Automated X-ray Inspection
See Also: AXI
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Energy Dispersive X-ray Fluorescence Spectroscopy Systems
Energy Dispersive X-ray Fluorescence Spectroscopy Systems
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Automated Metrology System
EVG®50
High-throughput, high-resolution metrology for bonded stacks and single wafers. The EVG 50 (fully automated stand-alone tool) and the Inline Metrology Module (integrated in EVG''s high-volume manufacturing systems) offer highly accurate measurements at high speed, utilizing different measurement methods for a large number of applications. The tool''s application range covers multi-layer thickness measurements for determination of the total thickness variation (TTV) of an intermediate layer, the inspection of bond interfaces as well as resist thickness measurement, and meets the most demanding requirements of the yield-driven semiconductor industry.
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Programmable Controllers for Advanced Machines & Automation Projects
Vision Series
An award-winning series of programmable controllers (PLC + HMI) , ranging from palm-sized controllers with onboard I/O to large-screen controllers with snap-in I/O. Vision is a true workhorse: reliable, versatile, field-hardened – a cost-effective All-in-One controller.
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Mobile ASA-Livestream Data Node for Main Inspection
CONNECT CUBE V3 | VP 185076
Maschinenbau Haldenwang GmbH & Co. KG.
The mobile data node is the right tool for quick and digital diagnosis of the brake system as well as for routine testing and calibration of all ASA livestream-capable brake testers. The plug & play solution can also be used for modern routine testing and calibration of brake test stands.
