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PXI Solid State Multiplexer Module, Dual 3-Channel, 30 A
40-667C-011
The 40-667C-011 is a dual 3-channel 30A MUX and is part of our range of high current multiplexers occupying two slots of PXI chassis. Each multiplexer switch uses a fully isolated solid state relay which has been designed to offer fast operation under hot switching conditions and high inrush current with no operational life degradation. Each multiplexer channel can support 10A of continuous current and switch up to 200V signals. The switches can sustain inrush currents in excess of 50A. AC or DC signals can be switched since the switch is polarity insensitive.
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Accelerate the Process of Evaluating
Simulia
Powered by the Powered by the 3DEXPERIENCE® Platform, SIMULIA delivers realistic simulation applications that enable users to explore real-world behavior of product, nature and life.
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Optical Technologies Solutions
AMS Technologies has a long track record of developing and manufacturing customized optical technologies solutions – tailored to the requirements of applications like: *Life Sciences *Biomedical Photoacoustic Imaging; Photoacoustic Microscopy, *Mesoscopy, Macroscopy *MALDI Mass Spectrometry (Matrix Assisted Laser Desorption Ionisation) *Fluorescence Lifetime Imaging (FLIM) *Pumping of Dye Lasers, OPOs, Raman Lasers *LIDAR *Gas Chromatography *Interferometry *Sensing *Micromachining *Marking *And Many More…
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ARINC 708 Video Distribution Units
AB2-VDU
The AB2-VDU is easily deployed and ready to operate in the most challenging environments. The unit is SWaP (Size, Weight, and Power) optimized in a compact, rugged package for easier integration and longer life.
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Brushless Electric Torque Screwdrivers
BLG-Series
The HIOS BLG-Series is a brushless electric screwdriver designed for high production environments at an affordable price. Minimal heat build-up even when tool is operated continuously. Provides precision torque control with an automatic shut-off clutch once preset torque is achieved. Features a high performance brushless motor design that provides durability and reduces the standard maintenance costs of electric screwdrivers. With almost no expendable parts and simple design, the brushless screwdriver life cycle is extended and maintains a clean working environment.
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Electric Submeters
Measurlogic carries an extensive line of AC and DC electric submeters that are easy to implement. Whether starting out with submetering for the first time, or just looking to upgrade your system, our goal is to make your life easier. We carry an array of mounting options for a sophisticated, seamless integration with your property.
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Silver Button Sockets
For BGA, QFN, or LGA applications, GTP contact technology provides >94 GHz signal speed and can additionally be used in high cycle life applications such as ATE. These sockets support pitches from 0.2 mm to 1.27 mm. Ironwood's GT sockets are ideal for prototyping and testing almost any BGA device application. These IC sockets provide excellent signal integrity yet remain cost effective. Innovative elastomer interconnect technology that delivers low signal loss (1dB at 94GHz) and supports BGA packages with pitches down to 0.2mm was utilized in these sockets. GT BGA sockets are mechanically mounted over a target system's BGA lands using mounting and alignment holes at proper locations (page 2 of the individual socket drawing shows recommended PCB layout information). These low-profile sockets are only 2.5 mm per side larger than actual IC packages (industry's smallest footprint).
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PXI/PXIe MEMS RF Multiplexer, Single 4-Channel, 4GHz, 50Ω, MCX
40-878-212
The module is based on the latest micro-electromechanical system (MEMS) switching technology and has low insertion loss and VSWR. In addition, MEMS devices have a long operational life of >3 billion operations and benefit from an operating time of <20 μs allowing greater test system throughput. The multiplexers have excellent and repeatable RF characteristics beyond 4 GHz with each path having a nominally equal insertion loss.
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Millimeter-Wave Automated Accelerated Reliability Test Systems
nm-Wave AARTS System
AARTS fully integrated, automated, turnkey system provides flexibility and accuracy in determining RF and DC performance degradation with aging to predict life expectancy for compound semiconductor devices. Our millimeter-wave Automated Accelerated Reliability Test Systems (AARTS) and fixture solutions are available in standard frequency ranges from 26.5 to 67 GHz.
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Alternate 2.52 (71.00) - 6.50 (184.00) General Purpose Probe
EPA-3H-1
Current Rating (Amps): 6Average Probe Resistance (mOhm): 35Test Center (mil): 125Test Center (mm): 3.18Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Alternate 2.39 (68.00) - 6.00 (170.00) High Performance Lead Free Probe
LFRE-1T30-6
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Mechanical Life Remark: *Ultra High force products may observe slight decrease in cycle life.Overall Length (mil): 1,300Overall Length (mm): 33.02
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Digital (1kV up) H.V. Insulation Tester
2803 IN (Ranges: 0.5kV, 1kV, 2.5kV, 5kV)
Standard Electric Works Co., Ltd
● Microprocessor-controlled.● Four insulation test voltages.● Insulation resistance; auto ranging on all ranges.● Bargraph indicates test voltage; rise and decay can be observed during tests.● Visual and audible warning if external voltage is present.● EnerSave™ feature to extend battery life.● 2 Lines × 16 characters large LCD.● Low battery consumption.● Low battery indicator.● Overload protection.● Auto-off.● Show test time duration (up to 99.9s) for easy comparison.● EEPROM calibration.● Built-in carry case and test leads in separate pouch.
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Standard 1.50 (43.00) - 4.00 (113.00) High Performance Lead Free Probe
LFRE-25H-4
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Standard 1.10 (31.00) - 3.85 (109.00) General Purpose Probe
HPA-64-2
Current Rating (Amps): 3Average Probe Resistance (mOhm): 50Test Center (mil): 100Test Center (mm): 2.54Test Center Remark: max. test center 187 mil / 4,74 mmFull Travel (mil): 50Full Travel (mm): 1.27Recommended Travel (mil): 50Recommended Travel (mm): 1.27Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 375Overall Length (mm): 9.53Overall Length Remark: Exact length depends on selected tip: Tip 1,4, 7: 0,375″; Tip 2,3,9,10: 0,365″; Tip 8: 0,385″
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Alternate 2.64 (75.00) - 6.50 (184.00) General Purpose Probe
EPA-2L-1
Current Rating (Amps): 5Average Probe Resistance (mOhm): 35Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 160Full Travel (mm): 4.06Recommended Travel (mil): 107Recommended Travel (mm): 2.72Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 970Overall Length (mm): 24.64
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POGO-72 High Performance Bias Ball Probe
POGO-72
Current Rating (Amps): 3Average Probe Resistance (mOhm): 15Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,700Overall Length (mm): 43.18
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High 3.12 (88.00) - 8.00 (227.00) High Performance Lead Free Probe
LFRE-72U-8
Current Rating (Amps): 3Average Probe Resistance (mOhm): 15Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,700Overall Length (mm): 43.18
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CAM/GATE Test Kits
Series 45
The CG Series 45 CAM/GATE linear over clamp kits utilize the same patented “Z” axis motion as our CAM/TRAC® Series products offering precise Z axis linear motion when testing higher point count and finer pitch test centers. By using the Z axis motion, side load of the test probes is minimized thus increasing probe life and performance. The latch assembly engages and disengages when actuating the clamping assembly. The CAM/GATE utilizes a cam roller system for precision guiding and smooth operation and 1.00” push plate movement. The gate assembly is movable to three different positions which allows for the versatility of top side probing, or relocating the frame assembly for PCA’s the have tall components
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E-DRIV® Brushless Electric Screwdrivers
HF-Series
The brushless electric torque screwdriver is built for precision torque control. The electric screwdriver ensures quality and reduces overall assembly failures. These durable power tools feature a Swiss Maxon brushless motor design, which reduces the common maintenance costs associated brush type electric screwdrivers. With almost no expendable parts and simple design, the brushless screwdriver life cycle is extended and maintains a clean working environment. The screwdriver requires less maintenance and part replacement and provides consistently reliable performance. Using a quality brushless electric screwdriver makes a safer world through accuracy and precision.
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High 2.84 (81.00) - 8.00 (227.00) High Performance Lead Free Probe
LFRE-25Z-8
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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RF Shielded Test Enclosure
JRE 0709-P
Containing all the capability of the larger JRE enclosures, the compact JRE 0709-P is ideal for small wireless devices such as; cell phones, pagers, WiFi dongles and other small RF devices. Featuring rugged welded aluminum construction, you can be assured of its tight RF shielding effectiveness. Long life door gasket material along with double edge engagement not only provides solid RF shielding, but smooth troublefree operation over its lifespan.
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Aluminum Electrolytic Capacitors (Radial Lead Type)
Panasonic Industrial Devices Sales Company of America
High reliability, long life, low impedance and high ripple current.
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Alternate 2.39 (68.00) - 6.00 (170.00) High Performance Lead Free Probe
LFRE-1I40-6
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Mechanical Life Remark: *Ultra High force products may observe slight decrease in cycle life.Overall Length (mil): 1,300Overall Length (mm): 33.02
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Alternate 2.39 (68.00) - 6.00 (170.00) High Performance Lead Free Probe
LFRE-1Z1-6
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Mechanical Life Remark: *Ultra High force products may observe slight decrease in cycle life.Overall Length (mil): 1,300Overall Length (mm): 33.02
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Switch Probes
Switch point flexibilityDesigned for long life and reliable performanceVariety of tip options
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4A Solid State Flasher, AC Input
A915-8
NAI’s A915-8 is a 4 A, AC Input, Aircraft Warning or Navigation Light Flasher. With low RFI/EMI, zero crossover switching employed in the output circuits, this solid state, single channel unit provides long device and load life.
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Ultra High 1.77 (50.00) - 10.00 (283.00) High Performance Lead Free Probe
LFRE-25V-10
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Brute High Current Probe
P4301-2R
Current Rating (Amps): 50Current Rating Remark: 40 Amps for BeCu plungersAverage Probe Resistance (mOhm): 5Test Center (mil): 300Test Center (mm): 7.62Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 1,750Overall Length (mm): 44.45
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Accelerated Aging
The purpose of accelerated aging testing is to speed up the effects of time on a product. This is done to predict the long-term durability and to support shelf-life and expiration dating claims. This is often used in the medical device packaging industry. The relationship between temperature and product life is utilized to determine the test duration of accelerated aging.
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Ultra High 2.84 (81.00) - 10.00 (283.00) High Performance Bias Ball Probe
POGO-1Z1-10
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
