Showing results: 1 - 15 of 85 items found.
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X-MET8000 range -
Hitachi High-Technologies Corp.
The X-MET8000 range of handheld X-ray fluorescence (HHXRF) analysers delivers the performance needed for rapid alloy grade identification and accurate chemistry of a wide variety of materials (solid and powder metals, polymers, wood, solutions, soil, ores, minerals etc). The X-MET is practical, rugged and easy to use to deliver results you can trust.
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Genius-XRF -
Zhengzhou Nanbei Instrument Equipment Co. Ltd
Based on the mature technology of desktop X-ray fluorescence analyzer and the latest technological development, and on the performance of the existing international commercial handheld X-ray fluorescence analyzer, adding new elements into it on the basis of the first, second, and third generation, Skyray Instrument has developed the intellectual portable fourth generational handheld analyzer-Genius XRF series, which can satisfy the market requirements and possess independent intellectual property rights.
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FISCHERSCOPE® X-RAY XAN® 250 -
Fischer Technology, Inc.
Universal high performance X-ray fluorescence (XRF) measuring instrument for fast and non-destructive material analysis and coating thickness measurement. Measurements according to DIN EN ISO 3497 and ASTM B 568.
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Vulcan -
Oxford Instruments plc
Vulcan is the fastest metals analyser available, taking just one second to measure metal alloys - that’s faster than any XRF (X-ray fluorescence) analyser or any other laser product on the market. In quality control and quality assurance this means that large inventories of incoming raw materials or finished parts can be checked very quickly. Large quantities of scrap metal can be sorted in scrapyards easily and fast. Vulcan offers high performance and guarantees very high accuracy and precision for its analysis results. For example, when analysing aluminium, it not only provides the commercial grade of aluminium but also its accurate chemical composition. As Vulcan is so simple to operate, possible user error has been significantly reduced if not almost completely eliminated, so the results obtained from analysis will be reliable and consistent.
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FACTORY LAB MXF-2400 -
Shimadzu Corp.
Wavelength Dispersive X-Ray Fluorescence Spectrometer The Shimadzu MXF-2400 is an improved version of the Shimadzu Multi-Channel X-ray fluorescence spectrometer, which has been rated highly in the overseas market as well as in the Japanese market. The latest hardware designed to fully utilize the principle of X-ray fluorescence spectrometry and the data processing unit that uses various software programs to permit automatic management of analysis data combine to provide high analytical productivity both in R&D and production control. Up to 36 elements can be simultaneously determined by the fixed monochrometer and up to 48 elements can be determined sequentially by the optional scanning monochrometer. High analytical precision is provided even in high sensitivity analysis of a few ppm quantity level.
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Thermo Fisher Scientific Inc.
We offer a full spectrum of analytical technologies, and sample clean up and moisture extraction reagents, designed to provide reliable, accurate, and precise results that make compliance easier and help you reduce regulatory risks. Organic Elemental Analysis, Trace Elemental Analysis, X-Ray Fluorescence (XRF) Spectrometry, Automated Discrete Photometry, Gas Chromatography Mass Spectrometry (GC-MS), Accelerated Solvent Extraction (ASE).
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MRC ltd.
For X-ray fluorescence spectrometers for elemental analysis or trace element analysis, SPECTRO is a world leader
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TEL-Atomic Inc.
X-ray experiments can include radiography, x-ray fluorescence, and x-ray diffraction. All can be performed with the TEL-X-Ometer, a compact x-ray source designed for student use. Take a look at the TEL-X-Ometer and accessories today.
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Evans Analytical Group®
A highly surface-sensitive technique, TXRF is optimized for analyzing surface metal contamination on semiconductor wafers.
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Zetium -
Malvern Panalytical Ltd
X-ray fluorescence spectrometry (XRF) is capable of elemental analysis of a wide range of materials, including solids, liquids and loose powders. Designed to meet the most demanding process control and R&D applications, the Zetium XRF spectrometer leads the market in high-quality design and innovative features for sub-ppm to percentage analysis of Be to Am.
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2830 ZT -
Malvern Panalytical Ltd
The 2830 ZT wavelength dispersive X-ray fluorescence (WDXRF) wafer analyzer offers the ultimate capability for measuring film thickness and composition. Designed specifically for the semiconductor and data storage industry, the 2830 ZT Wafer Analyzer enables the determination of layer composition, thickness, dopant levels and surface uniformity for a wide range of wafers up to 300 mm.
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Elemental Analysis, Inc.
XRF is an elemental analysis technique with unique capabilities including (1) highly accurate determinations for major elements and (2) a broad elemental survey of the sample composition without standards. For example, XRF is used in analysis of rocks and metals with an accuracy of ~0.1% of the major elements.
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GNR Analytical Instruments Group
TXRF is founded on the same principles of the EDXRF with, however, one significant difference. In contrast to EDXRF, where the primary beam strikes the sample at an angle of 45, TXRF uses a glancing angle of a few milliradians.
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FISCHERSCOPE X-RAY/XULM -
Helmut Fischer AG
Flexible instrument for measuring coating thickness with multiple usesBoth thin and thick coatings (e.g. 50 nm Au or 100 m Sn) can be measured equally well through selectable high voltage filter combinationsThe micro-focus tube enables small measurement spot sizes at short measurement distances of just 100 mHigh count rates of a few kcps through proportional counter tubeMeasuring direction from bottom to top, this allows for quick and easy sample positioningLarge measurement chamber with a cutout (C-slot)
