IC Clips
Connect over the top of most chip formats contacting each chip lead.
See Also: IC, Clips, Digital IC Testers, IC Test, IC Probes
- TEAM SOLUTIONS, INC.
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IEEE-488 GPIB Device Interface IC (Chip) for the PCI-Bus
GPIB-72120
The i72120 GPIB-Chip is the ideal solution to implement a IEEE488.2 GPIB interface for next generation PCI based instruments. The GPIB-ASIC is designed to meet all of the functional requirements for talker and listener (TL) devices as specified by the IEEE Standards 488.1-1987 and 488.2-1987. Connected between the PCI bus and the GPIB, this GPIB-IC provides high-level management of the GPIB to unburden the processor and to simplify both hardware and software design. The i72120 is fully compatible with the PCI specification and requires only the addition of bus driver/receiver components to implement a talker/listener GPIB interface.
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Dip Clip, 16 Pin With Nickel Silver Contacts
3916A
Dip Clip, 16 pin with Nickel Silver contacts. Pomona DIP Clip® test clips are designed for testing dual-in-line IC packages on PC boards. These devices incorporate many built-in features that assure a positive electrical connection as well as hands free testing.
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Dip Clip, 14 Pin With Nickel Silver Contacts
5114
Pomona DIP Clip? test clips are designed fortesting dual-in-line IC packages on PC boards. Thesedevices incorporate many built-in features that assurea positive electrical connection as well as hands freetesting.
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Kelvin IC Clip Lead
16089C
Measure odd-shaped components that you cannot measure using conventional fixtures
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Surface Mount-to-DIP JEDEC SOT-25, SOT-23A-6 Adaptor
1110748
Surface Mount to DIP Adapter for SOT-25, SOT-23A-6. Allows for breadboarding or substitution of microgate SOT-23A-6 and SOT-25 IC and transistor packages into .100 [2.54] pitch proto boards or PC boards. Solder masked top-side pads allow user to hand solder devices directly to topside of adapter with fewer problems of solder bridging. Longer male bottom pins are available at special request for easy use of probe clips. Large topside pads allow for soldering test pins, jumpers, etc. to top of adapter.
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Pin Point Range Systems
The PinPoint Alpha system is a flexible, adaptable and modular PCB and IC fault finding system, which allows you to apply different electronic test methods to obtain maximum test coverage and fault detection. Test signals can be applied at the PCB edge connector or through test clips and DTIs to perform fixtureless in-circuit testing.
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Quad Flat Pack IC Clip Pair (Yellow/Green) (Qty.1 Pair)
PK-ZS-025
Quad Flat Pack IC Clip Pair (Yellow/Green) (Qty.1 Pair)
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Digital Incircuit Test
PFL780/760
The PFL780 and 760 use IC clips as a test interface. This makes them ideal for the service and maintenance of legacy systems. If you need to work on high density surface mount PCBs you should consider the GRS500 as a more suitable alternative.
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Inbuilt External Controller ATE with Touch Screen Features
QT 200NXT
Qmax Test Technologies Pvt. Ltd.
QT 200 nxT is a ultra modern stylish Inbuilt external controller ATE with touch screen features, is now available as a desktop unit with the cost, flexibility, and performance demanded by a large number of users in research, design, manufacturing, and repair & maintenance industry. It is a combinational-mixed signal board tester for PCBAs designed to cater the needs of PCB test and repair depots, keeping in mind the changing PCB technology and challenges in testing them offline with the comb...show more -
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Open/Short Tester for Reverse Engineering Applications
Panther 2K-CT
Qmax Test Technologies Pvt. Ltd.
Panther 2K-CT is a versatile open\Short tester designed especially for reverse engineering application of tracing circuits of undocumented PCBA’s.Its innovative measurement technology helps tracing PCB tracks between components in a given circuit board. It can accommodate various types of clips\grabbers and connectors to access the device pins to trace the connectivity. Its user friendly software guides the user to place and move cluster of IC clips and probes to learn the connectivity and to generate netlist.
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Dip Clip, 14 Pin With Nickel Silver Contacts
5014
Pomona DIP Clip test clips are designed fortesting dual-in-line IC packages on PC boards. Thesedevices incorporate many built-in features that assurea positive electrical connection as well as hands freetesting.
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IC Test Clips
Low-profile fine-pitch chips, desnely populated boards, or vertical boards, Pomona test clips connect you with confidence.
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Photocouplers/Optocouplers IC Output
The PS8xxx/PS9xxx series, a range of IC output type photocouplers (optocouplers), feature a high-speed response from 1Mbps to 15Mbps and a wide variety of DIP and SOP packages that can be surface mounted (SMD).
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Wideband Transceiver IC
Analog Devices wideband transceiver ICs offer a complete, high performance RF and mixed-signal system on a chip. ADI’s ISM transceivers for short range wireless systems and wideband transceivers for wireless applications such as UMTS, LTE, and 3G/4G are highly integrated and deliver best-in-class performance and significant BOM savings.
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Linear IC Tester
570A
The Model 570A Analog IC Tester's built-in test library includes all common Analog ICs including op-amps, comparators, voltage regulators, voltage references, analog switches & multiplexes, opto-isolators & couplers, and audio ICs.
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IC Test Services
With knowledge gathered from decades of supporting Tier 1 and emerging industry leaders, Amkor understands test solutions must address advanced technology, quality, performance and cost of test. We offer full turnkey solutions including wafer processing, advanced bump, wafer probe, assembly, final test, system-level test, burn-in and end-of-line services.
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Kelvin Clips
129141
Comprising of a Red/Grey & a Black/Grey Kelvin Crocodile Clip lead using low loss 1mm²multistranded ( 7/36/0.071. ) double skin silicone cables terminating in 4mm ...
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Xhorse Eeprom Clip
You need to choose the right type of eeprom with the & quot CLIP & quot In the set:
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IC Tester
ICE1
The IC Test System was developed to measure the EMC behavior of circuits (ICs) in the event of targeted field or line-related interference and for measuring emissions. The test IC is tested in function. The test environment ICE1 creates the functional environment of the test IC. The respective measurement task is carried out with the corresponding probe set.
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Triple IC Optic Node
OX 733
Converts even weak Optic Signals to a high quality RF Signal. LED BAR Optic Level Display has been provided for ease of system maintenance. They are best suitable for Analog as well as Digital transmission to maintain BER, MER Characteristics. Green Tecnology incorporated - Aluminium Housing for maximum heat dissipation.- Frequency 40 ~ 1000 MHz- Optical Wavelength : 1290 ~ 1600 nm- Flatness ±0.75 dB- LED Bar Display for Optic Signal Level- High C/N, CSO & CTB Characteristics- Inward Extruded Aluminium Channels for Maximum Heat Dissipation- High Voltage Surge Protection- -13 dBm Sensitivity- RF O/P at 0 dBm : 113 dBµV
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Compact Professional IC Tester
ChipMaster
The ABI ChipMaster Compact Professional is a low-cost, hand-held out-of-circuit IC tester. The ChipMaster is designed for testing digital ICs with up to 40 pins through a ZIF socket (see LinearMaster for analogue devices). A range of adapters is also available for SOIC and PLCC devices.
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BtoB Clip Connectors
BtoB clips are durable solutions that significantly reduce total cost of jig maintenance by using a high quality probe without using the connector on the other side.
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1 N Clip Grips
These very low force 1 N (0.22 lbf) clip grips are for tensile testing fibers, tapes, and other similar shaped specimens. They are designed for use with 50 N (11 lbf) and below load cells.
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Analog IC test system
A paradigm shift has been occurred in Japan’s major brand WL25 series tester. Ultimate simple system is available by effective analog pin architecture.This cost performance system is covered analog IC extensively, which are high accuracy, speed and multi-site test function.
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IC Testing System
Is a system for giving electrical signals to a semiconductor device to compare output signals against expected values for the purpose of testing if the device works as specified in its design specifications.
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End-of-Line IC & MEMS Tester
igentic® 841t
Integrated circuit (IC) and micro electro-mechanical system (MEMS) device manufacturers need to address the challenges of today's global market including increased functionality, speed and complexity while delivering components at reduced costs. Sterner Automation's igentic® 841t automated test systems meet these demanding requirements by providing a flexible platform for comprehensive end-of-line IC and MEMS device handling, testing, grading and packaging. The resulting improvements in quality assurance and process efficiency will maximize customer satisfaction and profitability.
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IC EMC Analysis
We carry out standard measurements according to BISS/IEC and analysis of the interference immunity and interference emissions of ICs during development.With the targeted EMC analysis, we uncover weak points in the ICs so that the IC developer can use them to develop improvements for the product
