- Scientific Test, Inc.
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Semiconductor Tester
5000E
Current Ranges:Standard: 2.0nA – 50AUp to 100A with Mainframe ExtensionVoltage Ranges:Standard (anode): 10mV – 1000V2000V with 2kV Anode OptionStandard (gate): 10mv – 20V80V with 80V Gate Option
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Power MOSFETs
ST's power MOSFET portfolio offers a broad range of breakdown voltages from –100 to 1700 V, with low gate charge and low on-resistance, combined with state-of-the art packaging. ST's process technology for both high-voltage power MOSFETs (MDmesh™) and low-voltage power MOSFETs (STripFET) ensures an enhanced power handling capability, resulting in high-efficiency solutions. Power MOSFETs belong to the STPOWER family.
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Firmware
Field-Programmable Gate Arrays (FPGAs) are an ideal fit for data acquisition systems as they offer unparalleled real-time signal processing power. Moving functionality from the host PC to the on-board FPGAs helps offload the PCs central processing unit (CPU) and relaxes data transfer rate requirements. This capability is key in achieving the performance levels needed in many of today's leading-edge applications.All our data acquisition and generation modules host Xilinx FPGAs and are delivered w...show more -
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Gate Scanner
SR200`
Stanford Research Systems, Inc.
The SR200 Gate Scanner module is designed to automate waveform recovery with the SR250 and SR255 Gated Integrator modules. Waveform recovery is done by slowly scanning the gate of the integrator over the waveform of interest.
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Alchitry Cu FPGA Development Board (Lattice ICE40 HX)
If you are not needing a lot of power to start your FPGA adventure, or are looking for a more economical option, the Alchitry Cu FPGA Development Board might be the perfect option for you! The Alchitry Cu is a "lighter" FPGA version than the Alchitry Au but still offers something completely unique. FPGAs, or Field-Programmable Gate Arrays, are an advanced development board type for engineers and hobbyists alike to experience the next step in programming with electronics. The Cu truly exemplifies...show more -
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Test System
ITC57300
The ITC57300 Dynamic Parametric Test System mainframe accepts Test Heads that perform nondestructive transient measurements on semiconductor devices such as Insulated Gate Bipolar Transistors (IGBT), power MOSFETs, diodes, and other bipolar devices(requires additional optional bias power supplies and custom personality boards). Included in the mainframe are all test equipment and software necessary to analyze and perform resistive and inductive switching time, switching losses, gate charge, Trr/Qrr, and other transient tests.
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Transistor Testing
Radiant is introducing an I2C digital-to-analog converter product that can be attached to the Precision Premier II and is controlled from Vision. The addition of this extra voltage source makes it possible for the Premier II to measure the performance of thin-ferroelectric-film gate transistors (TFFTs and MFSFETs). This document explains the theory for such testing and gives examples of such tests using Radiant's SFRAM transistors as examples.
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P-Series Dual Channel Power Meter
N1912A
30 MHz video bandwidth Single shot real time capture at 100 M sample/s per second Key Measurements: - peak, average, peak-to-average ratio, rise time, fall time and pulse width22 Predefined formats: WiMAX, DME, HSDPA, etc. One screen view for pulse measurement analysis: Auto Scale, Auto Gate, Rise/Fall Time, Duty Cycle, etc. Internal Zeroing and Calibration while connecting to the DUT Bench Vue software enabled
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Rad Hard GaN Drivers
The space market has been driving towards more efficient power management solutions. Part of the drive includes the use of Gallium Nitride Field Effect Transistors (GaN FETs) for power conversion. GaN FETs have higher power conversion efficiency and have more natural immunity to radiation, due to them being wide-bandgap semiconductors. Equally important is the use of the correct driver that will allow reliable operation and maximize the benefits of the GaN FETs. Some of the key driver requirements are: a well-regulated gate drive voltage; high source/sink current capability and a split driver output stage.
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Laureate Duty Cycle Meter
Model FRD
Configured display ON or OFF period as a percentage of total period over a gate time from 10 ms to 199.99 s. A resolution of 1%, 0.1% or 0.01% is selectable. Ideal for repetitive short pulses with a pulse width down to less than 1 s.
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PXI Vector Transceivers
Get both signal generation and analysis in one PXIe module with real-time field-programmable gate array (FPGA)-accelerated measurements for faster throughput. The PXIe vector transceiver is perfect for manufacturing test of wireless devices, RF power amplifiers, and front-end modules.
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Rad-Hard Power Management
ST offers a comprehensive range of QML-V rad-hard power management solutions for space applications including linear voltage regulators (low-dropout regulators), point of loads (switching DC/DC converters), PWM controllers, gate drivers, and an industry-unique integrated current limiter.
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Airlock Control System
The system is built on the basis of a panel computer with a touch screen, performing the functions of a user interface and recording the measured parameters. The stand is equipped with gate drives and a set of sensors (pressure, flow rate, force). Real-time gate control is implemented on the basis of the R-series board; for input and conversion of analog signals from the sensors, an expansion cage of the cRIO-9151 R-series boards is used.
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Custom Radio Direction Finding Products
This assembly contains three sets of antennas, three RF summers, an antenna switch, a GPS and (optionally) a flux gate compass. The pod mounts to the roof with nylon straps, although it is recommended that it be bolted down for more permanent applications. Although this antenna is not stocked, we can provide them on relatively short notice. No minimums apply.
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VFTLP+ Test System
4012
The Model 4012 VFTLP+™ test system was developed in early 2000 to add high speed measurements to the usual I-V plot, to measure and record the real TDDB waveform which causes oxide failure.*Accurate measurements of this waveform have finally been identified by Barth Electronics Inc. and CDM protection can now be based on known dimensional design parameters. We identify the response of your CDM protection circuits with 100ps risetime pulses which simulate the real CDM test. This is the only way with which to provide the total gate oxide threat voltage data.*Convenient, precise, repeatable operation*Computer controlled for automated testing
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Flaw Detector & Thickness Gauge
DFX-8+
Measurement Gates: Two independent gates (Flaw), and three gates (thickness). Start & width adjustable over full range. Amplitude 5-95%, 1% steps. Positive or negative triggering for each gate with audible and visual alarms.
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Eddy Current Flaw Detector
US-525M
United Western Technologies Corp
The US-525M multi-channel eddy current testing instrument is a rugged industrial rack-mounted instrument offering multi-channel testing, integral digital strip chart, as well as Ethernet control and data transfer to meet your in process testing requirements. This instrument offers up to eight channels, with a frequency range of 20 Hz to 10 Mz, a high signal-to-noise ratio, a bright 12-inch diagonal color LCD flat-panel screen, and data storage of 32 Gig. It offers input/output (I/O) capability, USB and Ethernet connectivity, as well as three discrete alarm gates with independent outputs per channel. for your on-line bar, tube, wire and specialty component testing needs.
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2 GHz to 6 GHz, 25 W Power Amplifier Module
HMC7748
The HMC7748 is a multistage power amplifier (PA) that provides 25 W of saturated output power across the band of 2 GHz to 6 GHz. It draws 0.7 A from a 12 V supply and up to 4 A from a 28 V supply. Input signals of as much as −8 dBm are acceptable, and the module has small signal gain of 60 dB. The 12 V supply is regulated internally and generates the negative voltage required for the gate bias. Built-in bias sequencing prevents the drain voltages for the amplifier stages from being applied without the negative voltage present, which protects the amplifiers if 28 V is applied without 12 V supply applied.
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HDTV Frame Grabber / HDMI Video Capture Card (formerly HDV62)
PCIe-HDV62
The PCIe-HDV62 is a PCI Express frame grabber offering uncompressed image acquisition and video streaming in full 1080p HD.The ADLINK PCIe-HDV62 provides 1920x1080p resolution, progressive scan, and noise reduction for greater image quality. Equipped with a field programmable gate array (FPGA) and 512 MB memory buffer, the PCIe-HDV62 offers the ability to stream uncompressed image to the host PC, in addition to color space conversion in real-time via on-board hardware in order to offload repetit...show more -
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Ku-Band Antenna Systems
A complete line of Ku-Band and Ka-Band SATCOM antenna systems featuring TECOM technology for non-stop gate to gate in-flight connectivity for commercial large Air Transport, Business Jet and various military applications.
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Analyze RTL
ASICs and FPGA routinely have millions of gates with memories, transceivers, third party IP and processor cores. Problems can be time consuming and complex to debug in the lab and through simulations. Designers need verification tools that can identify problems quickly to reduce their verification and debug time before simulation, before synthesis, and definitely before burning chips in the lab.
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24 TTL Channels, Programmable I/O
TL1
Function module TL1 provides 24 channels of TTL/CMOS transceiver functionality as either inputs or outputs. The transistor-transistor logic (TTL) employs transmitters with multiple emitters in gates having more than one input. TTL offers high switching speed and relative immunity to noisy systems. CMOS sensors provide image sensing technology by converting light waves into signals that are small bursts of current. These waves can be light or other electromagnetic radiation.
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Compressors & Limiters
Applied Research and Technolgy
Take control of your dynamics with our range of compressors, limiters, expanders, and gates.
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Power Device Analyzer / Curve Tracer For Circuit Design
B1506A
The Keysight B1506A Power Device Analyzer / Curve Tracer for Circuit Design is a complete solution that can help power electronic circuit designers maximize the value of their power electronics products by enabling them to select the correct power devices for their applications. It can evaluate all relevant device parameters under a wide range of operating conditions, including IV parameters such as breakdown voltage and on-resistance, as well as three terminal FET capacitances, gate charge, and power loss. The B1506A Power Device Analyzer/Curve Tracer for Circuit Design meets and exceeds all curve tracer capabilities.
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24 TTL Channels, Enhanced, Programmable I/O
TL2
Function module TL2 provides 24 channels of TTL/CMOS transceiver functionality as either inputs or outputs. The transistor-transistor logic (TTL) employs transmitters with multiple emitters in gates having more than one input. TTL offers high switching speed and relative immunity to noisy systems. CMOS sensors provide image sensing technology by converting light waves into signals that are small bursts of current. These waves can be light or other electromagnetic radiation.
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AdvintRIO™ Reconfigurable I/O
SNAKEHEAD
The Snakehead platform employs aNI CompactRIO (cRIO) system consisting of an embedded controller, chassis, and NI C Series I/O modules.Snakehead systems are not dependent on a separate host computer. They offer both Ethernet, and Wi-Fi connectivity to powerful real-time controller with a user-upgradable backplane that includes a high performance field-programmable gate array (FPGA). Snakehead provides stand-alone embedded execution for deterministic LabVIEW Real-Time applications. These units ar...show more -
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Desktop stand-alone
All Three Sensors Of Optical Comb Can Be Installed On The Gate Type Stage And It Can Be Used As A General-Purpose Stand-Alone Machine. Tasu Since It Is A Rectilinear Laser, Complex Shapes Can Also Be Measured Tasu Measuring Time With A Working Distance exceeding 100 mm can be easily measured + parts with high irregularities can be measured with deep depth of focus
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C Series Serial Interface Module
The C Series Serial Interface Module adds RS232 or RS485/RS422 serial ports to CompactRIO systems. The serial ports are accessed directly from the field-programmable gate array (FPGA) to offer you flexibility in communicating with serial devices. The module has individual buffers on every port that save FPGA space and simplify programming. The C Series Serial Interface Module supports standard start bit, stop bit, and handshaking settings. It uses an external power to provide maximum compatibility and reliability under all serial port conditions. You can choose from both enclosed and non-enclosed modules.
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Power Cycling Semiconductor Life Test System
ITC52300
The ITC52300 is designed for high-volume intermittent or steady-state operating life testing on Insulated Gate Bipolar Transistors (IGBTs), power MOSFETs, diodes, and other bipolar devices in a production environment. (The ITC52300 is an enhanced version of the ITC5230.)
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Semiconductor Curve Tracer
CS-8000 Series
The CS-8000 series are equipped with a high-voltage source of up to 5 kV and a high-current source of 2 kA. It features Pulse output, Gate pattern, and very small current measurement capabilities, and it supports the design evaluation of wideband-gap semiconductors such as SiC and GaN.
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Fluid Power Actuators
LP/LH
Rotork linear actuators offer the advantages of compact size, high performance and a simple but highly reliable design. They are ideal for operating on/off and control functions of both globe and wedge gate valves. Both spring-return and double-acting configurations are available with either pneumatic or hydraulic cylinders.
