Showing results: 271 - 285 of 543 items found.
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787137-01 -
NI
PXIe, 18-Slot (16 Hybrid Slots, 1 PXI Express Slot), DC Power Supply, Up to 12 GB/s PXI Chassis - The PXIe‑1086DC incorporates hot-swappable, redundant DC power supplies as well as hot-swappable, front-accessible, redundant cooling fans. These high-availability features improve the mean time between failure (MTBF) and mean time to repair (MTTR) of the PXI system. The PXIe‑1086DC monitors power supply health/voltages, air intake temperature, and fan health/speed; it provides any failure feedback with the status LEDs located on the chassis. This chassis is ideal for test, measurement, and control applications with demanding system uptime requirements.
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ECT
Functional testing is done to insure that a completed printed circuit board will operate correctly in the final product. Failures detected at this time will consist of interactional problems between components. Testing here can be used to set board variables such as timers or limiters to proper settings.
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Koyo Electronics Industries co., ltd
The Coil Tester can measure the number of winding, layer short and core material by comparing vibration waveforms of the applied voltage to the standard coil and the test coil. This instrument also can find an insulation failure by applying high pulse voltage and checking the corona discharge.
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Banair
The level of sophistication of the cable harness tester required will depend on the product type, failure modes and integrity required by the eventual customer. There are 3 main types of test that can be applied and this will determine which of our cable harness testers will be most suitable for your product.
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Dynamic Research and Testing Laboratories, Inc
Field failure is not an option. IEC Electronics knows the criticality of life-saving and mission critical products performing in the field. Dependable products require an expert approach to design throughout the development and manufacturing process. IEC Electronics possesses the engineering know-how and advanced capabilities to provide value-added engineering services for product design and custom functional test design to ensure your end product performs every time all the time.PRODUCT DESIGN
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40-480-221 -
Pickering Interfaces Ltd.
The 40-480 is designed to simulate the operation of automotive switches where dirty contacts or leaking current can be expected from switch contamination. It allows automotive I/O devices to be tested for correct operation under adverse conditions. The design includes protection circuits that ensure module damage cannot be caused by wiring faults or UUT failures. Each module can support up to 32 channels and is suitable for both 12V and 24V automotive applications.
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Reltech Limited
HALT is a process used on electronic assemblies and modules to determine weaknesses and the stress limits of a product by temperature cycling and omni-axial random vibration step stress. Inherent weaknesses in a products design and build are stimulated by applying increasing levels of mechanical stress. Within an accelerated timescale, faults in a product can be realised prior to product release and preventing failures occurring during after-sale user operation, very often during the warranty period.
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40-480-121 -
Pickering Interfaces Ltd.
The 40-480 is designed to simulate the operation of automotive switches where dirty contacts or leaking current can be expected from switch contamination. It allows automotive I/O devices to be tested for correct operation under adverse conditions. The design includes protection circuits that ensure module damage cannot be caused by wiring faults or UUT failures. Each module can support up to 32 channels and is suitable for both 12V and 24V automotive applications.
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6572 -
Peaceful Thriving Enterprise Co Ltd
6572 Infrared (IR) Thermometer is the non-contact way to make safe and quick temperature checks on mechanical equipment, electrical circuits and building systems while in operation. Regular monitoring of heat (infrared energy) emitted from surfaces can prevent potential problems and failures.
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Teledyne Paradise Datacom
The PowerMAX system maintains complete parallel redundancy down to the embedded control level. Therefore the loss of an entire HPA chassis will not interrupt remote communications with the system. The system will automatically correct its gain level in the event of one or more HPA chassis failures.
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Environment Associates Inc.
When you want to test your product for extreme space conditions, that include temperatures from 155°C to -175°C at space vacuum altitudes, Environment Associates is your solution. Using this test to determine the unique failures of space mechanisms that orbit the earth is key in improving system reliability. Thermal vacuum testing is similar to thermal cycling but adds deep space vacuums for detecting corona/arcing and intermittence and increases a product’s out-gassing. The key failure modes found during this test are: 1) electrical iIntermittence, 2) thermal control issues, 3) arcing, 4) corona, 5) material out-gassing, and more, to determine a product’s flight-worthiness for workmanship and processing issues.
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BIRST™ (Built-In Relay Self-Test) -
Pickering Interfaces Ltd.
Verification and diagnosis of complex switching operation in a test system has always been an issue. BIRST (Built-In-Relay-Self-Test) diagnostic test tool provides a quick and simple way of finding relay failures available on some of our LXI and PXI switch matrices.
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BIRST -
Pickering Interfaces Ltd.
Verification and diagnosis of complex switching operation in a test system has always been an issue. BIRST (Built-In-Relay-Self-Test) diagnostic test tool provides a quick and simple way of finding relay failures available on some of our LXI and PXI switch matrices.
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MXI Quadra 7 -
Nordson Corporation
Ultimate image quality and magnification, Quadra 7 reveals quality defects as small as 0.1 µm. Ideal for root cause failure analysis, wire bond integrity checking, component cracking, MEMS inspection and wafer level components including TSV and wafer bumps.
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National Technical Systems
The ever advancing electronics industry requires an increasing need for electronic component testing (IC testing) and component verification. The component test capabilities and component verification lab at NTS performs test and inspection to determine proper component functionality, verification or failure analysis (F/A).