Probing Stations
System to contact DUTs to drive and receive signals.
See Also: Probing, Probers, Nano Probes
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Product
Standard Probe Station Chucks & Accessories
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In this test solutions section of our website we describe the expanding line of Abet PV IV probe stations for the growing variety of solar cell types and sizes being developed around the world. This page describes a line of vacuum chucks and accessories for top/bottom, top/top, and bottom/bottom solar cells from 3 x 3 mm to 300 x 300 mm. Probe stations for multiple device on a single substrate and multifunction probe stations are described further in the sections highlighted to the left of this page.
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Product
Hot Chucks
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Materials Development Corporation
Probe stations to suit all measurement requirementswhether production, engineering or research. See individual data sheets for more details.
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Product
Cryogenic Probe Station
TTPX
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The TTPX probe station is an affordable, entry-level probe station capable of making a wide variety of non-destructive, standard electrical device measurements. The compact tabletop design is perfect for academic and laboratory research settings. The TTPX provides efficient cryogenic temperature operation and control with a continuous refrigeration system using either liquid helium or liquid nitrogen.
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Product
Enhanced Probe Station
EB Series
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Comprehensive prober for DC and RF. The EB series contains features to step-up your usability to acquire the accurate data you need from your devices. It has a built in probe card slot.
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Product
Probe Station
EPS300
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Reasonable price and compact design. - Sellectable chuck size : 4inch, 6inch, 8inch when ordering probe station. - Hot chuck can be installed. Temp range: RT ~ 300°C - Hot and cool chuck from 0 °C ~ 300 °C can be provided.
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Product
Microscope Spectrophotometer
508 PV
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The 508 PV™ Microscope Spectrophotometer is designed to add spectroscopy, color imaging, thin film thickness measurement and colorimetry capabilities to your optical microscope or probe station. It can also be used to upgrade an older microspectrometer with cutting edge optics, electronics and software.
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Product
Portable Manual Probing Station
Model W4.0 x L6.5
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This portable manual probing station is designed for a versatile, comfortable, and accurate operation on up to 4.0” wafers or 4.0” X 6.5” printed circuit board assemblies. This turn-key, manually operated probing station, model W4.0 x L6.5, is part of the D-COAX commitment to the test and measurement and PCB fabrication industries.
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Product
Automated DC Parametric Curve Tracer
MegaTrace
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MegaTrace supports pin counts greater than 625 up to 2160 pins, with 1080 pins being popular. Comprised of a cart that contains the test chassis, PC monitor, drive bus box, and a test interface, MegaTrace is easy to move around and use with other instruments like emission microscopes, probe stations, and other remote testing requirements.
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Product
Mini Probe Station
C-2
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The smallest probe station which still preserves the key functions and precision that are fundamental to all probing. This size is still capable of DC and RF measurements, making it the most versatile in its size.
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Product
Probe Station
EPS500
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Reasonable price and compact design. - Sellectable chuck size : 4inch, 6inch, 8inch when ordering probe station. - Hot chuck can be installed. Temp range: RT ~ 300°C - Hot and cool chuck from 0 °C ~ 300 °C can be provided. - Maximum 6pcs of manipulators can be installed on the base unit of probe station EPS500.
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Product
Technical Manual Probe Station
4060 150-200 mm
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Micromanipulator's Tech Series Probe Station, Model 4060 is designed to provide a quality 6-inch (150mm) or 8-inch (200mm) probe station at a cost effective price
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Product
Probe Card
T90™ Series
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The 90 mm tile was designed for mounting on a standard 4.5″ probe card holder for multi-site wafer level reliability testing. The 1.6 mm (0.062″) thick rails allow the chassis to slip into planarity adjustable probe card holders for most analytical probe stations.
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Product
Sealing Kit for PHD-4001A on Cascade Elite E300, Octagon CM300 Probe Station
PHD-4001-TH-Seal
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High Power Pulse Instruments GmbH
*Sealing Kit for PHD-PPM10-H9 and PHD-4001A on Cascade Octagon CM300 probe station*High temperature range -40 °C to +200 °C
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Product
Electrical Probe Systems
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INSTEC's Probe Systems offer an integrated solution for performing component-level electrical measurements over a wide temperature range.Compact Mini Probe Stages enable an existing inspection microscope or optical test setup to be converted easily into a precision temperature-controlled semiconductor testing and qualification station.Analytical probe stations are fully featured industry-standard platforms for all modern probing applications and testing.Benchtop Probe Stations provide the user with four independent electrical probes with X,Y,Z micropositioning for precise placement without opening the sample chamber.Highly configurable probe systems meet a range of requirements for atmospheric and temperature control, sample areas, and electrical measurements.
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Product
Probe Station
DARK BOX
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Size : 750 × 660 × 660 mm - Material : Steel - We can provide various dark box in size and shape at reasonable price as per customer requirements.And we also provide “integral sphere” with probe station as below.
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Product
Vector Network Analyzer Extenders
VNAX
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VDI''s VNA Extenders deliver high performance network analyzer frequency extension into the THz range. Models cover 50 GHz to 1,100GHz with additional bands in development. VDI modules come in a variety of form factors and configurations including our original Standard-size Modules and new Mini Modules that reduce volume up to 75%. In addition to our full Transceiver (TxRx) modules, VDI also offers Transmit-Reference (TxRef) modules and Receive only (Rx) modules that deliver optimized performance for specific applications. These modules combine high test port power and exceptional dynamic range to deliver industry leading performance. They are compatible with most network analyzers and can be integrated into probe stations and antenna chambers.
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Product
High Power Devices
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SemiProbe configures our PS4L Adaptive Architecture into the Voltarus (TM) family of probe stations to fulfill the unique requirements of testing high power devices at wafer level prior to packaging. Voltarus probe stations are available in manual, semiautomatic, and fully automatic configurations that can test and characterize power devices up to 10 KV or 200 Amps (pulsed).
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Product
Portable Wafer Probe Station
PS-5026B
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High Power Pulse Instruments GmbH
The PS-5026B is a rugged portable wafer probing solution which has been designed for high reliability, compact size and minimum cost.
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Product
MmW Probe Station
EB-6V
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The EB-6V probe station is designed for all frequency extenders such as those from VDI, OML, R&S, Keysight, Anritsu. If you are using an Anritsu VNA VectorStar ME7838A4 model, or commonly Anritsu 3743A mmW Extenders and related sizes, the station of interest is the EB-6A.
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Product
Cryogenic Probe Station
CRX-4K
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Designed for versatility and high performance, the CRX-4K is our premium cryogen-free closed-cycle refrigerant probe station. This system is the solution for those looking for the convenience of cryogen-free operation and the exceptional measurement performance of a Lake Shore product.
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Flying Probe Programming & Test Development
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Testing House offers full Flying Probe Programming and Test Development using its very own Seica Pilot LX Flying Probe Test Stations.
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Product
Semi-Automatic Probe Station
P300A
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The P300A probe station is the most stable, intuitive, and space efficient 300mm semi-automatic analytical probe station available today. Designed for low current, sub-micron positioning applications, the P300A comes standard with features such as single-point ground, dry/dark environment, and integrated thermal chuck plumbing.
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Product
Stimulus Induced Fault Testing
SIFT
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SIFT allows for the analysis of numerous stimuli to identify speed, fault, and parametric differences in silicon. The heart of the SIFT technique revolves around intentionally disturbing devices with external stimuli and comparing the test criteria to reference parts or timing/voltage sensitivities. Synchronous interfacing is possible to any tester without any wiring or program changes. The system can be based on either a motorized probe station or portable microscope stand for test head applications.
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Product
Probe Station
ETCP1000
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Installation of “Hot and cool chuck” - Sellectable chuck size : 4inch, 6inch. - Temperature variation : -193°C ~ 300°C (80K ~ 573K) - Additional requirements : Vacuum chamber, LN2 tank(Bombei), microscope, CCD camera, manipulators. - EPS500 is standard model in ETCP1000 probe station.
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Product
Wide 9–32V Input, VESA 75×75 Mm Dock, -10~50°C Operation, And Reliable Docking For Office Use
AIM-VSD0-0470
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9 ~ 32 V wide input voltage rangeVESA (75 x 75 mm)-compliant docking stations-10 ~ 50 °C (14 ~122 °F) operating temperatureReliable docking connector for office applications
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Product
Standard 1.50 (43.00) - 4.00 (113.00) High Performance Lead Free Probe
LFRE-25T79-4
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Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Light 0.60 (17.00) - 2.00 (57.00) High Performance Lead Free Probe
LFRE-72U-2
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Current Rating (Amps): 3Average Probe Resistance (mOhm): 15Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,700Overall Length (mm): 43.18
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Alternate 2.39 (68.00) - 6.00 (170.00) High Performance Lead Free Probe
LFRE-1I35-6
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Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Mechanical Life Remark: *Ultra High force products may observe slight decrease in cycle life.Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Elevated 2.67 (76.00) - 7.00 (198.00) High Performance Lead Free Probe
LFRE-72T20-7
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Current Rating (Amps): 3Average Probe Resistance (mOhm): 15Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,700Overall Length (mm): 43.18
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Product
Alternate 1.10 (31.18) - 7.20 (204.00) Switch Probe
TSP100-FK180-2
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Current Rating (Amps): 5Average DC Resistance lower than (mOhm): 20Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 197Full Travel (mm): 5.00Recommended Travel (mil): 157Recommended Travel (mm): 4.00Overall Length (mil): 1,990Overall Length (mm): 50.60Switch Point (mil): 59Switch Point (mm): 1.50
