X-ray Diffraction
crystalline interference pattern of X-rays to determine atomic and molecular structure of a crystal.
-
Product
Entry-level X-ray Inspection System
X-eye 5100 Series
-
100kV ~ 130kV Micro-focus Closed tube and high-definition Flat Panel Detector are installed and high-resolution image can be gained.Customer convenience is primarily considered in operation and maintenance of the product.Customization is available because it is specially designed to be add up any necessary functions depends on customer needs with reasonable prices.
-
Product
Benchtop X-ray Crystallography System
XtaLAB mini II
-
The Rigaku XtaLAB mini II, benchtop X-ray crystallography system, is a compact single crystal X-ray diffractometer designed to produce publication-quality 3D structures. The perfect addition to any synthetic chemistry laboratory, the XtaLAB mini II will enhance research productivity by offering affordable structure analysis capability without the necessity of relying on a departmental facility. With the XtaLAB mini II, you no longer have to wait in line to determine your structures. Instead your research group can rapidly analyze new compounds as they are synthesized in the lab.
-
Product
Digital Cabinet X-ray System
XPERT 80
-
Kubtec's XPERT 80 brings high quality imaging and ease of use to science and research. The XPERT 80's compact self-contained cabinet, with a high resolution x-ray source, provides the sharpest images for every application. Optional sources are also available for micro-focus and soft x-ray applications.
-
Product
Real-time X-ray Inspection Systems
JewelBox Series
-
JewelBox x-ray inspection systems feature ultra-high resolution, powerful microfocus x-ray tubes, five-axis, and positioners. The JewelBox Series is divided into three broad categories: JewelBox 70-T, JewelBox 90-T and Ultra Compact each of which can be customized for specific applications.
-
Product
X-ray Fluorescence Sulfur/Chlorine-in-oil Analyzer
MESA-7220V2
-
The MESA-7220V2 measures both sulfur and chlorine in petroleum based products using the Monochromatic Energy Dispersive X-ray Fluorescence (EDXRF) method. A monochromatic X-ray source is used in order to obtain an ultra-low noise background which affords the best detection limits for both sulfur and chlorine.The detector window size was increased to collect more fluorescent X-rays and thus achieve lower level ppm values. This provides excellent, repeatable performance at both low and high concentrations of both elements.By adjusting the angle of the graphite crystal, the excitation beam can be measured to excite sulfur in the sample, increasing sensitivity.
-
Product
X-ray Fluorescence Measuring System
FISCHERSCOPE X-RAY/XDV-SDD
-
Premium model for universal use for the inspection of very thin or complex layers up to RoHS screening at very low detection limits.
-
Product
X-ray Fluorescence Sulfur-in-Oil Analyzers
SLFA-2100/2800
-
The SLFA-2100/2800 are designed specifically to meet the recent demanding needs of measuring the new low sulfur fuels, diesel and RFG.Using the X-ray fluorescence technique, fast and accurate measurements can be carried out in compliance with the ASTM D4294 method, either in the lab or in the field.
-
Product
Reject Station for X-Ray Image Analyser
IV-110I
-
IV-11OI is a reject station for X-Ray Image Analyser known for having an X-Ray Image Wire Defect Detection and a compact and space-saving dimension.
-
Product
X-ray Fluorescence, XRF Analysis Services
-
Two XRF systems are available, a wavelength dispersive system (WDXRF) and an energy dispersive system (EDXRF). The difference is the manner in which the x-rays are detected. WDXRF instruments have very good energy resolution which leads to fewer spectral overlaps and improved background intensities. EDXRF instruments have higher signal throughput which can shorten analysis times. The higher signal throughput also makes EDXRF systems suitable for small spot or mapping analysis.
-
Product
X-ray Analytical Microscope (Micro-XRF)
XGT-9000
-
- <15µm probe size with ultra-high intensity without compromising sensitivity or spatial resolution. - High resolution cameras and multiple illumination modes to help capture images.- Dual types of detectors for transmission and fluorescent X-rays.- Detectable element range down to carbon with a light element detector.
-
Product
Wavelength Dispersive X-ray Fluorescence Spectroscopy
-
Wavelength Dispersive X-ray Fluorescence Spectroscopy
-
Product
Imaging X-Ray Photoelectron Spectrometer
Kratos AXIS Nova
-
X-ray photoelectron spectroscopy (XPS), also known as electron spectroscopy for chemical analysis (ESCA), is a mature and widely used surface analysis technique for materials characterisation. XPS provides quantitative elemental and chemical state information from the upper most 10 nm of material. The The AXIS Nova photoelectron spectrometer can collect X-ray photoelectron spectra and images from any material that is stable under the ultra-high vacuum conditions required for the technique.
-
Product
Material Discrimination X-ray Technology
MDX
-
Eagle’s Material Discrimination X-ray (MDX) technology enhances traditional x-ray inspection, providing food processors with unprecedented contaminant detection capabilities.
-
Product
X-ray Fluorescence Measuring Instrument
FISCHERSCOPE® X-RAY XDAL®
-
Universal instrument for automated measuring of thin and very thin layers < 0.05 μm and for material analysis in the ppm range.
-
Product
Total Reflection X-ray Fluorescence (TXRF) Services
-
A highly surface-sensitive technique, TXRF is optimized for analyzing surface metal contamination on semiconductor wafers.
-
Product
Imaging X-Ray Photoelectron Spectrometer
AXIS Supra+
-
X-ray photoelectron spectroscopy (XPS) is unique in providing quantitative elemental and chemical state information from the uppermost 10 nm of a materials surface. The AXIS Supra+ (also known as Kratos Ultra 2+ in Japan) is a market leading X-ray photoelectron spectrometer combining state-of-the-art spectroscopic and imaging capabilities with the highest level of automation currently available. Unrivalled large area spectroscopic performance allows photoelectron spectra to be acquired from all types of materials including metals, semi-conductors and insulators. Fast, high spatial resolution XPS imaging reveals the lateral distribution of surface chemistry and aids further characterisation with selected small area analysis.
-
Product
X-ray Fluorescence Sulfur-in-Oil Analyzer
SLFA-6000
-
HORIBA Scientific, a market leader in sulfur-in-oil analysis, announces the launch of the new SLFA-6100/6800 Energy Dispersive X-ray Fluorescence Analyzer, which measures sulfur in oil ranging from 5 ppm to 9.9999%. This new, compact, and accurate analyzer meets the needs of anyone wishing to conform to ASTM D4294, ISO 8754 or JIS K2541/B7995.
-
Product
X-ray Inspection System
TruView Prime
-
The TruView Prime is a fully motorized radiography system developed to meet the stringent requirements of electronics assembly and component inspection. The TruView Prime is professionaly built - something hard to find in entry level systems in the TruView Prime's price range.
-
Product
3D X-ray hybrid inspection system
YSi-X
-
Ideal for 100% inspection of onboard automotive products and many other items by 3D X-rays acquire layered of target. X-ray, optical, infrared, and laser height measurement as standard equipment; hybrid and high reliability with multiple inspection modes.
-
Product
X-ray sources / X-ray optics
-
X-ray sources are the heart of every X-ray analytical instrument. In combination with advanced X-ray optics, they generate the required X-ray radiation for structure analysis in various fields of material and life sciences. X-ray sources must offer perfect thermal constancy for excellent position stability of the X-ray beam as well as high intensity, even at low power levels. The design has to guarantee easy integration into advanced X-ray equipment paired with straightforward operation to keep uptimes high and to guarantee maximum radiation safety for operators and equipment.
-
Product
X-Ray Inspection System
MXI Ruby XL
-
Designed for the largest PCBs, Ruby XL allows 96 x 67 cm (37.9” x 26.4”) areas to be inspected non-destructively, with feature resolution up to 0.5 µm.
-
Product
Scanning X-Ray Detectors
Shad-o-Scan
-
Shad-o-Scan is a family of scanning X-ray detectors specifically designed for the challenging requirements of high-performance industrial and scientific X-ray applications. Industry-leading TDI CCD performance enables the ultimate sensitivity and highest resolution in the industry, and ensures long detector lifetime in even the harshest radiation environments.
-
Product
*Micro-fluoroscopic X-ray Inspection System
Cath-X
-
The Cath-X is a bench top system employing Glenbrook’s micro-fluoroscopy technology providing highly detailed x-ray video of the critical components of the needle device. The transparent, safely shielded, view chamber permits the operator to locate the critical areas of the needle for inspection. The x-ray image can be further magnified using the electro-optical zoom feature of the Cath-X.
-
Product
Industrial X-Ray
-
Teledyne DALSA offers powerful, innovative CCD and CMOS X-Ray detectors combining industry-leading performance with cutting-edge features for industrial and scientific applications such as NDT (non destructive testing) in evaluation, troubleshooting, research, and quality control.
-
Product
X-Ray Detector
XRT Detector Onyx
-
ONYX 1412-X is a performance-leading X-ray detector comprising a proprietary 2768 × 2376 active pixel sensor array of 50 × 50 µm pixels. This detector consists of a high-speed, low-noise, radiation-tolerant, 14 × 12 cm, 6.6M pixel CMOS image sensor, with a directly deposited high-resolution CsI scintillator on Fibre Optic Plate. The highly configurable sensor is accessed through a software interface, connected via a 10 GbE SFP+ hardware interface.
-
Product
Small-Angle X-Ray Scattering (SAXS) Products
-
Small-Angle X-Ray Scattering (SAXS) Products from Rigaku
-
Product
X-Ray Flaw Detectors
XXQ/XXG/XXGH Series
-
XXQ series are suitable for the material directional of thin iron plate, aluminum, rubber and so on, may get very good picture quality and clarity.
-
Product
Handheld X-Ray Backscatter Imaging System
Nighthawk™
-
Nighthawk Handheld X-Ray Backscatter Imaging System sees what is invisible to the human eye, detecting concealed contraband, weapons, narcotics and explosives in luggage, barrels, vehicles, upholstery, and many other applications.
-
Product
X-ray CT System
-
The surface and the internal parts, in one measurement. We provide “Dimensional X-ray CT System” that does not only observe the interior of the workpiece, but that can also perform high precision, contactless measurements.
-
Product
Energy Dispersive X-Ray Spectroscopy (EDS)
-
Rocky Mountain Laboratories, Inc.
Energy Dispersive Spectroscopy (EDS Analysis) is used in conjunction with the Scanning Electron Microscope (SEM) providing chemical analysis in areas as small as 1 µm in diameter. EDS detects all elements except for H, He, Li, and Be. EDS can be performed exactly on any features or particles seen in the SEM images and can “MAP” elements on a surface. Unknown materials can be identified and quantitative analysis can be performed.
