Showing results: 136 - 150 of 622 items found.
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M233G -
SDL Atlas
To determine the burning characteristics of textiles under controlled conditions. Stainless steel test cabinet with glass observation panel provided with automatic timing of flame spread in 0.1 second increments from ignition.
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T-Scan -
Tekscan, Inc.
The T-Scan is a diagnostic device that measures relative biting forces, including occlusal force, timing and location and is an ideal complementor to articulating paper. The technology was invented by Dr. William Maness in 1987 at Tufts University and M.I.T.
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ZET 7175 -
ZETLAB Company
GPS/GLONASS ZET 7175 synchronization module is used for long-distance spaced object timing in major control, monitoring and data collecting systems. For system operation, it is necessary to have a GPS-aerial connected over SMA plug.
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MVTKIT -
Matco Tools
*Allows fast, efficient static testing and monitoring of many vacuum operated components*Diagnostic: vacuum leaks, valve timing, engine condition*Under hood: distributors, carburetors, EFI, EGR and PCV valves
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Renesas Electronics Corp.
Designed for OEM Automotive applications, Renesas' highly integrated AEC-Q100 qualified automotive display processor ICs include an analog video decoder, high quality H/V scaler, 2D de-interlacer, and embedded timing controllers.
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Intellitech Corp.
The Eclipse Test Development Environment automatically creates tests that are used to bring up new products in the lab. Failures can be quickly debugged using software tools such as the Eclipse Timing Diagram Analyzer and the Schematic Logic Probe.
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Ant18e -
RockyLogic Ltd
The Ant18e logic analyzer is compact, easy to use, powerful, and inexpensive. The Ant18e features high speed data acquisition, state (synchronous) and timing (asynchronous) acquisition modes, Trigger-In and Trigger-Out connections, and a user-level programming interface.
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CMDGG8 -
W-IE-NE-R, Plein & Baus GmbH
The CMDGG-8 is a multi functional FPGA based delay, logic and timing module which provide often needed functions such as gate, delay & pulse generator, logic fan in / fan out, coincidence register and scaler / pre-scaler.
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Teledyne e2v
With our expertise in both space and quantum technology we are exploring space based quantum instruments. CASPA is Teledyne e2v’s satellite platform for developing and demonstrating quantum scientific sensors and precision atomic timing in space.
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CBA 2000 -
Altanova Group
CBA 2000 diagnostic system is designed to grant the highest accuracy while testing circuit breaker. It can perform static and dynamic contact resistance measurement and it’s a precise timing speed and motion analyzer. Circuit breaker timing test set CBA 2000 is the perfect solution when a complete and reliable diagnostics has to be performed on circuit breakers.
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Tekron International Ltd
Decode and validate your IRIG-B timing signals with Tekron's IRIG-B Analyzer. With multilevel signal support, the IRIG-B Analyzer enables accurate on-site fault diagnosis through a hand-held, rugged, portable and battery operated form factor.
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V720 -
Highland Technology, Inc.
The V720 is a six-channel logic-level electrical-to-optical converter, packaged as a single-width, 6U VME module. It may be used with compatible Highland optical receiver modules for fast, low-jitter, EMI-proof distribution of pulses, triggers, and precision timing signals.
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RapiTask -
Rapita Systems Ltd.
*Examine Ada, C or C++ applications via scheduling visualization*Locate rare timing events that need attention*Identify bottlenecks in your application by analyzing capacity issues*Compare scheduling algorithms from different RTOSs
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GX5055 -
Marvin Test Solutions, Inc.
The GX5055 represents a new level of performance and capabilities for PXI-based digital instrumentation. Based on the proven architecture of the GX5050, the GX5055 offers high performance pin electronics and an enhanced timing generator in a compact, 6U PXI form factor.
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CBA-32P -
Zensol Automation Inc.
The CBA-32P is a multifunctional circuit breaker analyzer performing Motion, Timing and Dynamic Resistance Measurements, all in a single test.