Infrared Microscopes
observe, measure and analyze, sample magnified, IR view.
See Also: Microscopes, Acoustic Microscopes, Atomic Force Microscopes
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Product
Atomic Force Microscope for SEM/FIB
AFSEM® AFM Insert
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AFSEM is an atomic force microscope (AFM), designed for integration in a SEM or Dualbeam (SEM/FIB) microscope. Its open access design allows you to simultaneously operate SEM and AFM inside the SEM vacuum chamber. The correlated image data of AFM and SEM enable unique characterization of your sample, and the combination of complementary techniques is a key success factor for gaining new insights into the micro and nano worlds. AFSEM enables you to easily combine two of the most powerful analysis techniques to greatly extend your correlative microscopy and analysis possibilities.
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Product
FIBER OPTIC MICROSCOPES
SpecVision
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SpecVision is a video probe that engages directly with Krell polishing machines. This permits the viewing of polished optical surfaces while connectors or bare fibers are still loaded in the polisher. This in-line video inspection technique minimizes material handling and potential damage/contamination that may occur when transferring components from the polisher to a traditional microscope. SpecVision can interface with Scepter, SpecPro and Rev Polishers.
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Measuring Microscopes, Image Processing
Milling & Drilling
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Optik Elektronik Gerätetechnik GmbH
OEG manaufactures all mechanical parts in house and offers these services to other companies.
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Product
High Resolution Handheld Infrared Camera
FLIR T650sc
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The T650sc infrared camera offers thermal and visual imagery, excellent spot size resolution, and reliable temperature measurement accuracy —all at an affordable price. Technicians, engineers, and scientists will appreciate features such as a built-in digital camera, voice annotation, laser target locator, GPS, Multi Spectral Dynamic Imaging (MSX®), UltraMax™ image enhancement, auto-image rotation, and more. The tiltable IR unit gives you great flexibility and allows you to conduct your experiments fast and in a comfortable position.
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Product
Near-field Scanning Optical Microscope
NSOM
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Near-field Scanning Optical Microscope (NSOM) is a versatile tool for nano-characterization and nanomanufacturing.Conventional microscopes have fundamentally limited resolution due to diffraction, but there is no such restriction for near-field interactions, that is why near-field microscopy is becoming one of the most important techniques for nano-science.
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Semiconductor Wafer Microscope Inspection System
MicroINSPECT
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MicroINSPECT Semiconductor Wafer Defect Microscope Inspection System combines state-of-the-art robotics, intelligent microscopes and SITEview software to provide a flexible, easy-to-operate defect inspection platform for either micro or macro defect wafer inspection.
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Product
Heating Microscope
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Heating microscopy is a non-contact technique that, based upon an advanced image analysis of a specimen subjected to a thermal treatment reproducing industrial firing conditions, identifies several characteristic shapes and related temperatures key to the optimization of manufacturing processes in ceramics, metals, and alloys.
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Product
Scanning Electron Microscopes
SEM
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Scanning Electron Microscopes (SEM) scan a sample with a focused electron beam and obtain images with information about the samples’ topography and composition.
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Microscopes
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Bruker's world-leading microscopy systems are helping scientists and engineers to make breakthrough discoveries and develop new applications and products that improve nearly all aspects of our world. Our microscopes enable scientists to explore life and materials at the molecular, cellular and microscopic levels.
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FTIR Microscopes & Imaging Systems
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Agilent's FTIR imaging systems and microscopes deliver superb imaging sensitivity at high spectral and spatial resolutions in applications such as polymer defect analysis, measurement of live cells in water, and the determination of chemical changes in tissues without staining. The Cary 610 is a single point FTIR microscope for accurate mapping, while the Cary 620 is a Focal Plane Array (FPA) chemical imaging system, featuring innovative optics that deliver outstanding levels of detail.
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Product
Inspection Microscope
Z-NIR
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The McBain Z-NIR Near Infrared Inspection System is best-in-class for wafer-to-wafer and die-to-die alignment measurement and verification. This unique tool has been sold into many industries with various applications including sub-surface wafer and die inspection for cracks and bond integrity, MEMS, wafer bonding, 3-D chip stacking, failure analysis, process development, tool verification, part characterization, environmental testing and more.
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Product
Infrared Thermal Imaging
JOHO640CM_A00
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Wuhan JOHO Technology Co., Ltd
OHO640CM_A00 is a high resolution 640x480 uncooled long-wave thermal imaging core. It is especially designed for OEMs. With lightweight and compact design, low power consumption and standard interface, it is very easy to be integrated into end-user products, such as portable surveillance thermal camera, UAV, thermal sight etc.
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Product
Your Automated Microscope For Live Cell Imaging
ZEISS Celldiscoverer 7
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Combine the ease of use of an automated microscope with the image quality and flexibility of a research microscope. Whether working with 2D or 3D cell cultures, tissue or small model organisms, you will acquire better data in shorter times with this automated live cell imaging platform. Add LSM 900 with Airyscan 2 to gently image dynamic processes with highest framerates in superresolution.
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Product
Electron Microscope Analyzer
QUANTAX WDS
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The QUANTAX WDS (WDX) for SEM consists of the XSense wavelength dispersive spectrometer yielding the best resolution among all parallel-beam WDS systems.
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Product
Fourier Transform Infrared Spectrophotometer
IRTracer-100
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This system achieves excellent sensitivity with an SN ratio of 60,000:1, high resolution at 0.25 cm-1, and high-speed scanning capable of 20 spectra/second. The performance of medium and higher end models is supported by high reliability including advanced dynamic alignment and an interferometer with a dehumidifier. This is compatible with applications active in a variety of circumstances, with a library of approximately 12,000 spectra and data analysis programs for contaminant analysis, and time course and rapid scan programs for reaction tracking.
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Microscopes
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Bruker's world-leading microscopy systems are helping scientists and engineers to make breakthrough discoveries and develop new applications and products that improve nearly all aspects of our world. Our microscopes enable scientists to explore life and materials at the molecular, cellular and microscopic levels.
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Longwave Infrared Thermal Camera
FLIR A6780 SLS
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The FLIR A6780 SLS LWIR camera system makes it easy to measure temperatures of rapid thermal events and high-speed targets, making it an ideal choice for industrial, military, and manufacturing R&D applications. Thanks to its cooled, longwave Strained Layer Superlattice (SLS) detector, the A6780 provides faster snapshot speeds than other detectors for crisp images without motion blurring. Manual and remote-focus lens options provide flexibility to maximize the number of measurement pixels on the object of interest. Simple, single cable connectivity using Gigabit Ethernet provides complete camera control, plus data capturing in FLIR Research Studio software – so users can analyze and understand data faster than ever before.
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Product
Infrared Video Processing
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*Edge Enhancement improves the apparent sharpness of an image by boosting the contrast of edges in the imagery *Electronic Image Stabilization compensates for jitter in a video sequence, providing stabilized video output and remaining responsive to intentional user panning*Auto-Focus automatically adjusts the lens focus to its optimal in-focus position *Electronic Zoom uses interpolation to produce an enlarged image on the video display *Non-Uniformity Correction compensates for detector-to-detector non-uniformity to provide a well-calibrated image output
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Product
Electron Microscope Analyzers
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Bruker’s electron microscope analyzers EDS, WDS, EBSD and Micro-XRF on SEM offer the most comprehensive compositional and structural analysis of materials available today. The full integration of all these techniques into the ESPRIT software allows you to easily combine data obtained by these complementary methods for best results.
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Optical Fiber Microscope
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Connector-end face contamination is a problem that shouldn’t be ignored when it comes to fiber optic cables and patch cords. Allowing contamination to take place or fester will lead to network issues and down-time which you don’t need. For any fiber optic cable network, a high quality fiber microscope is a necessary tool to identify where contamination may be presenting.
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Scanning Electron Microscope
Verios G4 XHR SEM
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The Thermo Scientific™ Verios G4 scanning electron microscope (SEM) provides sub-nanometer resolution from 1 to 30 kV and enhanced contrast needed for precise measurements on materials in advanced semiconductor manufacturing and materials science applications, without compromising the high throughput, analytical capabilities, sample flexibility and ease of traditional Scanning Electron Microscope (SEM).
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Infrared Thermometers
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Infrared thermometer plays an important role in production quality control, equipment maintenance and troubleshooting, energy saving, and other applications. Infrared thermometer measures temperature through non-contact method, producing quick and accurate results. It allows users to measure high temperatures at a safe distance.
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Scanning Electron Microscope w/ EDX Laboratory
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Trialon has the equipment and experienced staff to operate this highly technical piece of laboratory equipment. Our state-of-the-art materials analysis lab located in Auburn Hills, MI is managed by a Ph.D with over 20 years of hands-on experience in root cause failure analysis of design, material and process for current and future products.
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Product
NON CONTACT INFRARED THERMOMETER
IBL-MTX9
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International Biological Laboratories
This Digital Non Contact type Infra Red cum Contact type Thermometer with laser sensor uses temperature sensor of Thermopile 7 - 14 mm to measure temperature from -18 to 1000 Degree C in the Non Contact Infra Red Mode and -20 to 1300 Degree C in the contact mode using K type Thermometer and also in Fahrenheit scale.
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High Frequency Infrared Carbon and Sulfur Analyzer
CS-8820
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Wuxi Jinyibo Instrument Technology Co., Ltd.
Infrared detector with low noise, high sensitivity and high stability. The modular design of the whole machine improves the reliability of the instrument. The electronic balance is automatically connected. WINDOWS full Chinese operation interface, easy to operate, easy to master. Dynamic display of various data and carbon in the analysis process. Measuring linear range is wide, and can be expanded. High-frequency circuit design is reasonable, high-frequency furnace power is adjustable, suitable for different material sample analysis requirements. The automatic cleaning device of the burner can reduce the influence of dust on the analysis results. The burner heating device makes the conversion rate of sulfur tend to be consistent, which improves the stability of sulfur determination. Measuring linear range is wide, and can be expanded. The software is fully functional, providing more than forty functions such as file help, system monitoring, channel selection, mathematical statistics, result correction, breakpoint correction, and system diagnosis.
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Real-Time X-Ray Imaging and Variable Pressure Scanning Electron Microscope
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Trialon has the equipment and experienced staff to operate this highly technical piece of laboratory equipment. Our state-of-the-art materials analysis lab located in Auburn Hills, MI is managed by a Ph.D with over 20 years of hands-on experience in root cause failure analysis of design, material and process for current and future products.
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Wafer Cathodoluminescence Microscope
Säntis 300
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Attolight’s Quantitative CL-SEM offers “No Compromise” large field fast scanning simultaneous acquisition of SEM images, hyperspectral CL maps, and optical spectra. Smaller diameter wafers, or miscellaneously shaped substrates are manually loaded on intermediary 300mm susceptors subsequently handled automatically by the tool.
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Microscope Photomultiplier Photometers
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HORIBA's microscope photometers are ideal for any lab wishing to quantitate light intensity from a sample on a microscope stage. Initially designed for the most demanding low light level fluorescence kinetics of labeled mammalian cells, these photometers are also just as well suited for mineral analysis or transmission studies.
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High-Accuracy Infrared Thermometer [Built-in type]
IT-470F-H
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The IT-470F-H is a built-in type, non-contact infrared thermometer with industry-leading* accuracy. It contributes to improve process stabilization, for which requires high accuracy temperature measurement, such as semiconductor and FPD production.
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Product
Infrared thermometer
Si-TI3
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The palm-sized Sauermann Si-TI3 infrared thermometer is a key instrument to diagnose, inspect and check any temperature, with the advantage of using “no-contact” technology.
