Scanning Probe Microscopes
Used to study the properties of surfaces at the atomic level. (www.eng.yale.edu)
See Also: SPM
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Product
Standard 0.70 (20.00) - 1.30 (37.00) Non Replaceable General Purpose Probe
A-S-R
General Purpose Probe
Current Rating (Amps): 2Average DC Resistance lower than (mOhm): 30Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 30Full Travel (mm): 0.76Recommended Travel (mil): 20Recommended Travel (mm): 0.51Overall Length (mil): 230Overall Length (mm): 5.84Rec. Mounting Hole Size (mil): 38Rec. Mounting Hole Size (mm): 0.97Recommended Drill Size: #62 or 0.97 mm
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Product
Bead Target Probes
Bead Target Probe
A methodology for placing test points directly on a PCB's copper traces, or top metal, thus forming a “Bead Probe”.
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Product
Light 0.83 (24.00) - 2.00 (57.00) High Performance Bias Ball Probe
POGO-1L-2
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Inverted Microscopes
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ACCU-SCOPE inverted microscopes deliver excellent ergonomics, top quality optics, crisp images and configurability to meet your needs. The “workhorse of the tissue culture lab,” the inverted microscope is found in practically all tissue culture rooms and is used to observe cells in culture for their health and growing condition. Living cell cultures are essential to the discovery of cellular processes, providing scientists insight into mechanisms of disease that can be used for identifying new therapeutics. ACCU-SCOPE inverted microscopes are commonly equipped with phase contrast components for the observation of living cells in culture without the need for staining. Other available contrast methods may include brightfield, fluorescence, emboss, differential interference (“DIC”) and modulation.
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Product
Light 0.83 (24.00) - 2.00 (57.00) High Performance Bias Ball Probe
POGO-1V-2-S
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Widefield Confocal Microscope
Smartproof 5
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The versatile ZEISS Smartproof 5 widefield confocal microscope is your integrated system for surface analysis: fast, precise and repeatable. Put it to work on a wide range of industrial applications - such as roughness and topographical characterization - that come up every day in QA/QC departments, production environments and R&D labs. This high quality confocal system is driven by the powerful software ZEISS Efficient Navigation (ZEN) to bring you the added benefits of maximum user comfort and increased productivity.
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Product
High Force Type Probe For PCB, K100 Series 100mil Pitch, Type K, Ø1.50mm, 230gf
K100-K150230-SKAU
Spring Probe
K100 Series, Pitch 100mil, Tip Style K, Tip Diameter Ø1.50mm, Spring force 230gf, Steel with Gold Plating.
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Product
Atomic Force Microscope
NX-Hivac
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Park NX-Hivac allows failure analysis engineers to improve the sensitivity of their measurements through high vacuum Scanning Spreading Resistance Microscopy (SSRM). Because high vacuum scanning offers greater accuracy, better repeatability, and less tip and sample damage than ambient or dry N2 conditions, users can measure a wide range of dope concentration and signal response in failure analysis applications.
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Product
Standard 2.00 (57.00) - 6.00 (170.00) Non Replaceable General Purpose Probe
F-S-W
General Purpose Probe
Current Rating (Amps): 5Average DC Resistance lower than (mOhm): 30Test Center (mil): 125Test Center (mm): 3.18Full Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 66Recommended Travel (mm): 1.68Overall Length (mil): 780Overall Length (mm): 19.81Rec. Mounting Hole Size (mil): 86Rec. Mounting Hole Size (mm): 2.18Recommended Drill Size: #44
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Product
Elevated 1.68 (48.00) - 7.00 (198.00) High Performance Bias Ball Probe
POGO-1I8-7-S
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Radius, Standard 0.61 (17.00) - 2.80 (79.00) General Purpose Probe
HPA-0D
General Purpose Probe
Current Rating (Amps): 3Average Probe Resistance (mOhm): 35Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 67Recommended Travel (mm): 1.70Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 635Overall Length (mm): 16.13
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Product
JTAG Boundary Scan Tools
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Blackhawk has teamed with Corelis, an EWA company, to offer customer Intuitive and High Performance JTAG Boundary Scan Tools that are compatible with our JTAG emulator product line. This allows developers not only to debug code on TI devices but also leverage boundary scan testing using the same emulator hardware.
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Product
Elevated 1.68 (48.00) - 7.00 (198.00) High Performance Lead Free Probe
LFRE-1V-7
ICT/FCT Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Mechanical Life Remark: *Ultra High force products may observe slight decrease in cycle life.Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Atomic Force Microscope
NaioAFM
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The NaioAFM is the ideal atomic force microscope for nanoeducation and basic research on small samples. This all-in-one AFM system provides solid performance and easy handling, with a price tag and footprint that fit anyone and any place.
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Product
Scanning X-Ray Detectors
Shad-o-Scan
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Shad-o-Scan is a family of scanning X-ray detectors specifically designed for the challenging requirements of high-performance industrial and scientific X-ray applications. Industry-leading TDI CCD performance enables the ultimate sensitivity and highest resolution in the industry, and ensures long detector lifetime in even the harshest radiation environments.
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Product
Stereoscopic Zoom Microscope Automation
SZ-2000
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Applied Scientific Instrumentation
Based on ASI's proven DC servo motor technology, the SZ-2000 automates stereo zoom microscopes. The unit can be configured for motorized focus only, motorized focus with automated zoom control, or motorized focus with automated zoom control and an automated XY translation stage. The Z axis focus resolution varies slightly depending upon the model of the microscope, with 0.8 microns being the smallest step size available on a Nikon SMZ800.
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Product
Standard 1.10 (31.18) - 4.80 (136.00) Switch Probe
TSP100-J100-1
Switch Probe
Current Rating (Amps): 5Average DC Resistance lower than (mOhm): 20Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 197Full Travel (mm): 5.00Recommended Travel (mil): 157Recommended Travel (mm): 4.00Overall Length (mil): 1,990Overall Length (mm): 50.60Switch Point (mil): 59Switch Point (mm): 1.50
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Product
Standard 1.50 (43.00) - 4.00 (113.00) High Performance Lead Free Probe
LFRE-25I8-4
ICT/FCT Probe
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Measuring Microscopes, Image Processing
Milling & Drilling
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Optik Elektronik Gerätetechnik GmbH
OEG manaufactures all mechanical parts in house and offers these services to other companies.
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Product
OBDLink Bluetooth Scan Tool
4251BT
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OBDLink Bluetooth features a Class 1 Bluetooth transmitter for maximum range, and Plug and Play connectivity with popular Bluetooth devices including Android and Symbian based phones. The built-in USB port makes this the most versatile scan tool ever offered!
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Product
Electron Microscope Analyzer
QUANTAX Micro-XRF
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Micro-X-ray Fluorescence (Micro- XRF) spectroscopy analysis is a complementary non-destructive analytical technique to traditional Energy Dispersive Spectroscopy (EDS) analysis using a Scanning Electron Microscope (SEM).
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Product
Standard 1.50 (42.00) - 3.30 (94.00) General Purpose Probe
P2663G-1P1S
General Purpose Probe
Current Rating (Amps): 3Average DC Resistance lower than (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 90Full Travel (mm): 2.29Recommended Travel (mil): 67Recommended Travel (mm): 1.70Overall Length (mil): 810Overall Length (mm): 20.57
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Product
Boundary Scan Test
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Boundary Scan is a very useful tool for quick, low-cost, re-usable powered-up test of an assembly for basic functionality. Because a fixture with test probes is not required, it is possible to have a working test available within hours or days, rather than weeks. Designers can receive rapid feedback on their prototype boards with tests that can be used again during production testing, as well as for device programming. Given power, ground and Tap port signals, tests can be written to assess the performance of the boundary scan enabled parts on an assembly and other parts on the boundary scan chain.
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Product
Standard 1.50 (43.00) - 4.00 (114.00) Bead Probe
BTP-25C-4
Bead Target Probe
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Super 3.90 (111.00) - 16.00 (454.00) High Performance Lead Free Probe
LFRE-25I-16
ICT/FCT Probe
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Infrared Microscope
DDR200/300 NIR
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The McBain DDR200 NIR (for 200mm) and DDR300 NIR (for 300mm) provide high-speed defect detection and precision measurement on wafers and other parts. These cost-efficient systems offer unique advantages for both production and process development use, providing an optimum near-infrared (900-1700nm) solution when both subsurface defect detection and dimensional metrology are required.
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Product
Digital Microscopes
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TAGARNO digital microscopes give you unique and easy to use magnification equipment to use in a variety of quality control processes as well as R&D efforts or in your repair and rework in an endless range of segments. The digital microscopy camera technology enables you to see any small object in ultra sharp magnification and to document your work with just a single click. It also allows multiple viewers at the same time and thereby greatly improves collaboration.
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Product
Line Scan Moisture Imager
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Bodkin Design & Engineering, llc
Line scan camera built for measuring product on a moving conveyor. Infrared spectral filtering permits moisture and hydrocarbon imaging for process control.
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Product
Microscopic Melting Point Meter
DRK8030
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Shandong Drick Instruments Co., Ltd.
Heat transfer material is a silicone oil, in full compliance with USP standard measurement method can simultaneously measure three samples, direct observation of the melting process can be measured colored samples.
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Product
High Voltage Probe, 100:1, 3.7 KVpk, 500 MHz
10076C
High Current Probe
The Keysight 10076C 3.7 kVpk, 100:1 passive probe gives you the voltage and bandwidth you need for making high-voltage measurements. Its compact design makes it easier to probe today's small power electronics components, and its rugged construction means it can withstand rough handling without breaking.
