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Imaging Photometer
L-Series
RayClouds Photoelectric Technology Co.,Ltd.
L-Series Imaging Photometer is equipped with CMOS detector, cooperated with ProICM professional analysis software to detect the luminance parameters of the two-dimensional imaging screen. Professionally complete the data analysis of the measured parameters to help the tester improve the luminance quality of the finished product and ensure the comfortable use experience of end users.
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Battery System Analyser 24V Graphic
BSA24G
The Battery System Analyser 24V Graphic (BSA24G) is the first in the world version of battery analyser with fully graphic universal instruction easy to distribute and sell by distributors for it solves language translation problem for non-English speaking territories. It has 4 functions: Battery, Starter, Alternator and Grounding tests on 12V system and 24V system on Starters and Alternators (Normal & Smart).
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NI-9225, 300 Vrms, 50 kS/s/ch, 24-Bit, Simultaneous Input, 3-Channel C Series Voltage Input Module
780159-01
300 Vrms, 50 kS/s/ch, 24-Bit, Simultaneous Input, 3-Channel C Series Voltage Input Module - The NI‑9225 performs differential analog input. The wide measurement range is well suited for high-voltage measurement applications such as power metering, power quality monitoring, motor test, battery stack testing, and fuel cell tests. You can perform transient and harmonic analysis with high-speed simultaneous sampling. In addition, you can prevent ground loops and add safety to a system with 600 Vrms channel‑to‑channel isolation between the three NI‑9225 channels.
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UV Analyzers
Model UV6
The Model UV6 Analyzers are a family of on-line sampling analyzers that use UV absorption to perform an analysis. The analyzers are configured to perform analysis over a wide range of values for each parameter measured, Nitrate, Color, or the correlation at 254 nm wavelength for COD, BOD or TOC. The UV6 Analyzers are easy to start up and use, simply connect the sample, waste and cleaning solution/reagent lines and then power up the Factory Calibrated analyzer. Wall mounting hardware is standard but an optional benchtop stand with reagent holder is also available. Accessing information or customizing an analysis routine are easily accomplished with the simple, user friendly menu structure and touch screen interface.
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Atomic Force Microscope for SEM/FIB
AFSEM® AFM Insert
AFSEM is an atomic force microscope (AFM), designed for integration in a SEM or Dualbeam (SEM/FIB) microscope. Its open access design allows you to simultaneously operate SEM and AFM inside the SEM vacuum chamber. The correlated image data of AFM and SEM enable unique characterization of your sample, and the combination of complementary techniques is a key success factor for gaining new insights into the micro and nano worlds. AFSEM enables you to easily combine two of the most powerful analysis techniques to greatly extend your correlative microscopy and analysis possibilities.
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Automatic Component Analyzer
TH2829A
Changzhou Tonghui Electronic Co., Ltd.
By dint of leading impedance measurement technology and rich R&D experience, Tonghui continuously introduces representative impedance measurement product --- TH2829 series automatic component analyzer is another excellent product we have produced. TH2829A automatic component analyzer possesses a higher test speed, a more comprehensive analysis function and friendly human-computer interactive experience by adopting the latest high-speed processor and a new software system. Well-designed measuring circuit and optimized algorithms further enhance the test stability of low-D capacitance and high-Q inductors. The instrument is provided with 10V AC test level, 10V/100mA bias current and standalone 10V/50mA DC current, making it convenient for applying in the test of all kinds of active/ passive devices. Main/ sub parameters display, enhanced display system design, 150-points list sweep and graphical analysis capabilities of multiple parameters meet the most application requirements of customers.
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CDMA2k Analysis Using NI PXI RF Test Instruments
NI-RFmx CDMA2k
NI-RFmx CDMA2k is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development effort.
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Advanced Digital Imaging System
C-Cell Colour
The C-Cell Colour is an advanced digital imaging system that provides comprehensive quality analysis for bread and baked products. Provides analytical results for repeatable, reliable quality .Removes human error in quality control environmentsCalibrations can be tailored to meet manufacturers needs.Bread scoring system provides consistent results across sites.Over 50 different quality results relating to bakery products.Quantifiable results helps to easily score against targets.Helps to show the impact in structure when making slight changes in process/production/ingredients
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PXI Network Analyzers
M980xA Series
The Keysight M980xA Series of PXI network analyzers meets the most demanding challenges with a true multiport architecture that offers exceptional performance no matter how many ports you use. Gain deeper insights into your devices with the widest available portfolio of measurement applications for PXI VNAs, including spectrum analysis and noise figure measurements.
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Scanning Electron Microscopy
SEM
Materials Evaluation and Engineering
JEOL JSM-6610 LV LaboratoryScanning electron microscopy (SEM) uses electrons for imaging to obtain higher magnifications and greater depth of field than light microscopes. The instruments at MEE are capable of variable-pressure, or low vacuum, SEM (VPSEM), as well as traditional high-vacuum conditions for sample observation. VPSEM is a specialized method using a variable-pressure sample chamber that allows direct evaluation of samples that are not readily examined with a traditional high-vacuum SEM. Nonconductive or vacuum sensitive samples that would typically require additional sample preparation can be directly analyzed in VPSEM without the need for additional sample preparation, such as carbon or metallic conductive coatings. This reduces both sample preparation time and distractions in microanalysis. Our laboratory also has a field emission SEM (FESEM) for critical high-magnification work and low-voltage (LVSEM) applications. Each instrument has a spacious sample chamber that can accommodate large and irregularly-shaped specimens and accessories for feature dimensional analysis and chemical microanalysis.
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Analyser Oscilloscopes with Remote Interface
This economical, high-performance oscilloscope operates when connected directly to a PC.It uses the PC's screen for display and its memory for its recording capacity.It is a benchtop oscilloscope which is easy to use, stack and transport.
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Online Analyzers
Analysers which are connected to a process, and conduct automatic sampling.
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Grain Moisture Analyser
Perten AM5200
The AM5200 is a bench top moisture meter providing moisture and specific weight measurements in just 10 seconds. The high frequency technology penetrates deep into samples, providing more accurate analysis, regardless of temperature or crop type. This particular machine draws upon Perten’s extensive research and development with over 1,000 different types of grain moisture testing equipment, to offer unmatched analysis in terms of accuracy, repeatability and reliability.
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Electrical measurements
Instruments for measurement and analysis in accordance with the regulations of single / triphasic low voltage networks and data networks via cable or fibre.
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Acute 4GS/s 68 Channel Logic Analyzer With 32Gb Memory
Acute LA3068E+
*LA3000E+/B+ series logic analyzer*PC-based*68 / 136 channels*USB 3.0 interface, 12V power adaptor*4GHz Timing Analysis / 250MHz State Analysis
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EDM Post Analyzer Software
The Post Analyzer application is used for the post processing of previously recorded time stream data. Post processing includes data conditioning, Fourier transform operations, and specialized analyses such as order tracking and octave analysis.
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Harmonics & Flicker Analyser
AC2000A
The Laplace Harmonics and Flicker analyser provides the user with a complete system for testing product compliance with IEC61000-3-2 and IEC61000-3-3. Quick and easy to use, the built-in screen provides a clear pass/fail indication of compliance status, plus a full listing of results for each harmonic, in either tabular of bargraph format. The instrument is properly configured to cope with fluctuating harmonics. The Flicker mode provides proper measurement of short term and long term parameters, using algorithms specified in IEC61000-4-15. In addition, inrush current measurements can be automated such that the product under test can be automatically cycled on/off with user entered time profiles.
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Materials Analysis
Materials Analysis provides products that enable customers to determine structure, composition, quantity and quality of particles and materials, during their research and product development processes, when assessing materials before production, or during the manufacturing process. Our products help customers to improve accuracy and speed of materials analysis in the laboratory. We see a growing demand for the application of our solutions in quality and process control. Our key customers in this segment are leaders in the metals, minerals and mining, pharmaceutical and academic research industries. The operating companies in this segment are Malvern Instruments, PANalytical and Particle Measuring Systems. Malvern Instruments and PANalytical merged on 1 January 2017.
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STDF Test Data Analysis Tool
DataView
DataView is a low‐cost test data analysis tool that is used by test and product engineers to perform characterization of integrated circuit devices. DataView reads in industry standard STDF or ATDF files and can produce reports, histograms, and wafer maps in multiple formats including Excel. DataView is ideal for the test or product engineer who needs a fast and simple tool to analyze characterization data.
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Video Encoding and Machine Learning
Fraunhofer Institute for Telecommunications
With the proliferation of video in our everyday lives, the efficient coding, transport, processing and analysis of video signals is becoming more and more important. The Department of Video Coding and Machine Learning is concerned with image and video coding, transport of multimedia data, design of embedded systems for multimedia processing as well as analysis and machine understanding of images and videos.
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Digital Circuit Breaker Analyzer
CT-7000 S3
The CT-7000 S3 is Vanguard’s fourth generation EHV circuit breaker analyzer. The CT-7000 S3 is available with 3 (part number 9021-UC) or 6 contact timing channels (part number 9100-UC). The CT-7000 S3 can fully analyze a circuit breaker’s performance by measuring the main contact and resistor contact time, stroke, velocity, over-travel, bounce back and contact wipes. Both contact and motion analysis can be performed on all circuit breaker operations (OPEN, CLOSE, OPEN-CLOSE, CLOSE-OPEN, and OPEN CLOSE-OPEN). The CT-7000 S3’s timing window is selectable between 1 second, 10 seconds, and 20 seconds.
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Digital Brix/°Oechsle (°Oe) /°KMW (°Babo) Refractometer
MA885
MA885 measures Brix, °Oechsle (°Oe) and °KMW (°Babo). The MA885 is optical instrument that is based on the measurement of the refractive index of a solution. The measurement of refractive index is simple and quick and provides the vintner an accepted method for sugar content analysis.
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Software
Interface Trap Density Analysis Option
Materials Development Corporation
MDC offers interface trap density analysis using both the Conductance-Frequency and Quasi-statictechniques. The Conductance-Frequency method is recommended for fine-tuning of processes where the highest resolution is needed. The Quasi-static technique is recommended where moderate to high levels of interface traps are monitored, such as in radiation damage studies. Requires quasi-static option or variable frequency option.
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Production Test Stands for Electric Motors
Electric drives such as DC and EC motors are more and more extensively deployed in the automotive industry. At the same time there is an increasing requirement for a 100% analysis of motors for fault detection and error analysis as well as statistics on quality, without increasing production cycles times. The model-based Parameter Identification method (PI method) from imc allows testing to be performed under load, yet without an “explicit” separate load machine. Instead, the motor is loaded dynamically by exploiting its own inherent inertia. This allows motor parameters such as resistance, inductivity and friction to be determined within a few seconds. A mathematical model and its parameters reflect motor behaviour in its completeness and make it possible to monitor motor production based on limit values and trend statistics. The identified parameters of the model equation can then be used to calculate derived key performance indicators of the motor characteristic curve.
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Test Equipment
Southern Photonics designed and manufactured all the test equipment currently being manufactured by Coherent Solutions, as well as equipment for non-telecoms applications. This includes FBG strain interrogators, optical pulse phase analysers, OSNR meters, optical power meters, optical spectrum analysers, optical gas sensors… you get the idea. All test equipment we build is robust and easy to use. The picture shows some of what we can do – anything from prototype benchtop test gear (as in the combination ASE source and laser combiner on top of the stack) to field test equipment (the portable fast OSA on the bottom).
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PXI-5124, 150 MHz, 200 MS/s, 12-Bit PXI Oscilloscope
778757-02
150 MHz, 200 MS/s, 12-Bit PXI Oscilloscope—The PXI‑5124 high-resolution PXI oscilloscope samples up to 200 MS/s with flexible settings for coupling, impedance, voltage range, and filtering. PXI oscilloscopes also feature a number of triggering modes, deep onboard memory, and an instrument driver that includes data streaming and analysis functions. This device is ideal for both time-domain and frequency-domain applications that require high-resolution measurements with up to 150 MHz of analog bandwidth. The PXI‑5124 also features PXI synchronization and data streaming capabilities.
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Handset Noise Under RF Test System
BK8021
If you need to evaluate the resistance of cellphones to RF interferance, the BaKo Type BK8021 Handset Noise Under RF Test System is what you need. It performs four tests to evaluate the Sending Noise, Sending Sensitivity, Sending Loudness, Sidetone Masking, Receiving Sensitivity and Receiving Loudness. You run the system using the controlling PC, which allows automatic configuration and which runs the test sequence automatically. When testing is complete, you can print the data as an MS Excel report or save it for comparison and analysis.
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Arbitrary Waveform Generators
Keysight arbitrary waveform generators (AWGs) are the source of greater fidelity, delivering high resolution and wide bandwidth simultaneously. This unique combination, coupled with our flexible form factors, allows you to create signal scenarios that push your design to the limit and bring new insight to your analysis.
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Affordable EDXRF Analyzers
NEX QC Series
Applied Rigaku Technologies, Inc
NEX QC is the lowest cost variant of a line of affordable benchtop EDXRF spectrometers designed for rapid qualitative and quantitative analysis of elements from sodium (Na) to uranium (U) in solids, liquids, alloys, powders, and thin films. For more demanding applications, or for situations where short analysis time is critical, we recommend the NEX QC+ spectrometer. Employing the next generation silicon detector technology, the enhanced NEX QC+ affords significant improvement in elemental peak resolution and counting statistics.
