Systems
are interconnected groups of purpose.
See Also: Equipment, Test Systems, System Integrators, System Test
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New Link system Control and Image Capture Software
New uncluttered and intuitive user interfaceLive display of current status for easy monitoringFull control of heating and cooling rate, limit and hold time of up to 100 rampsRow by Row control of Vacuum, Humidity, Tensile Force and Shear modes controllable and synchronised with TemperatureParameters of connected Linkam sensors displayed and stored - e.g. Vacuum, Humidity, Force, XY position and Pressure (dependent on connected stage type)Real Time chart of temperature and other measured paramete...show more -
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PED Systems
Pulsed Electron Deposition
Is a process in which a pulsed (80-100 ns) high power electron beam (~1000 A, 15 kV) penetrates approximately 1 μm into the target resulting in a rapid evaporation of target material. The non-equilibrium heating of the target facilitates stoichiometric ablation of the target material. Under optimum conditions, the target stoichiometry is preserved in the deposited films. All solid state materials – metals, semiconductors and insulators, including those transparent to laser wavelengths in PLD – can be deposited as thin films with PED. By combining PLD and PED, the range of complex materials that can be prepared as thin films can be greatly enhanced.
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Lamp Spot Type UV Curing System
AICURE UP50
Panasonic Industrial Devices Sales Company of America
Panasonic Lamp Spot Type UV Curing System
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6th Generation Intel® Core™ i7/i5/i3 Processor-Based Automation Control System with EtherCAT & 4CH GigE Vision Support
Talos-2000 Series
ADLINK's Talos-2000 Series ready-to-use automation control system, powered by 6th Generation IntelR Core? i7/i5/i3 processors, provides EtherCAT control and four independent PoE (power over Ethernet) ports, with data transfer rates up to 4.0Gb/s. The Talos-2000 Series offers motion control of up to 64 axes, 10,000 I/O points, and 4CH PoE camera connectivity with minimal footprint. The ideal solution for machinery automation, Talos-2110 integrates complete APIs for multi-dimensional, highly synch...show more -
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Electrical
This category covers test equipment required for electrical performance tests on Industrial Lighting, Street Lighting, Automotive Lighting, Appliances, Accessories & related products. A wide range of Electrical Test Panels, Electro-mechanical endurance test systems for many products, Appliance test systems and also a range of low energy spot welding machines (one of the very few products we make which are not test equipment). Equipment are custom built to suit specific customer requirements.
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Compute Express Link (CXL)
Compute Express Link (CXL) is a new high-speed CPU-to-Device and CPU-to-Memory interconnect designed to accelerate next-generation data center performance. CXL technology maintains memory coherency between the CPU memory space and memory on attached devices, which allows resource sharing for higher performance, reduced software stack complexity, and lower overall system cost. This permits users to simply focus on target workloads as opposed to the redundant memory management hardware in their accelerators. CXL is based on a PCI Express 5.0 Physical layer with speeds up to 32GT/s. Teledyne LeCroy provides protocol analysis test equipment to support development and debug of CXL based devices.
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Oven-Control-Oscillator
The Quartlock ranges of OCXOs are recognised throughout the world for quality and performance. They are used extensively in radio communications, satellite, paging, cellular phone systems and many other applications.
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Optical Displacement Measurement Systems
ODS Series
The optical displacement measurement systems of the ODS series are specially designed for measuring the ultrasonic vibration displacement at bond tools of wire & flip-chip die bonders. The systems are highly accurate and very easy to use. That makes it the perfect tool for displacement based calibration of ultrasonic bond machines.
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Defect Inspection and Review
KLA’s defect inspection and review systems cover the full range of yield applications within the chip and wafer manufacturing environments, including incoming process tool qualification, wafer qualification, research and development, and tool, process and line monitoring. Patterned and unpatterned wafer defect inspection and review systems find, identify and classify particles and pattern defects on the front surface, back surface and edge of the wafer. This information allows engineers to detect, resolve and monitor critical yield excursions, resulting in faster yield ramp and higher production yield.
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Portable Hipot Tester
HTNY-H
Wuhan Huatian Electric Power Automation Co., Ltd.
All kinds of motor、electric appliance、instruments and apparatus、Test the safety withstand voltage and leakage current of high power system.
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OptiStroke™ Needle Stroke Detection System
The patented OptiStroke system reduces product waste and confirms hot melt adhesive dispensing performance by verifying valve actuation and fatigue. Ideal for applications where product-yield loss is critical, the system is compatible with Nordson Universal™ modules, Speed-Coat™ modules and Harmony modules.
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Interface And Connectivity Solutions
From supporting sophisticated connectivity protocols to offering simpler interface options, our comprehensive solutions enable you to develop robust and highly reliable embedded systems.
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PXI Medium Density Switch Matrix Modules
Pickering's range of medium density switch matrix modules is a cost-effective solution for applications that require mid-range matrices in the PXI format. Selected modules are supported by our Diagnostic Test Tools, Built-In-Relay-Self-Test (BIRST) and eBIRST Switching System Test Tools, these tools provide a quick and simple way of finding relay failures within LXI, PCI and PXI switch systems.
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Automobile Engine-related Measuring Machines
Automatic Measuring Systems > Automobile engine-related measuring machine. Crankshaft, Camshaft, Cylinder block, Piston, Compressor wheel and Cylinder head.
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Chassis and Safety ICs
ST is a world-class supplier of IC smart power solutions for all the Chassis and Safety applications, ranging from passive safety, braking, vehicle dynamics and steering systems. Type of devices in ST portfolio are analog and mixed-signal ICs, integrating different functions such as supply modules, drivers for loads and actuators, diagnostic functions, system monitoring and communication interfaces.
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Communication Systems
Communications systems provide ultimate convenience for all tactical and administrative communication tasks, custom-made for naval vessels of any size – from submarine to destroyer.
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X-ray Inspection System
X-eye SF160 Series
High-performance Micro-focus Open Tube with 160kV is installed and fine defects of 1㎛ are detectable. High-resolution X-ray image can be gained with world best magnification by installing high-price Open Tube as standard.Dual CT function can be purchased adtionally, and exact location & size of defects can be detected and analyzed with this function.
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LV Iron Core Shunt Reactors
Iron core Shunt Reactors act as an absorber of reactive power to increase energy efficiency of the power system. Shunt Reactors are used in order to compensate capacitive reactive power generated by long and lightly loaded transmission lines as well as underground cables, thus allowing the flow of more active power through the system and avoiding over voltages. Shunt Reactors can be directly connected to the power line or to a tertiary winding of a three-winding power or distribution transformer.
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Communications/Data Link Amplifiers
Amplifiers specific to the Communications systems include a wide range of Solid State Power Amplifiers (SSPAs) and Low Noise Amplifiers (LNAs) originally from Paradise Datacom and a range of organically developed products within TMS. Satcom SSPAs are considered a core competence of Paradise Datacom's product line who have invested heavily in converting it's complete amplifier offering from GaAs to GaN from C-Band all the way to Ka-Band.
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Manual Fixture Kit with Changeable Cassette, Max number of probes (2N) 500 units, Max UUT 197 x 114 mm (wxd)
CMK-05
Linear click system with ball bearings, using gas springs.10 mm ESD-proof top cover with aluminum reinforcement bars.Steel base cabinet with detachable aluminum back and bottom panels.Detachable interchangeable case system with an 8 mm spring-loaded probe protection cover.Base cabinet fitted with a telescopic guide rail and catch.
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1U Rackmount Network Appliance Platform With Intel® Atom® Processor C3558/C3758 And Up To 10 LAN
NA362R
The NA362R is powered by the Intel® Atom™ processor C3558/C3758 (Codename: Denverton). The low power 1U network appliance comes with six 10/100/1000 Mbps LAN ports and two or four 10 GbE SFP+ fiber ports. It is equipped with one pair latch-type LAN Bypass function for fail-over option as well as featuring BIOS console redirection. Furthermore, it supports the Intel® QuickAssist Technology which accelerates data processing and compresses cryptographic workloads. The network communication applianc...show more -
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Cybersecurity and Compliance Solution
Application Audit
Application Audit, Compuware's mainframe cybersecurity and compliance solution, enables enterprises to capture all relevant data about user access and behavior on the mainframe to mitigate cybersecurity risks and fulfill compliance mandates. Using Application Audit, security staff can: Deter insider threats by capturing and analyzing start-to-finish user session activity. Integrate user behavior intelligence with popular SIEM engines to analyze the overall application environment. Support crimin...show more -
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Building Monitoring
Crackmeter
The system consists of two plates that overlap for part of their length. One plate is calibrated in millimeters and the overlapping plate is transparent and marked with a hairline cursor. As the crack width opens or closes, one plate moves relative to the other. The relationship of the cursor to the scale represents the amount of movement occurring. These gauges are monitored over time, whilst being kept as far away from human disturbance as possible, to develop an understanding in the width and direction of movement of the crack.
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PXIe-8880, 2.3 GHz Eight-Core PXI Controller
783513-05
PXIe, 2.3 GHz Eight-Core PXI Controller—The PXIe‑8880 is an Intel Xeon 8‑Core embedded controller for PXI Express systems. You use it for processor-intensive RF, modular instrumentation, and data acquisition applications. The PXIe‑8880 includes two 10/100/1000BASE‑TX (Gigabit) Ethernet ports, two USB 3.0 ports, four USB 2.0 ports, as well as an integrated hard drive and other peripheral I/O.
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Miniature Fluxgate Magnetometer
WFG-140
The WFG-140 magnetometer is a complete 3 Axis Fluxgate Magnetometer system packaged in a rectangular package of dimensions 1.5\"x1.5\"x4.65\". With low noise and small size, the instrument can be used wherever small magnetic fields (3 x 10-7 to 1 Gauss) need to be measured.
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PXI 2 Amp MUX, Dual 4-Channel 4-Pole
40-635-107
The 40-635 2 Amp Multiplexer module is available in 9 standard configurations as well as 9 half density configurations, all using high quality electro-mechanical signal relays allowing each channel to switch current up to 2A and voltage up to 300VDC/250VAC.The module is suitable for signal routing in ATE and data acquisition systems. Connections are made via a front panel 78-way D-type connector.
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100 Amp Intelligent Power Management
IPMDS100
- Intelligent Power Management System- 3 - 20 Amp Single Phase Outlets- 3 - 40 Amp Three Phase Outlets- 2 - 60 Amp Three Phase Outlets- Automatic Load Shedding- 100 Amp Mil Spec Input and Output Connector- Easy Access Circuit Breakers- Phase Over Current Protection- Low Voltage Warning- Built In Press to Test
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AFDX® / ARINC 664 Test And Simulation PCIe Module
PCIe-C664
*Supports IEEE 802.3 10/100/1000 Mbit / s full duplex Ethernet connections*Uses SFPs to support both electrical and optical interfaces*Half-size PCI / PCI-X modules*Simulates multiple AFDX® / ARINC 664 end systems*Standard Ethernet processes simultaneous with ARINC 664*Up to 128 output VLs and 512 input VLs*Upper layer protocol handling (ARINC 653, UDP, IP) managed onboard*DMA for high data rate applications*Windows XP / 7, Linux, and LabVIEW Real Time Drivers & APIs (others on request)*Easy to use tool for configuring AFDX® / ARINC 664 end systems (XML based)
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Wire Harness Tester
NX Solo
The Dynalab NX Solo Wire HarnessTester is a low-cost, feature-packed, stand-alone tester with a maximum capacity of 256 test points. The flexibility of the NX System allows each program to perform multiple tests, display custom messages or sounds, and analyze the results of a test or an input to decide which operation to perform next. Testing for continuity, shorts, and a variety of components.
