Infrared Microscopes
observe, measure and analyze, sample magnified, IR view.
See Also: Microscopes, Acoustic Microscopes, Atomic Force Microscopes
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Product
Electron Microscope Analyzers
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Bruker’s electron microscope analyzers EDS, WDS, EBSD and Micro-XRF on SEM offer the most comprehensive compositional and structural analysis of materials available today. The full integration of all these techniques into the ESPRIT software allows you to easily combine data obtained by these complementary methods for best results.
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Product
Electron Microscope Analyzer
QUANTAX EDS for SEM
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Bruker's latest generation of QUANTAX EDS features the XFlash® 7 detector series, which provides the largest solid angle for X-ray collection (also called collection angle) and the highest throughput.
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Product
Metallographic Microscope
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Beijing TIME High Technology Ltd.
A specialized optical instrument used to examine the microstructure of opaque materials, such as metals and alloys, by reflecting light off the polished and often etched surface of a sample.
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Product
Inspection Microscope
Z-NIR
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The McBain Z-NIR Near Infrared Inspection System is best-in-class for wafer-to-wafer and die-to-die alignment measurement and verification. This unique tool has been sold into many industries with various applications including sub-surface wafer and die inspection for cracks and bond integrity, MEMS, wafer bonding, 3-D chip stacking, failure analysis, process development, tool verification, part characterization, environmental testing and more.
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Product
Infrared Gun-Style 35:1 w/Laser
424
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Gun-Style Infrared Thermometer with Dual Laser, LED Flashlight and Hi/Lo Alarm. With HDPE carrying case and magnetic stand.
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Product
CSvideo | CTvideo | CSvision Series Infrared Thermometer
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The video pyrometer series optris CSvideo/CTvideo and the new innovative ratio pyrometer CSvision allow a parallel use of video and crosshair laser aiming for an optimal measuring field adjustment even in processes with limited access. They reliably measure temperatures of metals or ceramics and, due to their short measuring wavelength, reduces measuring errors of surfaces with low or unknown emissivities. The high quality video sighting can show its full advantage together with the software CompactPlus Connect or the IRmobile App on your cell phone with state-of-the-art zoom and image rotation features. The adjustable focus, motorized on CSvision, allows an optimal adaptation to different application and installation demands. As CSvision can measure objects up to 3000 °C a unique two-step brightness reduction filter (BRF) is giving the user a tremendous advantage when aiming on hot and extremely bright objects.
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Product
Scanning Acoustic Microscope
Pulse2
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This industry-leading scanning acoustic microscope provides a universal inspection tool for packaged semiconductor development, production and failure analysis. With the ability to detect air defects as thin 0.05 micron and spatially resolve defects down to 10 microns, the ECHO is perfect for bump detection, stacked die (3D packaging) inspection, complex flip chip inspection and more traditional plastic packages.
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Product
Measuring Microscopes, Image Processing + Semiconductor Technology, Micro Scriber
Line Width Measurement
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Optik Elektronik Gerätetechnik GmbH
COMEF is an image processing software with special functions for the highly accurate measurement of line width and line distance. Using grey value algorithms, the width and distance of conductor lines or structures on silicon wafers can be measured with subpixel accuracy.
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Product
High-Accuracy Infrared Thermometer [Built-in type]
IT-470F-H
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The IT-470F-H is a built-in type, non-contact infrared thermometer with industry-leading* accuracy. It contributes to improve process stabilization, for which requires high accuracy temperature measurement, such as semiconductor and FPD production.
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Product
Atomic Force Microscope (AFM)
CombiScope
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The CombiScope Atomic Force Microscope (AFM) is an advanced research instrument that provides the entry path for researchers in biology, spectroscopy and photonics. If you work with transparent samples either in air or in liquid towards nano-scale structures and (near-field) nano-optical properties investigation, the CombiScope is the right solution for you. It perfectly combines inverted optical and atomic force microscopies and unleash all the power of both techniques providing the instrument adjustment and measurement automation, high resolution and high speed. Plus it can be easily upgraded to our Raman spectrometers.
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Product
Industrial Microscope Systems
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Below you can see two industrial microscope systems which can be created using our components. Many other automated microscopy systems are possible using our components.
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Product
Single- Multielement Customized Infrared Detectors
LEPTON uncooled detector
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Single element uncooled VPD PbSe detector, in 2 standard sizes: 1×1 mm2, 2×2 mm2, packaged in SMD or TO-5 (with cap, hermetic) with sapphire window
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Product
Longwave Infrared Thermal Camera
FLIR A6780 SLS
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The FLIR A6780 SLS LWIR camera system makes it easy to measure temperatures of rapid thermal events and high-speed targets, making it an ideal choice for industrial, military, and manufacturing R&D applications. Thanks to its cooled, longwave Strained Layer Superlattice (SLS) detector, the A6780 provides faster snapshot speeds than other detectors for crisp images without motion blurring. Manual and remote-focus lens options provide flexibility to maximize the number of measurement pixels on the object of interest. Simple, single cable connectivity using Gigabit Ethernet provides complete camera control, plus data capturing in FLIR Research Studio software – so users can analyze and understand data faster than ever before.
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Product
Non-Contact Infrared Thermometers
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Precision Mastech Enterprises Co.
Handheld devices that measure surface temperature from a distance by detecting infrared radiation emitted by an object.
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Product
Longwave Infrared Thermal Camera Module
Tau® 2
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Made in USA, the Tau® 2 OEM thermal imaging cameras offer an unmatched combination of features and reliability, making them well-suited for demanding applications including unmanned vehicles, thermal sights, and handheld imagers. Improved electronics provide powerful image processing modes that dramatically improve detail and contrast through continuous histogram equalization. Radiometry is available in every pixel for both 640 × 512 and 336 × 256 resolutions and all three camera grade levels. All Tau 2 configurations share electrical, mechanical, and optical interfaces allowing integrations to be designed that work seamlessly with all formats. Available in Commercial, Performance, and Industrial variants, each with unique sensitivity and pixel operability thresholds to meet operational requirements. Radiometry is an optional feature for Performance-grade cameras, and standard feature with Industrial-grade. All Tau 2 configurations and resolutions share electrical, mechanical, and optical interfaces allowing integrations to be designed that work seamlessly with all formats.
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Fluorescence Microscopes
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We develop epifluorescence microscopes with a single fluorescence up to 16 fluorescences in a few seconds. Realized with standard cameras or highly sensitive sensors.
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Infrared Simulation Services
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INO offers a simulation service to assist with the hardware and software design of infrared and electro-optical devices. Precise performance predictions help integrators understand application requirements and bring application performance in line with client specificationsbefore the advance design and fabrication phases. For a minimal investment, infrared simulations help minimize risk in the early stages of development.
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Product
Cooled Infrared Camera Cores and Detectors
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Cooled Infrared Camera Cores and Detectors by Lynred USA: HD Format, XGA Format, VGA Format, QVGA Format
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Product
Atomic Resolution Analytical Electron Microscope
NeoARM JEM-ARM200F
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"NEOARM" comes with JEOL’s unique cold field emission gun (Cold-FEG) and a new Cs corrector (ASCOR) that compensates for higher order aberrations. The combination of a Cold-FEG and ASCOR enables atomic-resolution imaging at not only 200 kV accelerating voltage, but also a low voltage of 30 kV."NEOARM" is also equipped with an automated aberration correction system that incorporates JEOL’s new aberration correction algorithm for automatic fast and precise aberration correction. This system enables higher-throughput atomic-resolution imaging even at low accelerating voltages. Furthermore, a new STEM detector that provides enhanced contrast of light elements is incorporated as a standard unit.
