands and technologies.
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Complex of Visualization and Image Recording for a Video Microscope
To develop a complex for visual inspection of electronic components (other micro-objects) in order to identify visual defects, record the resulting image and transfer information for processing.
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Surface Paint Quality Scanner
Konica Minolta Sensing Americas, Inc
There is always a challenge to achieve a consistent high quality surface on a car body during production. The goal of the manufactures is to reduce defects and, quickly and accurately fix the ones that occur.
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Data Warehouse and ETL Testing Services
Our principal goal is to catch defects (e.g., database design, source data, ETL process, data quality) early, to help reduce your costs and lower your risks.
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X-Ray Inspection System
MX1
Manncorp’s new MX1 is a high-performance x-ray inspection system designed for real time imaging of multilayer PCBs and dense metal BGAs, μBGAs, and chip scale packages. Its high voltage (80kV), computer-controlled x-ray tube and 35 μm focal spot provide the power necessary for detection of a variety of defects including bridging, voids, and missing balls. The MX1’s standard camera features continuous zoom magnification from 4X to 50X and variable angle viewing up to 45°, and an upgrade to the x-ray tube can boost magnification to 225X.
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Automated Surface Inspection for Glossy Components
Flawlessly glossy surfaces are among the most important quality features of many premium products. The smallest surface defects immediately have a degrading effect on the product. The result: disappointed end customers or buyers. At the same time, reflective surfaces are often very sensitive and a challenge for optical metrology. A manual inspection is tedious, expensive, and ultimately always governed by subjective decision criteria. During production, faulty painting or coating processes can c...show more -
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PocketDetect LRM
PD-01LM
Hachmann Innovative Elektronik
With a PocketDetect LRM you have a highly specialized, miniaturized and easy-going voltage detector at your fingertips. A thorough self-test ensures reliable function. A permanently enabled interface-tester warns against defect interfaces or residual voltages, while the low-power long-term display mode secures live working. The PocketDetect can be carried along due to its diminutive dimensions and lightweight (e.g. in the optional available belt case).
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Non- Destructive Testing
NDT
Non-destructive testing (NDT) is an application of industrial radiography that uses X-rays to reveal defects in manufactured products or structures. Fujifilm NDT systems share digital X-ray innovations with our Fuji Computed Radiography (FCR) imaging systems.
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SOLAR CELL TESTER
The tester is designed for terrestrial solar cell incoming/outcoming inspection with the purpose of checking and optimizing parameters and preventing manufacture defects of solar modules. Solar cells are not heated in process of inspection due to the use of xenon pulse lamp installed in the tester.
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Dual Voltage Detector / Maintenance Tester
MicroPhase I
Hachmann Innovative Elektronik
MicroPhase I is an easily operated phase comparator, dual voltage detector and maintenance tester. Its automatic, thorough self-test ensures reliable function. The permanently enabled interface-testers warn against defect interfaces. The integrated "Universal Phase Comparator" compares two different interface signals, even if they are of different interface type or voltage. A unique error control avoids switching errors caused by erratic or unfeasible phase comparison.
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Automated Live Fish Measuring System
The system for measuring and identifying aquatic organisms is designed to measure the linear dimensions and volume of live fish on a conveyor. The conveyor speed can reach 2.5 m / s, that is, up to 5 fish can pass through the installation in one second.The measurement of the thickness and volume of fish is carried out using a specialized camera Sick Ranger D40, which works on the principle of laser triangulation.The camera operation is synchronized with the conveyor movement using the Sick DGS-6...show more -
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Companion Tool to VS for Test Time & Pin reduction
UltraScan
UltraScan is SynTest's solution to combat increase in test time. In 130 nm or smaller ? nanometer geometries, many defects become delay defects and it becomes necessary to use delay tests to detect the transition faults and path delay faults. Often bridging tests are also required.
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Multi-Layer Analysis for Next Generation PONs
Multi-ONU Emulator
The NG-PON Xpert multi-layer analyzer is a unique, real-time protocol analyzer for XG-PON1, NG-PON2 and XGS-PON networks and products. The Multi-ONU Emulator introduces a new revolutionary approach for comprehensive testing of an OLT. It enhances the testing with repeatable test scenarios and functionalities that cannot be tested in any other way, including the OLT's ability to handle various ONU models and configurations, error and defect conditions, alarms and traffic loads.
