Showing results: 601 - 615 of 740 items found.
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51101 -
Chroma Systems Solutions, Inc.
Models with 1, 8, and 64 channels on-line data recording. Multi-sets linked to a PC for hundreds of channels are doableSupports B, E, J, K, N, R, S, and T type thermal couples with ITS-90 defined temperature rangeIndividual channel cold junction compensation withTemperature resolution up to 0.01℃, error down to (0.01% of reading+0.3℃)Voltage full range ±480VDC, ±10VDC; resolution 1mV, 10uV; error down to (0.1% of reading+1mV), (0.015% of reading+100uV)1000VDC channel to channel isolation, full protection for testing points with charge and guarantee for accurate measurementsThermal couple open circuit detectionPC-based operation with powerful software for recording and analyzing data1 and 8 channel models are USB powered. No battery or external power supply is required
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IQxel-M4W -
LitePoint Corporation
Suitable for the lab or manufacturing environment, the IQxel-M4W 6G is ideal for RF testing of wireless connectivity and IoT products. The platform’s flexible software supports the most prevalent wireless connectivity standards: WLAN 802.11ax (Wi-Fi 6) and legacy (802.11a/b/g/n/ac), Bluetooth® Classic and Low Energy (Bluetooth® LE) as well as Zigbee/Thread, Z-Wave, LPWAN technologies (Sigfox, LoRa) and cellular IoT technologies (NB-IoT, LTE-M, 5G) as well as navigational technologies.
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778572-86 -
NI
10-Channel, 12 A, SPST PXI Relay Module—The PXI‑2586 is a general-purpose switch module that features independent single‑pole single‑throw (SPST) Form A armature relays. Each relay has low contact resistance and high isolation voltage. The PXI‑2586 is fully software programmable. It is rated for both high currents and high voltages, so it is ideal for switching power signals and loads in control applications and battery, power supply, and automotive testing.
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782705-01 -
NI
The NI‑5782 is ideal for applications that require the acquisition and generation of IF or baseband signals with in-line, real-time processing. You can analyze acquired signals in the PXI FPGA Module for FlexRIO to perform measurements and generate response signals. Application areas include RF modulation and demodulation, channel emulation, bit error rate testing (BERT), signal intelligence, radio frequency identification (RFID) and near-field communication (NFC) test, real-time spectrum analysis, and software defined radio (SDR).
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782705-02 -
NI
The NI‑5782 is ideal for applications that require the acquisition and generation of IF or baseband signals with in-line, real-time processing. You can analyze acquired signals in the PXI FPGA Module for FlexRIO to perform measurements and generate response signals. Application areas include RF modulation and demodulation, channel emulation, bit error rate testing (BERT), signal intelligence, radio frequency identification (RFID) and near-field communication (NFC) test, real-time spectrum analysis, and software defined radio (SDR).
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E36155ABVX -
Keysight Technologies
The Keysight E36155ABVX consists of a Keysight E36155A DC power supply, a Keysight E36150ADVU Scope View and arbitrary waveform generation (AWG) capabilities, a Keysight E36150ATMU Automotive Standards Testing Capabilities with Enhanced Programming Speed, ISO Preset Library, Playback Simulation and E-Logging features, and Keysight BV9200B PathWave BenchVue advanced power control analysis software. The E36155A includes single-output and auto-range capabilities, 60V, 40 A, 800 W, and LAN and USB interfaces.
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E36154ABVX -
Keysight Technologies
The Keysight E36154ABVX consists of a Keysight E36154A DC power supply, a Keysight E36150ADVU Scope View and arbitrary waveform generation (AWG) capabilities, a Keysight E36150ATMU Automotive Standards Testing Capabilities with Enhanced Programming Speed, ISO Preset Library, Playback Simulation and E-Logging features, and Keysight BV9200B PathWave BenchVue advanced power control analysis software. The E36154A includes single-output and auto-range capabilities, 30V, 80 A, 800 W, and LAN and USB interfaces.
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CRY2301 -
CRYSOUND
CRY2301 Noise sensor is a new type of noise test equipment independently developed by CRY Sound for industrial grade applications. It can realize real-time noise time domain and frequency domain analysis with real-time spectrum analysis software. The product complies with such standards as IEC61672 (Class 1) and GB/T3785 (Class 1). CRY2301 integrates measurement microphone, preamplifier, data acquisition, and data communication in a compact structure. It supports an optional 1'' high-sensitivity microphone for extremely low sound pressure testing. CRY2301 uses a USB interface for data communication and power supply. As a composite USB device consisting of a USB Audio device and a HID device, it is compatible with 32-bit/64-bit Windows 7 and Windows 10 systems. CRY2301 is equipped with real-time spectrum analysis software for easy access to time and frequency domain measurements. The real-time spectrum analysis software supports frequency weighting and time weighting, and can perform acoustic analysis, such as noise statistical analysis, octave analysis, and FFT analysis.
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DP-VXI-5106 -
Data Patterns Pvt. Ltd.
DP-VXI-5106, is a 32 Channel Analog Comparator Module with 32 channels of differential analog window comparators. Each channel is provided with a window comparator as well as a Level Comparator , software selectable on an independent channel basis. All the 32 channels have been grouped into four groups of 8 channels each. This allows the user to configure the comparator module based on the application to initiate alarm action to exactly meet application requirements. Each Comparator channel can be programmed to generate a VXI bus interrupt or can be masked through software. An Interrupt is generated on an individual channel basis or on a group basis. Front panel outputs of buffered TTL and a 2-CO relay contact is available for every group (4 outputs total each). Also, a common buffered TTL interrupt output and a common 2-CO relay contact is also available at the facia providing extensive flexibility in application engineering.This module is an ideal device for GO / NO-GO testing in Test Stand Automation where important signals must be continuously monitored for system shut down purposes and safety inter-lock implementation. The hardware implementation in the Comparator module provides high-speed throughput and reliable inter-lock implementation. The interrupt out signal can be further wired as trigger signals for pre and post trigger analysis of signal data for post acquisition detailing.Each channel provides a Window Comparator implementation and a Level Comparator implementation. The configuration is programmable through software and the alarm can be generated if the signal is within the window or outside the window. Similarly, a high and low limit can be set and a trigger is generated if the signal exceeds the high limit or drops below the low limit.
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FH-1200 -
MCT, Inc.
Universal testing capabilities for film mounted strip handling. It works with semiconductor test devices including QFN, BGA, CSP and WLP to assure the highest first pass yields available by enabling increases from 1% to 10%+ through precise contactor alignment and device positioning accuracy. Supported by a cutting-edge data management system and analysis software, FH-1200 includes Smart-Track and Smart-EM – your “Virtual Process Engineer” – to handle electronic strip mapping, process control and data management.
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Laplace Instruments Ltd.
Power amplifiers that are universally used for radiated immunity testing either cover the range below 1GHz or the range above 1GHz. This means that if the test requirement extends both sides of this 1GHz point, the power amplifier needs to be changed over. Genrally, this involves three connections... The LETIS handles all these connections automatically. Each is switched via a high performance RF relay under the control of a USB interface. Software issued with the Laplace Synthesisers automatically detects the presence of a LETIS and handles the switching automatically.
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Mark-10 Corp.
Mark-10 offers a wide and unique range of motorized force measurement and torque measurement test stands. Motorized stands offer a significant advantage over manual test stands by providing constant test speed. Some models can be programmed for advanced test sequences to accommodate demanding applications. All motorized test stands carry the CE mark. A test stand is an integral part of a testing system, typically also comprising a force gauge or torque gauge, grips, software, and accessories.
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IMADA, Incorporated
Lever-operated manual systems enable rapid push/pull testing up to 220 lbf.Wheel-operated manual systems enable slower, more precise movement with the hand wheel up to 750 lbf.Motorized push/pull testers offer the most control and highest degree of repeatability with the ability to set a constant test speed and range of movement up to 1100 lbf.All push/pull testers can be configured with a digital force gauge with data output for analysis by data acquisition software. An optional digital distance meter to measure displacement is available.
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OHSP-350 Series -
Hangzhou Hopoo Optoelectronics Technology Co., Ltd
The design concept of OHSP handheld spectrometer is "integrated", mainly focusing on a lightweight and intuitive design, which can be used alone or support computer connection and simultaneous data testing. In addition, the SD card storage function can store a large amount of test data, such as data processing and analysis on PC software. OHSP's highly flexible handheld spectrometer provides measurement solutions for different types of places, different usage purposes and different usage scenarios to help you work more effectively.
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QT 200 NXG -
Qmax Test Technologies Pvt. Ltd.
QT 200 Nxg a Highly sophisticated ATE, is now available as a desktop unit with the cost, flexibility, and performance demanded by a large number of users in research, design, manufacturing, and repair & maintenance industry. It is a combinational-mixed signal board tester for PCBAs designed to cater the needs of PCB test and repair depots, keeping in mind the changing PCB technology and challenges in testing them offline with the combination of all such complex test methodologies in a single test hardware platform with simple to use graphical user interface software.
