Surface Contamination
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Surface Contamination Monitors
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Small-sized devices for measuring the ambient dose equivalent rate and the ambient dose equivalent of X-ray and gamma radiation, as well as measuring the flux density of beta particles (AT6130).
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Surface Contamination Kit
138/2
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The Elcometer 138/2 Surface Contamination Kit provides the user with a means for testing invisible surface contaminants including:pHchloride ionsironsalts
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Surface Contamination Monitor
IMI Inspector Alert™ V2
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The IMI Inspector Alert™ V2 measures alpha, beta, gamma and x-radiation using a 2-inch “pancake” GM detector with high sensitivity to common beta and alpha sources. The easy-to-read digital display shows readings in your choice of µSv/hr, mR/hr, CPM, or CPS. The Total/Timer feature allows timed readings from one minute to 40 hours for precise measurement of low level contamination. An audible alert sounds when the radiation reaches a user-adjustable level.
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Omicron Fiber Optic Connector
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Teledyne Impulse-PDM’s Omicron 5030/5070 optical connectors utilize proven small form factor ferrule technology and are available for multi-mode or single-mode operation.The connectors are offered, as standard, in stainless steel to BSEN10088-3 Grade 1.4404 (316L), which is electro-polished to remove surface contamination, thus improving resistance to corrosion. Connector bodies can also be manufactured in other materials, either to address specific anti-corrosion requirements, or to increase depth rating. Engaging nuts are normally manufactured in naval brass to UNS C46400.
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Elcometer Bresle Patches
135B
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Elcometer 135B Original Bresle Patches are used to determine surface chloride contamination and are self-adhesive rubber film patches with a sealed compartment for sampling soluble impurities from steel surfaces with a suitable solvent.
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Surface Quality Monitors
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PET manufactures and markets non-destructive, non-contact surface contamination and thin film detection models and automated systems (surface quality monitoring system) capable of detecting thin layer contamination, thin films and coating down to the Angstrom level. These systems represent a major breakthrough by providing, for the first time, a quantitative measure of surface cleanliness. As surface cleanliness verification instruments, in a part cleaning environment, these products are capable of validating the cleaning quality of all the part cleaning equipment available in the market. Any of SQM model series is capable of verifying metal contamination; monitoring absence/presence of organic and/or inorganic on virtually on surfaces of all metals. They are, price/performance, the most sufficient product available for testing surface of metals for surface cleanliness. These systems operate in an ambient environment, require no sample preparation or deposit of any agents on the surface. In any parts cleaning environment where the quality and efficiency of part cleaning equipment for removal of surface contamination is highly desired, these systems provide a scientific solution by quantitatively measuring the surface cleanliness. The SQM series has the sensitivity and operational simplicity required to provide fast and cost effective surface evaluation for all metals.
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Optical 12,000 Meter Connector
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Teledyne Impulse-PDM’s 5135/5175 optical connectors utilize proven standard ferrule technology and are available for multi-mode or single-mode operation.The connectors are manufactured in Titanium Ti 6Al-4V, which is electro-polished to remove surface contamination, thus improving resistance to corrosion. The engaging nuts are also manufactured in the same grade of Titanium and the threads are coated with a Nickel/PTFE composite coating to prevent galling. The connectors have been qualifi ed to 12,000 meter operating depth.
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Total Reflection X-ray Fluorescence (TXRF) Services
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A highly surface-sensitive technique, TXRF is optimized for analyzing surface metal contamination on semiconductor wafers.
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Chemical Testing
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Accolade Engineering Solutions
To ensure product environmental compliance or to gain better understanding of your materials or processes, chemical testing is often required. AES has state of the art the equipment for chemical analysis. For elemental analysis XRF, SEM/EDS or ICP can be used. For molecular analysis GCMS, HPLC and FTIR may be used. FTIR may also be used for surface analysis of contamination and our microFTIR system is suitable for the smallest samples.
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Spatial Heterodyne Surface Chemical Agent Detector
SHSCAD
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Wide area, high areal coverage rate surface contaminant detection via LWIR reflectance spectroscopy employing eye safe broadband quantum cascade lasers (QCLs) and a high-speed spatial heterodyne spectrometer (SHS) in a handheld sensor package (~ 10,000 cm3, 10 lb).
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Spectrometers
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Search and detection of gamma radiation sources with automatic identification of the radionuclide composition; Measurement of the dose rate of gamma radiation; Detection of neutron radiation and measurement of the neutron count rate (AT6102); Measurement of the dose rate of neutron radiation (external detection unit BDKN-03); Measurement of the flux density of alpha and beta particles from contaminated surfaces (external detection units BDPA-01 / BDPB-01)
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Geiger Counter
ONYX®
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ONYX features a modern, streamlined look and the use of advanced technologies, making it a one-of-a-kind Geiger Counter. It weighs only 7 oz. (200g.) and measures a mere 5.1 X 2.6 X 0.9 in. (72 X 37 X 13 mm.) making it easy to transport. Despite its compact size ONYX is capable of detecting alpha, beta and gamma radiation with the same sensitivity as the IMI Inspector Alert™, and like the IMI Inspector Alert™ V2, ONYX is optimized for surface contamination measurements through use of its 2 in. pancake Geiger Mueller tube.
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Contamination Monitors
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Control of X-ray and gamma radiation personal dose equivalent.The dosimeter together with the PC reader and the software forms an efficient automatic system for staff radiation exposure control.
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PuroMaxx Contamination Control
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Brooks offers the industry’s most advanced suite of FOUP carrier/reticle pod cleaners and photomask/reticle stockers. Using state-of-the-art humidity control along with in-situ metrology, our products address all critical airborne molecular contamination, productivity, and process stability challenges at sub20-nm nodes.
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Contamination & Clearance
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Provides the ultimate user-friendly operation, with thorough and reliable detection of external contamination on personnel working in nuclear environments.
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Surface Analysis
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A UHV surface analysis system for thin film depth profilingMeasures the surface composition of the first few nanometers and/or micrometers depth of solid samples.
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Surface Photovoltage
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The surface photovoltage spectroscopy modules are the perfect all-in-one solution for in-depth studies of light sensitive materials such as organic semiconductors, solar cells or light sensitive dyes.
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Sample Holder/Stocker For Contaminant Measurement
EDXIR-Holder
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Measure the Samples Kept in the Holder with EDX and FTIR The Holder Can Be Used as the Sample Stocker after the Measurement
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Surface Roughness Tester
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A precision instrument used to evaluate the texture of a surface, determining whether it is rough or smooth.
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Surface Analysis
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Shimadzu offers a range of instruments that are ideal for all sample forms handled by customers in the fields of steel, non-ferrous metals, environment, foods, chemicals, pharmaceuticals, semiconductors, ceramics, and polymers. EPMA/SEM offers analysis of targets from several centimeters to several microns; XPS offers analysis from several millimeters to several microns; and SPM permits observations from over a hundred microns to several nanometers.
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Salt Contamination Meter
130
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Key features of the Elcometer 130 Salt Contamination Meter include: Fast reading rate allows multiple conductivity tests to be completed efficiently Pressure plate ensures a constant and uniform pressure to paper Automatic detection of paper size and automatic adjustment of reading value USB and Bluetooth® data output to ElcoMaster® software Dust and water resistant rugged design equivalent to IP64 Automatic temperature compensation ensures accurate results Non-oxidising gold plated contacts ensures lifetime accuracy Stores up to 150,000 readings in 2,500 alpha numeric batches Fully portable hand-held, ergonomic design ideal for use in the field
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Mobile Surface Measuring
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The mobile surface measuring instruments and analysis units from ZEISS are robust and easy to use. They are suitable for non-transportable workpieces.
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Automated Monitoring of Airborne Molecular Contamination
AMC-Monitor T-1000
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The all-in-one analyzer for FOUP, fab and clean-room environment AMC monitoring in the semiconductor industry. The AMC-Monitor is a modular and flexible platform for airborne molecular contaminations (AMC) monitoring in semiconductor applications such as: FOUP analysis with a focus on VOC and condensables incl. full integration with Pfeiffer Vacuum APA 302 pod analyzer. Clean-room monitoring in fabrication plants.
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Surface Speed Meter
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Consists of an industrial grade heavy-duty surface speed encoder with metal housing and large bearings and a digital indicator. The system delivers repeatable and accurate measurements of surface speed. The dual, anti-slip rubber rimmed wheels are perfect for measuring paper, plastic, laminates and other smooth finish materials.
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Surface Calibrators
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Electronic Development Labs, Inc.
A software-driven process for gaming mice that optimizes the sensor to a specific surface's texture, reflectivity, and weave.
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Surface Mount Package Emulation
SMT Adapters
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Ironwood’s SMT package emulation adapters are often called “surface mount feet” or “emulator bases”. These adapters provide access and interconnections to surface mount lands. Typically, the adapters are soldered to the target board in place of the IC device and provide a pluggable array of pins interface for sockets, probing adapters, package converters, and even board-to-board connections. These adapters are often utilized as a base for many of our probing adapter products. We constantly innovate to provide the most reliable, cost effective interfaces available. For example, many of our PLCC, QFP and SOIC emulation bases use our proprietary shaped solder techniques, replacing expensive, and often fragile, J-lead and Gull Wing leads. Shaped solder parts are easily fluxed and reflowed onto the target system. Our emulator bases can present either a male or female interface at 1.27mm or 1mm or 0.8mm pitch gold plated array pins for pluggable connection.
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Surface Temperature Sensors
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Campbell Scientific offers two types of surface temperature sensors: infrared temperature (non-contact) and surface contact. Infrared temperature sensors measure the surface temperature of an object or surface by sensing the infrared radiation given off by the subject. Surface contact sensors attach directly to a surface and measure the temperature via physical contact.
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K Thermocouple Surface Probe
TP754
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Surface thermocouple Type “K” probe. Tolerance according to IEC 60584-2 standard.
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Surface
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Electronic Development Labs, Inc.
EDL has been handcrafting quality sensors that are robust in design and feature high accuracy with remarkable reliability. Our technicians meticulously consider every specification, meeeting the individual needs of every customer. And quality doesn’t have to mean exorbitant cost. Our sensors are always priced competitively to deliver exceptional value.
