- Pickering Interfaces Inc.
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PXI Instrumentation Modules For Automated Test Systems
PXI-based test systems often require a variety of general-purpose instrumentation such as digital I/O, waveform generators, voltage & current sources and DUT power supplies.
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Test System
LPDDR4 and LPDDR3
Testing LPDDR4, LPDDR3 devices is made fast and simple with the "Lower Power" LPDDR4/3 TCE-3200LP IC test system. It can be configured up to 32 sites in parallel and integrated with the customer's selected handler.The TCIII-3200LP system can be used as a production tool as well as an engineering tool. To assist manufacturers and integrators, TurboCATS has developed a heat chamber that can be integrated with the TCE-3200LP, LPDDR4 and LPDDR3 test system. This allows the devices to be tested while being exposed to heat conditions.
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Line Testers
GAOTek provides a large collection of certified and feature-rich line testers for sale to the United States, Canada and Globally. These devices are mainly used for line installation, line performance testing, inspection, and maintenance of the telecommunication networks. They are particularly designed to accelerate telecom trouble shooting and with the help of latest technology they are equipped with a smart CPU, IC, and SMT. These devices have some unique features such as caller ID display and last number redial. Moreover, it can also be used for multi-line testing, wire pair checking, inspection of line insulation and test for breaks and faults.
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Advanced Design System (ADS) Core
W2200BP
Advanced Design System (ADS) is the flagship product from Keysight EEsof EDA, the technology and innovation leader in high-frequency, mixed-signal electronic design automation (EDA). It is the only design simulation platform that enables the co-design of IC, package and board in high-frequency and hi-speed applications. ADS seamlessly integrates system, circuit, and full 3D electromagnetic simulation with Keysight's test instrumentation to perform single pass successful electronic designs repeatedly.
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Analogue IC Tester
SYSTEM 8 (AICT)
The SYSTEM 8 Analogue IC Tester is the answer to testing analogue devices. The key feature of the AICT is its ability to functionally test all common analogue ICs and discrete devices in circuit. It is also capable of testing all types of analogue and digital components by means of the well-known, power off V-I test technique. For users requiring only the latter function, please select the Analogue Test Station section.
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Boundry Scan Testers
Qmax Test Technologies Pvt. Ltd.
Boundary Scan Trainer Kit was developed by Qmax to provide user a good understanding and hands on the testing principals of boundary scan namely the scan chain test, interconnect test, non-BS functional testing of logic IC and cluster like a combinational or sequential circuits.
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ESD & Latch-Up Test System
Identify and help correct ESD and latch-up susceptibility issues on sensitive integrated circuit components prior to full-scale production with the Thermo Scientific™ MK.2-SE ESD and Latch-Up Test System. The MK.2-SE test system provides advanced capabilities to test high pin count IC devices to Human Body Model (HBM) and Machine Model (MM) ESD standards. The system’s pulse delivery design addresses wave form hazards such as trailing pulse and pre-discharge voltage rise, and performs Latch-Up testing per the JEDEC EIA/JESD 78 Method.
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High-Density Precision SMU (100 PA, 30 V)
PZ2130A
The Keysight PZ2130A is a high-channel density precision source / measure unit (SMU) with 5 channels per module that saves space at a low cost per channel for a wide range of applications requiring numerous precision power supplies. Its seamless current measurement ranging function eliminates the time it takes to change the range and expands the dynamic range to cover multiple measurement ranges, which reduces test duration. These capabilities make the PZ2130A suitable for applications that requ...show more -
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AMIDA 3001XP Tester
AMIDA has introduced two new analog/mixed-signal and logic options in the AMIDA-3000 series in recent years—the AMIDA-3001XP and AMIDA-3KS test systems. Both reinforce the AMIDA-3000 series' ability to provide cost-optimized test solutions for a variety of consumer components in power management and mobile device components. The AMIDA-3000 series provides more than twice the number of analog channels of its modules per test system, thus greatly reducing the acquisition cost of each channel and m...show more -
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Low Noise Test Leads For N1413 With B2980 Series, 3m
N1425B
The N1425B is designed to operate specifically with the B2985B/87B. It can hold DUTs with large terminals being used with the N1426C. The N1426A with the N1425B is available for measurements of small DUTs such as PC boards or IC sockets. The N1426B with the N1425B enables the construction of simple custom-made test leads. The N1413A High Resistance Meter Fixture Adapter is also required to connect the N1425B to the B2985B/87B.
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Compact Semiconductor Tester
QST4416-FC
Qmax Test Technologies Pvt. Ltd.
The Qmax Model QST4416-FC is a compact small foot print, sophisticated automatic semiconductor tester. Its state-of-the-art hardware design which is freely configurable to user's application requirements and software features facilitates it to test linear & mixed signal IC components which covers a wide range of products like linear, Power management, Opto electronics, digital and mixed signal devices etc.
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Packaging Manufacturing
KLA’s extensive portfolio of packaging solutions accelerates the manufacturing process for outsourced semiconductor assembly and test (OSAT) providers, device manufacturers and foundries for a wide range of packaging applications. Innovations in advanced packaging, such as 2.5D/3D IC integration using through silicon vias (TSVs), wafer-level chip scale packaging (WLCSP), fan-out wafer-level packaging (FOWLP) and heterogeneous integration as well as a wide range of IC substrates create new and ev...show more -
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IC Tester
ICE1
The IC Test System was developed to measure the EMC behavior of circuits (ICs) in the event of targeted field or line-related interference and for measuring emissions. The test IC is tested in function. The test environment ICE1 creates the functional environment of the test IC. The respective measurement task is carried out with the corresponding probe set.
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Low Noise Test Leads For N1413 With B2980 Series, 1.5m
N1425A
The N1425A is designed to operate specifically with the B2985B/87B. It can hold DUTs with large terminals being used with the N1426C. The N1426A with the N1425A is available for measurements of small DUTs such as PC boards or IC sockets. The N1426B with the N1425A enables the construction of simple custom-made test leads. The N1413A High Resistance Meter Fixture Adapter is also required to connect the N1425A to the B2985B/87B.
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IC Test Services
With knowledge gathered from decades of supporting Tier 1 and emerging industry leaders, Amkor understands test solutions must address advanced technology, quality, performance and cost of test. We offer full turnkey solutions including wafer processing, advanced bump, wafer probe, assembly, final test, system-level test, burn-in and end-of-line services.
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600A Digital Clamp Meter
7128B
Peaceful Thriving Enterprise Co Ltd
This is a auto-ranging, high accuracy and stable hand held clamp meter to make electrical maintenance safe and easy. With special designed IC to support true RMS, the meter is available to measure AC/DC voltage to 600V, AC current to 600A and resistance to 60MΩ; also having the capability to test diode, continuity and non contact voltage sensing. Sub switch included Function Select, Max-Min Indication, Value Hold, Range Select, Relative Value Measurement, Inrush Current Indication, Illumination and Back-light.
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Emulation & Test Interface
Solder down modules to suit any package type provides a cost effective solution for replacement test heads, male or female. The mating top modules can incorporate either a ZIF or standard IC socket and the addition of optional test pins if required from RS Components.
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TEST SOCKET
IC Package It is a device to install INTERFACE between TESTER and DEVICE during TEST to check electrical defects such as O / S (Open, Short) test, mounting test, BURN-IN TEST and RLC TEST, The device
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RF & Wireless Test Solutions
Adivic/Chroma Group has been in the development of RF & WIreless test solutions for more than a decade. Take RF Recorder as an example, it has been adapted by all major Japanese & Korean automotive brand names such as Toyota, Mitsubishi, Honda, Hyundai, Daewoo...etc., most of the global IC design houses with DTV chips such as Broadcom, Marvell, MTK...etc., and also defense entities around the world.
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Microelectronic Services
Services for ASIC houses and Integrated Device Manufacturers are IC Wafer / Final Test, IC assembly, Test Program development, product engineering, Flash / EEPROM programming, characterisation / capability studies, yield enhancement, design verification and failure / yield analysis. Das Test Haus are specialists for wafer test, low power, mixed signal and eeprom test.
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IC Test Clips
Low-profile fine-pitch chips, desnely populated boards, or vertical boards, Pomona test clips connect you with confidence.
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Manual Test Adapter With Rigid Needles
Frequently, manual test adapters are required for the functional and IC test. In order to contact the test subject, spring contact probes are often installed in the adapter, but the pitch of the spring contact probes is approx. 1.27 mm and thus too great for certain applications.
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Probe Cards
U-Probe for Multi-die Test of Memory IC. Vertical-Probe Needle Type Probe card suitable for multi-die test of devices with peripheral pads. ertical-Probe Spring Type. Probe card suitable for area array pad test. 64DUTs Multi-Die. Probe Card for RF devices. Fine Pitch.
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Develop - Simulate - Validate JTAG / IJTAG based IP
NEBULA
You, your vendors and your customers being able to use one common interface to control and observe on-chip IP, resources and instruments. The figure below shows an example IC. The new IEEE 1149.1-2013 standard supports an init-data register for configuring the analog paramaters of I/O as well as controlling on-chip PLLs. The standard further extends this by defining in BSDL user test data registers or 'scan chains'. These registers enable the ability of generic software to control and observe mission mode IP and instruments simply by describing the register interface in BSDL.
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Grypper
Grypper
*Package-size PCB footprint: Since the PCB footprint of Grypper is identical to or smaller than the IC package, only one PCB design is required, enabling a seamless transition from test and validation through production and reducing overall cost of test*No lid required: The package snaps directly without a lid, enabling easy probing, scoping and troubleshooting the topside of the device*Excellent signal performance: A short signal path achieves low inductance and low insertion loss, providing a nearly invisible electrical connection
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Semiconductor
With ultra-multi pin count and fine pitch, our general-purpose IC socket lineup corresponds to every need. For semiconductor burn-in sockets for thermal acceleration tests, and test sockets for semiconductor electrical testing, we continue to hold a high market share all over the world.
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Dip Clip, 14 Pin With Nickel Silver Contacts
5114
Pomona DIP Clip? test clips are designed fortesting dual-in-line IC packages on PC boards. Thesedevices incorporate many built-in features that assurea positive electrical connection as well as hands freetesting.
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AMIDA 5000 Tester
AMIDA 5000 is a high-end performance test system, combining analog, mixed-signal and logic with the latest test solutions. High pin count - as many as 512 smart multi-function pinframes and 128 sites. Ability to provide cost-optimized test solutions for a variety of consumer components in power management and mobile device components. This system has a higher number of parallel tests and a higher level of capability. This series of test systems provides a powerful test combination with high-spee...show more -
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High-Speed Precision SMU (100 FA, 60 V, 15 MSa/s)
PZ2121A
The Keysight PZ2121A is a high-speed precision source / measure unit (SMU) featuring best-in-industry narrow-pulse width, fast Digitizer Mode, and seamless current measurement ranging. It enables narrow-pulsed measurements and fast dynamic measurements with a wide dynamic range for a wide range of emerging applications such as vertical-cavity surface-emitting laser (VCSEL) optical devices, integrated circuit (IC) testing. In addition, its low measurement noise performance enables measurements with shorter aperture times, and its seamless current measurement ranging function enables a wide dynamic range and eliminates range change time, which improves test throughput.
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VLSI Test System
3380D
The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (256 I/O pins to test 256 ICs in parallel) that can meet the upcoming higher IC testing demands.
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Advanced SoC Test System
3680
The Chroma 3680 is an advanced SoC test system with data rate up to 1Gbps. The Chroma 3680 is capable of conducting parallel tests on multiple chips to meet the digital and analog IC testing requirements, with applications including MCU, digital audio, digital TV, set-top box, DSP, network processor, field programmable gate array (FPGA) and consumer electronics.
