Showing results: 376 - 390 of 469 items found.
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Aero Engineering Support Group
ATE Development Aero Engineering Support specializes in designs and manufacturing of a wide variety of Automatic Test Equipment (ATE) of support for military avionics, commercial avionics, industrial sector, etc. AESG is committed to providing industry leading equipment that are designed to be scalable and expandable ATE capable of providing reliable functional test solutions for any electronic assembly or Circuit Card Assembly. New from Aero Engineering Support is the A2500 system, providing:
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ADTS-2000 -
TestVonics, Inc.
TestVonics ADTS-2000 Test Set is a portable, high precision, dual channel air data pitot static test system. This tester is designed to calibrate, test and troubleshoot air data instrumentation and aircraft pitot-static systems. The ADTS-2000 meets all requirements of the KTS-2000 , P/N: 18910920000, P/N: 18910920001, P/N: 18910920002, or having NSN: 4920-01-588-4428 and NSN: 4920-01-554-4549 . The test set has been designed with functional and reliability features highly suited to withstand the harsh environmental and demanding conditions of the flight line environment. The test set is designed for testing a wide range of commercial and military aircraft, both rotary and fixed wing. The ADTS-2000 accuracy complies with standards for RVSM and is designed to replace the TTU-205 test set.
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Teledyne Defense Electronics
Teledyne Advanced Electronic Solutions integrates CCAs and other sub-assemblies, cables and fabricated parts into system modules shipped directly to customers for integration into their products.- Box Build: custom built to order system solutions- High complexity box assemblies and subsystems- High frequency RF box assemblies and subsystems- Full functional RF testing up to 26 GHz (K band)- Multi-level systems integration – build and test modules and CCAs and integrate into higher level assemblies- Custom cell design for customer subsystems- Special bonding processes including thermal management and vibration- Robust torque and FOD control programs- System level testing including functional, vibration and thermal- Complex harness fabrication and integration- Fiber-Optic and RF waveguide integration and testing- Large system capacity in excess of 200 lbs.- Configure to order – Integrate different options, firmware, configurations, etc across a single order as required
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ACCAT -
Huntron
The ACCAT is designed to support diagnostic and acceptance test requirements across a wide spectrum of testing parameters. ACCAT provides a suite of core parametric test instruments, advanced GUI based software, Huntron Access Robotic probing and Huntron Analog Signature Analysis (ASA). ACCAT provides stimulus and asurement capabilities necessary for full functional and parametric testing of circuit card assemblies along with robotic guided probes for fault verification and debug. The Huntron ASA test is ideal for pretest or safe to power up procedures protecting the integrity of the test system.
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FOX-1P -
Aehr Test Systems
Enables High Throughput, Single Touchdown, Full Wafer Production Testing. Capable of simultaneously testing up to 16,000 die in a single wafer touchdown. Resource configurable up to 16,384 " Universal Channels " - each programmable as anI/O, Clock, Pin Parametric Measurement Unit ( PPMU ) or Device Power Supply ( DPS ). Software-enabled per site flexibility to support small and large device pin count test needs. Comprehensive functional and parametric test capabilities Deep functional pattern data and capture memory optimized for BIST/DFT testing. Per channel PMU for per site parametric testing Individual channel over-current protection to protect wafers and probe cards. Configured for high volume production. Compatible with industry standard probers and probe cards. Available as an integrated test cell with prober, probe cards and 16,384 channel probe I/F. Configurable as a single or dual system integrated test cell.
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PXI-501 -
Konrad Technologies GmbH
The PXI-501 is a multifunction measurement instrument for functional and in-circuit measurements.It combines two parametric measurement units with a digital voltmeter, a high voltage current source and a discharge unit. This powerful combination makes it the ideal instrument for classical analog in-circuit test and manufacturing defect analysis with additional functional test capabilities.With it’s fast sampling rate of up to 4MSps it speeds up measurements and is capable of measuring and generating AC signals up to 100kHz.To enhance the PXI-501 capabilities it can be combined with an ABex TM-501 or an ABex TM-404. The ABex TM-501 enhances the in and output range of the PXI-501. Furthermore, it provides a shunt current measurement upgrade. In combination with the ABex TM-404 it’s a complete in-circuit test solution with 86 channels in one ABex slot. For sure it can be upgraded to 2838 test points in one rack by simply adding additional matrix modules.With the above-mentioned terminal modules, the PXI-501 is able to act as a ABex system controller, so that no additional controller is required in the cassis.
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40-251-011 -
Pickering Interfaces Ltd.
The 40-251-011 is a programmable resistor module with 8 channels which can be set between 1Ω and 62.1Ω with 0.25Ω resolution The 40-251 range provides a simple solution for applications requiring up to 2.5W of power handling per channel. The 40-251 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. Each channel is able to simulate short or open circuit conditions that can be experienced in a system caused by faulty wiring or sensors.
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40-253-110 -
Pickering Interfaces Ltd.
The 40-253-110 is a programmable resistor module with 1 channel which can be set between 1Ω and 31.5Ω with 0.125Ω resolution The 40-253 range provides a simple solution for applications requiring up to 10W of power handling per channel. The 40-253 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. Each channel is able to simulate short or open circuit conditions that can be experienced in a system caused by faulty wiring or sensors.
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40-251-111 -
Pickering Interfaces Ltd.
The 40-251-111 is a programmable resistor module with 4 channels which can be set between 1Ω and 62.1Ω with 0.25Ω resolution The 40-251 range provides a simple solution for applications requiring up to 2.5W of power handling per channel. The 40-251 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. Each channel is able to simulate short or open circuit conditions that can be experienced in a system caused by faulty wiring or sensors.
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40-253-011 -
Pickering Interfaces Ltd.
The 40-253-011 is a programmable resistor module with 2 channels which can be set between 1Ω and 62.1Ω with 0.25Ω resolution The 40-253 range provides a simple solution for applications requiring up to 10W of power handling per channel. The 40-253 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. Each channel is able to simulate short or open circuit conditions that can be experienced in a system caused by faulty wiring or sensors.
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40-251-112 -
Pickering Interfaces Ltd.
The 40-251-112 is a programmable resistor module with 4 channels which can be set between 1Ω and 122Ω with 0.5Ω resolution The 40-251 range provides a simple solution for applications requiring up to 2.5W of power handling per channel. The 40-251 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. Each channel is able to simulate short or open circuit conditions that can be experienced in a system caused by faulty wiring or sensors.
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40-253-010 -
Pickering Interfaces Ltd.
The 40-253-010 is a programmable resistor module with 2 channels which can be set between 1Ω and 31.5Ω with 0.125Ω resolution The 40-253 range provides a simple solution for applications requiring up to 10W of power handling per channel. The 40-253 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. Each channel is able to simulate short or open circuit conditions that can be experienced in a system caused by faulty wiring or sensors.
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40-253-113 -
Pickering Interfaces Ltd.
The 40-253-113 is a programmable resistor module with 1 channel which can be set between 1Ω and 239Ω with 1Ω resolution The 40-253 range provides a simple solution for applications requiring up to 10W of power handling per channel. The 40-253 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. Each channel is able to simulate short or open circuit conditions that can be experienced in a system caused by faulty wiring or sensors.
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40-252-012 -
Pickering Interfaces Ltd.
The 40-252-012 is a programmable resistor module with 4 channels which can be set between 1Ω and 122Ω with 0.5Ω resolution The 40-252 range provides a simple solution for applications requiring up to 5W of power handling per channel. The 40-252 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. Each channel is able to simulate short or open circuit conditions that can be experienced in a system caused by faulty wiring or sensors.
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40-252-010 -
Pickering Interfaces Ltd.
The 40-252-010 is a programmable resistor module with 4 channels which can be set between 1Ω and 31.5Ω with 0.125Ω resolution The 40-252 range provides a simple solution for applications requiring up to 5W of power handling per channel. The 40-252 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. Each channel is able to simulate short or open circuit conditions that can be experienced in a system caused by faulty wiring or sensors.
