SFP+ Test
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Distributed Simulation & Test Environment
Modular hardware and software architecture with multipurpose modules and components in a common and reconfigurable simulation and test environment easily adaptable to meet project‐ and customer‐specific requirements.
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Attribute Testing
Critical attribute testing during manual or automated processing is essential to any manufacturing success. Tech Group has developed many testing solutions both standard and custom-made for mainly electronics and mechanical industry. Our modular designs give the advantage to offer short lead-time, cost efficient solutions according to your exact needs.
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Tan Delta Test System
Diagnostic test that indicates the degree of cable insulation degradation. Rather than using only a VLF instrument to perform a go/no-go proof test, the Tan Delta, used in conjunction with a VLF hipot, permits the user to grade the deterioration level of many cables in order to prioritize replacement, rejuvenation, or to determine what additional tests may be useful.
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Test Solutions For Integrators
Beyond being your test equipment expert, Testek can also provide engineering design advice and guidance on building complete test solution facilities. We will work closely with your building contractor to advise on the most optimal layout configuration and to specify all facility resource requirements. For systems that may share resources, we can facilitate resource demand and management, including power management and fluid management. With a central control system, we can provide software logic to monitor these resources and route them appropriately based on demand and priority.
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Test Adapter
cPCI/VME/VME64x
The test adapter is used for measurement and testing of test specimen boards, which gives optimal access of signals, address lines as well as power from backplane assembly. Usually the test adapter includes fields for voltage and amp, current measurements and in some cases also some pins for wire wrap to conduct custom connections.
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Switchgear Test Systems / Circuit Breaker Testing
ACTAS test systems provide precise information as to the condition of the chamber and drive unit without requiring them to be opened. The sheer number of parameters to be determined, the wide variety of different types of switchgear equipment in use and the harsh environmental conditions encountered during on-site tests place extreme demands on test equipment.
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Meter Test Board
MTB
The accuracy of TESCO’s Meter Test Board (MTB-3050) is now available in multi-position test boards to perform individual or simultaneous accuracy tests in the meter shop!
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Switchgear Test Equipment
HTKGG-H / 520
Wuhan Huatian Electric Power Automation Co., Ltd.
For manufacturers in the factory before the high and low voltage switch cabinet to carry out different power test.
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MEMS Microphone Test
The market is driving the need for improved voice recognition for security, automobile infotainment control, VoIP, accurate language translation, voice-activated consumer devices and high precision hearing aids. The latest next-generation microphones require highly accurate precision testing with SNR tests up to 78 dB with high parallelism, high UPH, in a high volume production environment.
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Cable-End Test Fixtures
Test Head Engineering's cable-end fixtures are used in the production of cable harnesses and in the testing of finished products. They are the long-lasting "connector" to the test system - taking the place of connectors that would quickly exceed their cycle life and produce erratic test results. Cable-end fixtures are used in the automotive and heavy equipment industries, but are also applicable wherever low cycle-life connectors are used - including RF cables.
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Torsion Testing Machine
Unique ‘TALCON-CLAW’ Grips for Round and Flat SpecimensTorsional Speed of 0.1/0.2 RPMTorque Compensated MotorsMaintenance Free Gear Box Auto Range Selection with Range Selector Wheel (Optional)3 or 4 Torque Ranges for Higher Accuracy (Optional)Load-unload Capability Variable Speed Drive (Optional)
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Test Switches and Accessories
Test switches are designed and manufactured to allow quick and easy multi-circuit testing of switchboard relays, meters and instruments by any conventional system.These test switches and related test plugs have the features necessary for applications involving the measurement of individual currents and voltages associated with substation instrumentation and protection devices. They have been especially designed for the measurement of potential elements, current elements, and make-before-break short-circuit elements related to Current Transformer (CT) circuits.
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Plate Load Test Apparatus
These test machine isused to estimate the bearing capacity of a soil under field loading conditions for a specific loading plate and depth of embedment (ASTM) , and also for load tests of soil and flexible pavement components in evaluation and design of airport and highway pavements . We propose a complete range of plate load testing equipment conforming to the different standards.
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Monitoring & Drive Test Antennas
Linear polarized half-wave dipole with 1:1 balun and fixed element length for fieldstrength measurements at TETRA (terrestrical trunked radio) networks.
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ICT Test Probes
C.C.P. Contact Probes Co., LTD.
Our In-Circuit Test Probes are used for all kinds of PCB tests. We offer a standard portfolio as well as customized parts.
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Distributed Test Manager
DTM
The Distributed Test Manager (DTM) is a Windows™ application which enables many different types of system level testing by simulating multiple devices in a system. DTM is a system level simulator that is unique compared to other Triangle MicroWorks tools which test the communications of a single device. DTM is a highly extensible tool with multiple options for configuring devices, creating test cases, and simulating data in the system.
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Brake Test Systems
Worldwide, high-speed transport is getting more important. Only through continued improvement and expansion of braking systems, will suppliers all around the world provide a solid foundation for safe traffic. HORIBA has been successfully making brake test stands for more than 90 years.
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Emulation & Test Interface
Solder down modules to suit any package type provides a cost effective solution for replacement test heads, male or female. The mating top modules can incorporate either a ZIF or standard IC socket and the addition of optional test pins if required from RS Components.
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Contact Resistance Test Sets
When a high current passes through a pair of mechanically independent metallic contacts, the resistance must be as low as possible. An increase in resistance can lead to additional degradation, as I2R losses will cause local heating of the contact surfaces. Our range of micro-ohmmeters measure both steady state and dynamic low resistance values. With test currents up to 600A available, logging and trending are also available on some models. We ensure that our Contact Resistance tests sets are portable, making them suitable for field measurements. Our contact resistance testers’ portability makes them ideal for a vast range of resistance testing across the entire LV, MV HV and EHV spectrum.
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Test Contactors
OCwype
Johnstech International Corporation
The new OCwype™ contactors are the latest in a long line of Johnstech products that allow companies to reduce costs and time to market.
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Electronic Test And Measurement Systems
Summaries, information, & tutorials about electronics test and measurement equipment & techniques.
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Battery & Supercapacitor Test Series
Next Generation Instrumental (Shanghai) T&C Tech. Co., Ltd.
NGI Battery & Supercapacitor Test Series
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L2-7 10GbE Test Solutions
NGY 10GE SFP+ and 10G BASE-T Load Modules
Keysight Network Applications and Security
Ixia's 10 Gigabit Ethernet LSM10GXM test load modules delivers an industry-leading, high-density, affordable layer 2 through 7, 10 Gigabit Ethernet IP test solution. The NGY family supports both low port count layer 2/3 applications with limited project budgets and highest density test lab, QA, and system test applications. NGY is perfect for both converged data center infrastructure testing and 10GbE switch test beds. NGY load modules leverage Ixia's converged data center test applications to offer the high port scalability, virtual scalability, protocol coverage, with an affordable test solution for data communications testing.
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Battery Testing Chambers
We supply a variety of test chambers for testing small battery cells to large lithium ion battery packs. Battery test chambers are supplied to a variety of industries including telecommunications, computer and automotive. With the goal of reducing automobile emissions and the development of electric vehicles, the need for lithium ion battery testing is even more critical. Our proven experience provides the most cost-effective solutions. Each test chamber is built according to specific test requirements and may be interfaced with battery cyclers, control & monitoring data acquisitions systems and other test equipment for a complete integrated test solution. All environmental chambers are designed with safety in mind. A variety of safety features are provided for reliability and abuse testing of batteries. These features may be incorporated into CSZ test chambers and tailored to the various hazard levels of EUCAR (European Council for Automotive R&D), a consortium of European car manufacturers. To better assess the hazard potential of tests, EUCAR has investigated hazardous situations and divided them into eight risk classes. The development of the safety equipment of our battery test systems is also based on this classification. For each hazard level, we recommend specific safety options that can be included with your chamber to meet your specifications to safety test your product. Together with our customers, we assess which safety devices are necessary for the respective test chambers.
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Memory Test Systems
T5503HS2
Semiconductor memories are in high demand to meet the needs of fast-growing end markets such as portable electronics and servers. It has been forecasted that applications ranging from mobile devices and data centers to automobiles, gaming systems and graphics cards will consume an estimated 120 billion gigabits of DRAM capacity. To meet this market demand, new generations of memories with data-transfer speeds of 6.4 Gbps and higher are being developed. Advantest’s second-generation T5503HS2 tester is designed to handle these ultra-high-speed memory ICs.
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Battery Module/Battery Pack Test
The battery test system CT3001B and CT3001D provide solutions for battery module/battery pack test with higher current/voltage. They can also be used in situations that batteries are charged/discharged at high rates. Different current/voltage range and channels numbers can be custom made based on the requirement.
