Electronics Test
Devices whose quality of operation is based on the effects of electrons.
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Product
Battery Test and Analysis System
BTAS-16
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The task of testing an aircraft’s Nickel-Cadmium batteries is complicated and involved because of the high number of cell voltage readings that need to be taken during testing. Taking voltage readings from all 20 cells in the typical nickle-cadmium aviation battery multiple times is laborious and error prone, but must be done to properly estimate the condition of the battery under test.
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Product
VLF test system
BAUR PHG 80 portable
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Portable, high performance test generator with VLF truesinus technology. The BAUR PHG 70/80 portable VLF test systems are used for cable and cable sheath testing of medium-voltage cables of up to 50 kV and electrical equipment.* 3 voltage shapes in one device: VLF truesinus, VLF square wave and DC voltage* For medium-voltage cables of up to 50 kV operating voltage* Cable testing, fault conditioning, cable sheath testing
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Product
Test Charts
iQ charts
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Image Engineering GmbH & Co. KG
The basis of our test chart portfolio are the ESSER TEST CHARTS owned by Image Engineering and known worldwide for their high quality which we continually improve. Included in the extensive program are HDTV charts for broadcast, multipurpose charts as well as the UTT chart (Universal Test Target), the leading system for the standardized digitalization of archives, which is already being used by the Metropolitan Museum in New York.
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Product
Regression Testing
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TestOrigen Software Testing Services Pvt Ltd.
Regression testing basically the process of retesting. Although when a developer modifies or change their software products, even a small modification can have surprising results. Due to this, all test cases are performed again simultaneously to verify whether the new changes have not brought the new bugs and all the previous functions are working properly or not. Such tests are performed manually, but some time in few test cases repetition of source code and updating is too much complicated as well the time consuming to think, so an automated regression testing tools are used.
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Product
Accelerometer & Platform Test Bench
mS 1115
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Platform Test Bench used to test the Digital Inputs, Accelerometer Count Reading, High and Low Gyro Torque control of Platform. It also performs Real Time Test for single negative pulse, checks Roll Axis, Pitch Axis, Azimuth Axis. Software package is available to test the Accelerometer.
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Product
ESD Testing Service
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Innovative Circuits Engineering, inc
ICE’s ESD Testing lab has state-of-the-art equipment and in–house technical expertise to perform a whole range of ESD/Latch-up and associated testing services.
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Product
CE Mark Testing Lab
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The CE mark is a mandatory European marking for certain product groups to indicate conformity with the essential requirements set out in European Directives. In order to use the CE mark on a product, the manufacturer must draw up an EU declaration of conformity (DoC) in which the manufacturer attests to conformity with all relevant New Approach Directives (NADs) and takes sole legal responsibility. In some instances, a NAD may require a Notified Body to issue a Certificate of EU declaration of conformity (DoC) Conformity in order to verify the performance of the product or constancy of the production process (Factory Production Control, for example).
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Product
Semiconductor Test Hardware Solutions
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A critical element of every semiconductor test solution is the interface between the device and ATE. The hardware team at Test Spectrum has produced thousands of successful test interface solutions for some of the most challenging semiconductor products on all major ATE platforms. Our in-house team of PCB design experts has an added advantage of direct access to our senior test engineering staff.
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Product
2-Module ICT System, I317x Series 6
E9902G
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Keysight's family of i3070 Series 6 In-Circuit Test (ICT) systems are built on a proven technology foundation, and they improve test efficiency with time-tested software, hardware, and programmability. I3070 Series 6 ICT tester supports a wide range of printed circuit board assembly (PCBA) sizes for applications including IoT and 5G, as well as automotive and energy. The i3070 features a unique design that delivers the shortest signal path between measurement circuitry and devices under test to minimize undesired effects from parasitic capacitance, improve immunity to crosstalk, and eliminate stray signal coupling effects, delivering consistent and repeatable measurements. The Series 6 is fully backward compatible with previous systems and makes highly repeatable measurements.
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Product
Primary Injection Test Equipment
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High current injection units for primary testing of over current relays and circuit breakers.
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Product
Ultrasonic Testing
Pundit 250 Array
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The Pundit 250 Array brings a quantum leap in the ultrasonic pulse echo testing. A number of unique innovations make the Ultrasonic multi-channel instrument the best and fastest solution for thickness measurements, detecting defects and localizing objects which cannot be easily detected by any other technology. This includes the assessment of thick concrete elements such as tunnel linings as well as pipes and tendon ducts beyond the rebar layer.
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Product
Wafer Test
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Silicon Turnkey Solution, Inc.
Most foundries provide wafers already probed to a set of DC parameters at room temperature to ensure they meet a basic subset of the package-part specification. Beyond this basic set of tests, more rigorous testing is often needed to meet specifications requiring die to be 100 percent probed, identify and segregate devices with higher performance levels and guarantee that parts will perform to a certain specification level.
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Product
Radar Altimeter Test Set
6000
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The Eastern OptX Series 6000 Altimeter Test Set is designed to test and calibrate radar altimeter systems. The Series 6000 provides multiple, programmable delays with front panel and/or remote computer control. It features ultra wide bandwidth, low loss, high isolation, and high dynamic range. Able to simulate altitudes up to 50,000 feet, the test set operates from 4.2 to 4.4 GHz and offers altitude accuracy up to 0.1 %.
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Product
Motor Testing Solutions
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IES Systems, Inc, is a turnkey motor testing solutions provider with 10 years of proven experience in the design and manufacturing of motor testing equipment. We provide custom designs to meet our customers' testing requirements. IES Systems, Inc. designs and builds no-load motor testers, full load motor testers, dynamometers, core-loss testers and ECM testers
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Product
PXIe-4051 - PXIe, 1-Channel, 60 V, 40 A PXI Electronic Load Module
788179-01
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The PXIe-4051 provides programmable load capable of sinking DC power for characterization, design validation, and manufacturing test. This module helps you sink current and absorb power out of a power source up to 300 W with programmable constant voltage, current, resistance, and power levels. You can use the PXIe-4051 to streamline the task of designing automated test systems for a wide range of applications—from aerospace and defense to automotive and semiconductor component test—by eliminating the need to mix multiple instrumentation form factors in a given test system and simplifying synchronization.
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Product
Multi-Channel Battery Testing
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The Multi-channel system includes turnkey integration of Greenlight's environmental chamber, load bank, power supply and data acquisition system, all housed in 19" rack towers.
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Product
Fungus Test
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The fungus test assesses the extent to which material will support fungal growth and how any fungal growth may affect performance. The fungus test also identifies how rapidly fungus will grow on the material, and how fungus affects the material, its mission, and its safety for use following the growth of fungus on the material.
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Product
Exchangeable Test Fixture
MA 2111/D/H/S-5
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Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: Test system sideInterface signals max.: 850Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 9,30 kg
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Product
Security Testing Service
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Web Application Penetration Testing. Mobile Application Penetration Testing. Security Code Review. Network Vulnerability Assessments.
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Product
Sand And Dust Test Chambers
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Dongguan Amade Instruments Technology Co., Ltd
Sand and dust test chamber is also referred as dust-proof chamber, which is able to simulate the sand storm by putting the test piece in the chamber to judge the damage of sand-and-dust weather to products. Equipment is mainly applicable to determination of sealing performance of product shells based on the IPX5 and IPX6 degrees. Testing machine features a flow of air carrying dust in a vertical circulation, resulting in cycle use of sand during the test. Sand and dust testing has great significance to master the specimen’s performance to defend the penetration of dust particles, to withstand the abrasion of sands.
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Product
DRAM Module Test
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We provide our customers with Automated SLT (System Level Test) Solutions for DRAM Module HVM test. Our solution gives our customers the best possible combination of technologies for the best performances and manufacturing effiencies - increasing yield, reducing cost of ownership and accelerating time-to-market.
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Product
Temperature Cycling Test Chamber
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Guangdong Bell Experiment Equipment Co.,Ltd
DGBELL Temperature cycling test chamber is suitable for testing various performance indexes of aerospace products, electronic instruments, materials, electronic products and various electronic components under the condition of rapid temperature change.
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Product
Cable Testing Service
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Cable testing service available from Cimbian includes:Helping you with the test specificationBuilding the test interface, where necessaryCreating the test programBarcodingTest reportsSimple continuity testingMeasurement/verification of resistances and diodes (traceable to national standards)Hi-Pot testing to 1500VDC / 1000VAC
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Product
Crack Testing
STATOGRAPH® Product Family
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Foerster Instruments, Incorporated
The STATOGRAPH product family is used for testing surface cracks with the help of eddy current sensors. Eddy current testing for material cracks requires the appropriate evaluation electronics and probes adapted to the testing task. Depending on the test situation and test object, the STATOGRAPH family of test instruments offers the right system for this purpose.
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Product
Multistandard Test Pattern Generator
TRF-950
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TRF-950 is universal multistandard equipment suitable for analog TV systems and digital video. This generator supports all analog standards (PAL, SECAM, NTSC) and substandards. Digital output offer DV601/656 signal. Generator is installed in low profile case suitable for desktop use as well as for use in Rack 19" stand.
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Product
Cross Browser Testing
BrowseEmAll
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Live Testing, Screenshots, Code Analytics & Selenium Integration On Your Local Machine. Every browser is just one click away. Mobile Simulators. Test for iOS, Blackberry, Windows Phone and Android. Screenshots. Find layout issues with screenshots. Automated Compatibility. See problems directly in your Code. Side by Side Test browsers and mobile devices simultaneously. Test Automation. Run Selenium Tests Out Of The Box.
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Product
Acceptance and Model Office Testing
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Business Acceptance Testing (BAT), (also known as User Acceptance Testing UAT), is the test phase where the business owners or clients of the software test the solution to verify that deliverables meet the original business requirements. A number of reoccurring issues can present during these finals stages and experienced resources can prove invaluable during these times.
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Product
Electronic Warfare MMI and HMI Simulators
MS 1600
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The EW IFU (Electronic Warfare Interface Unit) interfaces between Cockpit electronics viz., RWR Display Unit (DU), New control Box (NCB), CMDS Control/Display units and Simulator Host Computer (HOST). The EW IFU transmits the status of the cockpit control units to the host, receives display data from the host and transfers the same to RWR DU, NCB and CMDS CCU/CDU. The display data for the RWR DU received from the host would comprise of the complete symbol data in respect of emitters that are to be displayed based on the data from the Instructor Station (IS) and control input from the cockpit. The display unit receives and presents the data as symbology on the display screen. The EW IFU based on the PC–AT.
