Filter Results By:

Products

Applications

Manufacturers

Showing results: 376 - 390 of 549 items found.

  • Kestrel /SX Co-Processor

    0149-SX - Strobe Data Inc.

    Same speed Windows/NT Kestrel Co-Processor for equivalent system throughput, or more. Occupies one PCI slot. A writable control store, FPGA implementation of the HP1000 architecture with 4 MBytes of tightly coupled, zero wait-state memory. Includes compatible hardware floating point. On-card x86 microprocessor rapidly processes "virtual" I/O instructions. PCI bus speeds increase disk throughput by at least a factor of ten. HP1000 Bus support logic for non-emulated devices is provided on-board with connector to wide bandwidth fibrechannel adapter. Operates only under Windows/NT. WNT Support license included.

  • Kestrel /QX

    0149-QX - Strobe Data Inc.

    Quad+ speed Windows/NT Kestrel Co-Processor for four times the speed of the Kestrel /SX. Occupies one PCI slot. A writable control store, FPGA implementation of the HP1000 architecture with 4 MBytes of tightly coupled, zero wait-state memory. Includes compatible hardware floating point. On-card x86 microprocessor rapidly processes "virtual" I/O instructions. PCI bus speeds increase disk throughput by at least a factor of ten. HP1000 Bus support logic for non-emulated devices is provided on-board with connector to wide bandwidth fibrechannel adapter. Operates only under Windows/NT. WNT Support license included.

  • Automatic Relay Tester

    NRTS-306 - Neutronics Manufacturing Co.

    Model ‘ DY1200 ’ is an ideal, newly developed multifunction relay tester adopting monolithic computer technology. It is composed of auto synchronized digital millisecond timer, logic controlling unit, multifunction digital display, high precision digit collection and processing unit, current-voltage output unit, overload and over range protection unit. Test process is automatic for improved efficiency.

  • Semiconductor Test Equipment

    Wewon Environmental Chambers Co, Ltd.

    Probe card manufacturing need the semiconductor test equipment. When we designed the thermal testing equipment, Only some commonly used test items are packaged into the IC tester, and the logic function of the verification chip is implemented in a fixed test mode. But as chip products diversify, Some thermal inducing system can no longer do it alonehttps://www.wewontech.com/semiconductor-test-equipment/

  • Microprocessor Development System

    DS-85 - Ceibo Inc.

    * Real-Time and Transparent In-Circuit Emulator * Windows Debugger - Update 2009 * Symbolic Debugger compatible with Intel Object Files * 64K Hardware Breakpoints * 64K of Internal Memory * 32K x 32 Bit Trace Memory and Logic Analyzer with External Probes * Serially linked to IBM PC or Compatible Hosts * On-line Assembler and Disassembler * Source and Listing Windows

  • PCIe-Mini Module

    PCIe-Mini-1553 - ALPHI Technology Corporation

    • Controller of dual redundant (A/B channel) 1553 communications• PCIexpress x1 Lane Interface• DDC 1553 E• SRAM 64KX16• Programmable bus controller, remote terminal, or monitor terminal modes• Multiprotocol Support of MIL-STD01553A/B Notice 2 and STANAG 3838• +3.3V Operation and Logic• On-chip transceivers/transformer• Selectable 10,12,16 or 20 MHz Systems Clocks

  • 32-CH 80 MB/s High-Speed Digital I/O Card

    PCIe-7300A - ADLINK Technology Inc.

    ADLINK PCIe-7300A is an ultra-high-speed digital I/O card. It consists of 32 digital input/output channels. High performance designs and state-of-the-art technology make this card ideal for a wide range of applications, such as high-speed data transfer, digital pattern generation and digital pattern capture applications, and logic analyzer applications. Trigger signals are available to start the data acquisition of pattern generation.

  • Single / Dual channel Dual Redundant DDC Controller

    PCI-1553DDC-2 - ALPHI Technology Corporation

    The PCI-1553-DDC-1/2 implements a complete single channel dual-redundant MIL-STD-1553 bus terminal on a half size PCI Card. Full BC/MT/RT modes are supported. 0°C to 70°C operating temperature is standard. Included is an DDC Enhanced ACE intelligent communications protocol engine, dual transceivers and encoder / decoders, shared memory, and management logic.

  • Multifunction Instrument for Education and Training

    LabXplorer - DesignSoft, Inc.

    LabXplorer turns your desktop, laptop, tablet or smart phone into a powerful, multifunction test and measurement instrument for a wide range of applications. Instruments, whatever you need, are at your fingertips. LabXplorer provides multimeter, oscilloscope, spectrum analyzer, logic analyzer, programmable analog and digital signal generator, impedance analyzer and also measures characteristics of passive electronic components and semiconductor devices.

  • 4 Station Endurance Test Setup for Thermostat of Iron

    SCR ELEKTRONIKS

    SCR ELEKTRONIKS have developed 4 STATIONS ENDURANCE TEST SETUP FOR THERMOSTAT OF IRONwhich is used for carrying out endurance test for thermostat of iron for the required amount of time It is very useful and handy in line testing on Mass production line as well as type Testing. It consists of Voltmeter, Wattmeter, Programmable Logic Controller( PLC ). The equipment continuously monitors faults like Contact weld and Contact Open. The other important feature is we can operate the panel in Auto Mode or Manual mode. User friendly operations make the equipment to be handled easier for any operator. This manual contains information about operating instructions and maintenance of the equipment.

  • NI-9435, ±5 VDC to ±250 VDC/10 VAC to 250 VAC, 4-Channel (Sinking/Sourcing Input), 3 ms C Series Digital Module

    779010-01 - NI

    ±5 VDC to ±250 VDC/10 VAC to 250 VAC, 4-Channel (Sinking/Sourcing Input), 3 ms C Series Digital Module - The NI‑9435 works with industrial logic levels and signals to connect directly to a wide array of industrial switches, transducers, and devices. Each channel accepts signals from ±5 VDC to ±250 VDC and 10 VAC to 250 VAC; features transient overvoltage protection between the input channels and earth ground; and has an LED that indicates the status. The NI‑9435 is a correlated digital module, so it can perform correlated operations, triggering, and synchronization when installed in a CompactDAQ chassis.

  • Cantilever Probe Cards

    Venture - SV Probe, Inc.

    SV TCL's VentureTM line of cantilever probe cards, represents the finest epoxy technology on the market and are perfect for logic testing. The Venture line includes an extensive array of cantilever cards, single to multi-die for a variety of test systems. Our Venture FX™ fine pitch cantilever cards are ideal for LCD driver testing, with higher probe counts for greater density bond pad layouts.

  • FPGA PXIe Digital I/O Card

    GX3700e - Terotest Systems Ltd.

    The GX3700e is a user configurable, FPGA–based, 3U PXI Express card offering 160 digital I/O signals which can be configured for single-ended or differential interfaces. The card employs the Altera Stratix III FPGA, which can support SerDes data rates up to 1.2 Gb/s, digital I/O clock rates of 700 MHz, and features over 45,000 logic elements and 1.836 Kb of memory.

  • PXI-6541, 50 MHz, 32-Channel PXI Digital Waveform Instrument

    778952-03 - NI

    50 MHz, 32-Channel PXI Digital Waveform Instrument—The PXI‑6541 is a digital waveform generator and analyzer for interfacing with 32 single-ended digital pins. The PXI‑6541 can sample digital waveforms at up to 50 MHz and interface with common transistor‑to‑transistor logic (TTL) voltage levels. The PXI‑6541 also features advanced synchronization capabilities for building integrated mixed-signal test systems.

  • PXI-6541, 50 MHz, 32-Channel PXI Digital Waveform Instrument

    778952-02 - NI

    50 MHz, 32-Channel PXI Digital Waveform Instrument—The PXI‑6541 is a digital waveform generator and analyzer for interfacing with 32 single-ended digital pins. The PXI‑6541 can sample digital waveforms at up to 50 MHz and interface with common transistor‑to‑transistor logic (TTL) voltage levels. The PXI‑6541 also features advanced synchronization capabilities for building integrated mixed-signal test systems.

Get Help