Distance Measurers
Measure the linear space between two points.
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Network Analyzer N-Port Calibrated Measurements
S95551B
PXI vector network analyzers (VNA) offer the capability to extend the number of ports for your measurements by using additional modules. When multiple modules are used, they are configured for multiport operation. The S95551B adds a multiport analyzer mode that enables full multiport error correction and measurement capabilities. The instruments may be identified as one VNA by the firmware running on an external host PC. At least one VNA instrument connected to your PC must have one S95551B license to maintain N-port capabilities.
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Academic Suite of 3D Measurement Solutions
Creaform ACADEMIA™
Provides a complete and collaborative skill-nurturing academic solution. The suite let’s you choose from our full line of 3D scanners and portable CMM, free application software, complimentary add-ons as well as useful tools tailored to get you started with industrial 3D measurement solutions.
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Electronic Test & Measurement Equipment
We are known worldwide for the M.O.L.E. Temperature Profiler. The Mole is used in the Electronic, Paint, Food, and the Industrial marketplace. The Mole is a stand alone, 6 channel, temperature profiler that it is used in many harsh processes that require the temperature measuring instrument to be inside the heating chamber or "ride along" with the parts or process being measured over time such as Solder Reflow Ovens and Wave SolderMachines.
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3D Measurement And Inspection
LOTOS
LOTOS automatic measuring systems can measure the full outer contours or individual areas of any measurement object quickly and precisely, irrespective of the shape, and test them for imperfections. The three-dimensional, non-contact measurement is carried out using optical measurement sensors with accuracy in the μm range. The result is a representation of the measurement object as a 3D model. Powerful, intuitive software allows the measurement results to be assessed extremely quickly.
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Wafer Thickness Measuring System
WT-425
Contact type can measure any materials within 0.2 µm (2 σ at 20℃ ±1℃). The wafer floats positions while measurement points change and it does not damage even thin wafers. Best for the process control of compound wafers and oxide wafers. (SiC, GaN, LT, Sapphire and Bonded Wafers)
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Software For Transformer Measuring Professional
T-Base Pro
T-Base Pro is a new powerful software for electrical testing, developed by Raytech GmbH. Years of experience in building world-class testing equipment flowed into the development, resulting in a state-of-the-art software framework. Its functionality ranges from simple data import and export using a USB stick, to the full control of the sophisticated Raytech testing devices and measurement systems remotely.
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Temperature Measurement Products
Temperature is one of the most important process variables in the industry! There are numerous options for measuring temperature—all depending on your desired temperature range, accuracy, features, and budget. So whether you are measuring temperature in a lab, in the rugged outdoors, on the plant floor, or in a hazardous area, let us supply you with the temperature measurement and temperature control products you need. Our extensive portfolio ranges from contact and noncontact (infrared) temperature meters, to digital and glass thermometers, to custom temperature probes and sensors. LESS -
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olar Cells and Modules Online Measurement System
PV-LIT
The fully automatic PV-LIT testing system offers individual and serial testing options for solar cells and complete solar modules. The modular testing system allows easy integration into existing production lines and can be used in automated serial testing for quality assurance.
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Current Measurement Board
MS 1814
*Maximum DC Voltage Rating: 15V to 75V*Maximum DC Current: 5A*Output Voltage per 1A: 1V*Maximum AC Current: 5A*Operating Temperature: 0°C to 55°C*Storage Temperature: -20°C to +65°C*90% Relative Humidity (Non-condensing)*No. of DC Current Channels: 9*No. of AC Current Channels: 4nos*Maximum AC Voltage Rating: 230VAC*Channel Selection: Through 16 CH Analog MUX*Measurement Error Over Full Temperature Range: 5%*Type of Output: Proportional voltages*Maximum Voltage Drop across Series Resistor Full Scale Measurement: 0.05VDC
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Drawing Die And Wire Measurement
Wire Diameter And Roundness Measurement
Optik Elektronik Gerätetechnik GmbH
The DGMS is a measuring system for diameter and roundness of wires, drawing dies and enameling dies. The wire diameter is measured highly accurate by an image processing system. To measure the roundness, an additional special holder is necessary to rotate the wire for the diameter measurement in several azimuths. The accuracy of the measurement is ‹1micron.
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On-Wafer Measurements
Accurate DC/CV (and RF) statistical modeling of semiconductor devices requires collecting a significant amount of measured data from different wafers across several temperatures. Keysight Technologies recommends IC-CAP WaferPro as a turn-key DC/CV and RF automated characterization solution to help modeling and device engineers achieve more efficient on-wafer measurements across temperature. This new breakthrough solution is based on IC-CAP modeling software and efficiently controls DC/CV analyzers, network analyzers, probers, switching matrixes, and temperature chucks, as well as the powerful 407x and 408x Series of Keysight parametric testers.
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Test Line • Devices for measuring electrostatic charges
HAUG offers a wide selection of easy-to-use gauges. These are field charges with which electrical charges, fields and potential can be measured. The measured values show how strongly a surface is covered with an electrostatic charge.
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Instrument Systems Display Measurement
Konica Minolta Sensing Americas, Inc
Instrument Systems brings you a selection of exciting turnkey systems for use in evaluating display characteristics. It allows for the easy measurement of different spot sizes due to the variety of interchangeable lenses. Instrument Systems display measurement products are extremely responsive and produce highly precise results.
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Pressure Measurement Film
Prescale
Prescale allows you to easily measure pressure balance, distribution, and size. Created using Fujifilm's advanced thin film coating technologies, the pressure inspection sensor on the entirety of the film allows you to confirm pressure distribution of the entire surface at a glance. The color appears red where pressure is applied, and the color density varies according to the amount of pressure. To cover a wide pressure range (0.006 to 300 MPa), we supply eight types and nine variations of Prescale.
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P104 Synchro/Resolver Measurement Board
73SD4
NAI’s 73SD4 is a DSP-based, PC104-compliant Synchro/Resolver Measurement Board with six separate, isolated channels. These channels can incorporate up to six Synchro/Resolver-to-Digital Tracking Converters in a stack-through module. Each channel also produces differential incremental encoder (A & B) outputs (with programmable resolution) and a zero-degree marker pulse. Commutation outputs are available for 4-, 6-, or 8-pole brushless DC motors that eliminate the need for Hall Effect sensors, thereby reducing both processor time and bus traffic.
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Contact Resistance Measurement Kit
LRM-10
The LRM-10 is a 10A micro-ohmmeter kit designed to measure low resistance for electrical interconnections integrity testing. The LRM-10 has a range from 0.01µΩ to 200Ω. It comes with heavy duty four points probes and it is compatible with a great variety of optional accessories.
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High precision Concentricity measurements
KONCENTRICK-V2 CONNECTOR
Koncentrik-V2 is a modular measurement system. Fiber or ferrule eccentriccity measurements can be performed using different mechanical modules. Koncentrik-V2 Connector is dedicated to eccentricity measurement of fiber core relative to ferrule envelope.
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Roughness Measurement
ZEISS ROTOS offers optimum precision and maximum flexibility when performing roughness measurements thanks to its modular design and rotation in three axes: easy-to-change stylus arms further expand the range of possible applications.
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Standard Resistors for Temperature Measurement
Measurements International Ltd.
High Stability, Split Guard Circuit, Internal Temperature Sensor, Custom Values Available, Includes Calibration Data.
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Thin-Film Thickness Measurement Systems
The Filmetrics® range of affordable reflectometers deliver high-precision thin-film thickness measurements in seconds. These easy-to-use tools, combined with intelligent software and a broad range of accessories and configurations, provide maximum versatility in film thickness measurements ranging from 1nm to 3mm.
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Automatic Hardness Measuring System
Beijing TIME High Technology Ltd.
Automated machine that measures the hardness of a material with minimal human intervention by using motorized stages, digital imaging, and software to apply force, position the sample, and calculate the results.
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Ultrasonic Wall Thickness Measurement Meters
The LaserLinc UltraGauge+™ series of ultrasonic meters and gauges measure wall thickness, layer thickness, and concentricity of plastic, rubber, glass, and metal products. Typical applications include tubing, hose, pipe, insulated wire, cable, and certain multi-layer products.
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Temperature Measurement
Describes the process of measuring a current local temperature for immediate or later evaluation. Datasets consisting of repeated standardized measurements can be used to assess temperature trends.
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30KHZ Measurement Microphone
M30
Used on countless full-scale concert tours, as well as in scientific research laboratories, tropical rainforests, and rocket testing facilities, the M30 has proven to be a lab-grade audio instrument that can handle any environment.
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Displacement Measuring Interferometers (DMI)
ZMI Series
This unit measures retroreflector targets for tracking objects moving primarily in one linear dimension or rotating about a fixed point. ZYGO offers a standard and compact size linear interferometer to accommodate different system space constraints.
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EMI Measurement Application
Fsx-k54
The EMI precompliance application (K54 option) for Rohde & Schwarz signal and spectrum analyzers is the ideal extension for EMI analysis during product development and to prepare for a smooth product certification process. Typical fields of application include commercial, automotive, avionic and military product developments (CISPR, EN, FCC, DO-160 and MIL-STD-461 standards).
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Source Measurement Unit
SMU32
The SMU32 is a low cost solution for V/I source and measurement. The SMU32 offers PMU/DPS in a compact, 3U PXI form factor. The SMU32 supports -1V to +10V +- 32 mA FVMI/FIMV modes. 8~32 PMUs can be ganged to DPS for high current driving.
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PXIe High-Speed Source/Measure Unit, 13 V, ± 1 A or 6 V, ± 3 A, 18 W
M9111A
The M9111A is a 1-slot, 2-quadrant PXIe module that provides stable, glitch-free sourcing and sinking, and high accuracy measurements. It offers high-throughput and measurement quality for design validation and production test of RF power amplifiers. With industry-leading output stability under extreme, dynamic load conditions and unmatched transient performance to dramatically reduce voltage droop due to pulse loading, the M9111A SMU speeds test time. The high-speed M9111A can change its output voltage, stabilize that voltage, and accurately measure current from Amps down to micro-Amps all in less than 1 ms so that you can move on to the next test as quickly as possible.
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Voltage, Current and Power Measurement
Educated Design & Development, Inc.
For measuring current, especially higher currents and quicker than series ammeters. These units are considered the finest available. All units are extremely rugged, reliable, and versatile.
