Infrared Microscopes
observe, measure and analyze, sample magnified, IR view.
See Also: Microscopes, Acoustic Microscopes, Atomic Force Microscopes
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Product
Oxygen/Nitrogen/Hydrogen by Inert Gas Fusion Infrared and Thermal Conductivity Detection
836 Series
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The ONH836 Oxygen/Nitrogen/Hydrogen Elemental Analyzer is designed for wide-range measurement of oxygen, nitrogen, and hydrogen content of inorganic materials, ferrous and nonferrous alloys, and refractory materials using the inert gas fusion technique.
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Product
Microscope Photomultiplier Photometers
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HORIBA's microscope photometers are ideal for any lab wishing to quantitate light intensity from a sample on a microscope stage. Initially designed for the most demanding low light level fluorescence kinetics of labeled mammalian cells, these photometers are also just as well suited for mineral analysis or transmission studies.
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Product
Binocular Stereo Zoom Microscope Systems
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Our ELZ Series is not only a great choice for an entry level binocular microscope, but it’s cost effective and compact, as well as have a zoom range of 3.5x – 120x with options and a FOV of 67mm – 6mm with options. Our SSZ-II Series, which is a user friendly stereo zoom microscope, has a zoom range of 2x – 180x with options and a FOV of 109mm – 1.3mm with options.
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Product
Confocal Raman Microscope
LabRAM HR Evolution
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The LabRAM HR Evolution Raman microscopes are ideally suited for both micro and macro measurements, and offer advanced confocal imaging capabilities in 2D and 3D. The true confocal Raman microscope enables the most detailed images and analyses to be obtained with speed and confidence. With guaranteed high performance and intuitive simplicity, the LabRAM HR Evolution is the ultimate instrument for Raman spectroscopy. They are widely used for standard Raman analysis, PhotoLuminescence (PL), Tip Enhanced Raman Spectroscopy (TERS) and other hybrid methods.
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Product
Infrared Camera for Methane and VOC Detection
FLIR GF320
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The FLIR GF320 detects hydrocarbon and volatile organic compound (VOC) emissions from natural gas production and use. With this optical gas imaging camera, inspectors can check thousands of components and see potential gas leaks in real-time. The GF320 is lightweight, offers both a viewfinder and LCD monitor, and has direct access to controls. Embedded GPS data helps in identifying the precise location of faults and leaks, for faster repairs.
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Product
Scanning Magnetic Microscope
Circuit ScanTM 1000
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Operating circuits within a semiconductor generate external magnetic fields near the surface of the device. These magnetic fields, while weak in strength, contain information about the spatial variation of current density flowing within the circuit. Micro Magnetics has developed the CS1000 to make practical use of this information and provide engineers with valuable information about what is going on inside circuitry non-destructively.
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Product
Scanning Acoustic Microscope
Pulse2
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This industry-leading scanning acoustic microscope provides a universal inspection tool for packaged semiconductor development, production and failure analysis. With the ability to detect air defects as thin 0.05 micron and spatially resolve defects down to 10 microns, the ECHO is perfect for bump detection, stacked die (3D packaging) inspection, complex flip chip inspection and more traditional plastic packages.
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Product
Infrared Thermal Imaging
JOHO640CM_A00
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Wuhan JOHO Technology Co., Ltd
OHO640CM_A00 is a high resolution 640x480 uncooled long-wave thermal imaging core. It is especially designed for OEMs. With lightweight and compact design, low power consumption and standard interface, it is very easy to be integrated into end-user products, such as portable surveillance thermal camera, UAV, thermal sight etc.
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Product
Scanning Electron Microscope
Verios G4 XHR SEM
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The Thermo Scientific™ Verios G4 scanning electron microscope (SEM) provides sub-nanometer resolution from 1 to 30 kV and enhanced contrast needed for precise measurements on materials in advanced semiconductor manufacturing and materials science applications, without compromising the high throughput, analytical capabilities, sample flexibility and ease of traditional Scanning Electron Microscope (SEM).
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Product
Infrared Calibrators
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Electronic Development Labs, Inc.
Designed to test, verify, and calibrate infrared thermometers, pyrometers, and thermal imagers for accuracy.
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Product
Infrared Linescanners
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Fluke Process Instruments Linescanners are designed for continuous monitoring of parts or processes. The up to 300Hz scan speed is the fastest in the business. This provides more complete data about even the highest speed manufacturing processes. With up to 1024 data points per scan and up to 200:1 optics, each spot on the target surface is over sampled up to three times, providing complete coverage.
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Product
Atomic Force Microscope
AFM
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Atomic Force Microscopes are the most widely used SPM microscopes. They can be applied in fields that span from surface science, semiconductor technology, magnetic media, polymer science, optics to biology, chemistry and medicine.Absolute positioning with an accuracy of 2 nm.
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Product
Atomic Force Microscope
LensAFM
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The Nanosurf LensAFM is an atomic force microscope that continues where optical microscopes and profilometers reach their resolution limits. It is mounted like a normal objective lens, thus extending the resolution and measuring capabilities of these instruments.
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Product
LE Photoacoustic Infrared Refrigerant Monitor
Chillgard LE
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The Chillgard LE Photoacoustic Infrared Refrigerant Monitor is specifically designed for reliable detection of some of the most common refrigerants from up to four remote locations—with a minimum detection level of 20 ppm.
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Product
Open Path Infrared Detector
Ultima OPIR-5
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Get continuous monitoring of methane, propane, and other combustible gases with this open path infrared detector. Provides 4-20 mA analog signals, as well as digital display and relay contacts.
