System Test
Testing conducted on a complete, integrated system to evaluate the system's compliance with its specified requirements .
See Also: Systems, Equipment, Test Systems, System Integrators
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PXI Solid State Versatile Multiplexer
40-682-002
This versatile solid state multiplexer is especially useful where a high density MUX array is required that can adapt to different test configurations for different test targets, or where a test system may have to be reconfigured in the future. The PXI multiplexer uses high performance solid state switching to ensure a service life of greater than 10 years and fast operation.
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Functional Testing of Printed Circuit Boards, Sub Assemblies and Finished Products
Testpoint
Yelo Testpoint is an extremely modular and flexible system, allowing you to scale to any size operation, and to add almost any new test requirements. Ideally suited to cellular manufacturing, the system can be used to complement an existing ATE, as a functional test add-on, or as a diagnostic work station. Its compact, space-saving construction has multiple interface positions to accommodate both horizontal and vertical connections.
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Mobility Simulator Creates V2X Environments For Testing
MxDrive™
MxDrive is a multi-vehicle and infrastructure mobility simulator that provides an environment to generate and run real-world conditions to test connected vehicle applications. Testing V2X applications on actual roads has limitations. Only a limited number of test conditions can be achieved, while safety and damage risks further limit test coverage. MxDrive combined with the MxSuite ecosystem significantly simplifies the testing of Advanced Driver Assistance Systems (ADAS), Sensor Fusion, Radar, and V2X. MxSuite is ISO 26262 qualified to test safety applications for OEMs and suppliers.
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DWDM DFB Light Source (42CH)
DWOS-1000
Hangzhou Huatai Optic Tech. Co., Ltd.
Huatai DWOS-1000 seires DFB optical source is the DWDM test platform with high capability, high stability and high flexibility. It is consist of the system rack and plug-in function module. The system rack is equipped with high capability RS232 communication interface, high precision parameter display and power supply module. There are 3 types of the function module: DFB Source module, DWDM, EDFA (optional).
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Iridium Physical Layer Test Systems
PLTS
Averna has worked with Iridium to ensure you have the right equipment to support their test coverage. The Iridium PLTS verifies product performance to Iridium’s standards. Find out more!
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PXI Versatile Multiplexer, Solid State, 350mA, 60V
40-681A-001
The 40-681A-001 is a very high-density versatile PXI Multiplexer module featuring a wide range of selectable switching configurations with 350mA current and 60V voltage handling. The 40-681A is especially useful where a high-density MUX array is required that can adapt to different test configurations for different test targets, or where a test system may have to be reconfigured in the future.
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Coaxial Test Contactor
ICON
The ICON™ test contactor designed specifically for maintaining the native impedance of the device-under-test (DUT) through the contactor to the test system, maximizing high frequency power transfer by minimizing signal reflections (Return Loss).The metal body is a Faraday shield/cage, which reduces cross talk (electromagnetic radiation) the primary cause of signal jitter. Along with this, the aluminum body blocks both static and non-static external electric fields (random noise). Featuring exceptional DC and RF performance and excellent thermal management.
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Cable Phasing Meter
4183 CP
Standard Electric Works Co., Ltd
● Safely operates at low voltage ● Measures system voltage.● Measures capacitance of test point if system voltage is known.● Checks phase rotation of cables.● Phases out cables.● Rugged - comes with portable case.● Operates from potential test point of elbow connec-tors.● Battery operated.
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Industrial USB 3.0 Tester
M5615B
International Microsystems Inc.
The M5615 tester is a 16 Socket Bench top Production and Engineering Tester that supports USB 3.0 Super Speed and USB 2.0 High Speed devices. The tester comes with a built-in PC running a full Linux operating system that tests and copies any USB storage device including USB Hard Drives at super speeds.
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Scienlab Battery Test System – Pack Level, 110 KW Extendable Version
SL1720A
Keysight’s SL1700A Scienlab Battery Test System – Pack Level Series allows to realistically emulate the environment of the future battery pack application in order to test the high-power battery pack comprehensively and improve its functions and safety. The growing demand of e-mobility increases the need of vast battery test labs for EV battery development.
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Quality Control for more Precision in Press Hardening
PRESS-CHECK
The automated test system PRESS-CHECK works with two powerful high-end thermographic cameras for continuous measurement of two-dimensional temperature distribution. This measurement is carried out before the pressing operation on the surfaces of the boards to be processed and subsequently on the resulting molded parts, ultimately enabling exact compliance with the thermal process parameters.
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Multi-Functional Dynamic System Monitor
PFMonitor
The PowerFactory Monitor (PFM) is multi-functional Dynamic System Monitor which fully integrates with DIgSILENT PowerFactory software. The PFM features grid and plant monitoring, fault recording, grid characteristics analysis by offering easy access to recorded data, analysis of trends, verification of system upset responses and test results.
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E-mobility Test Systems
Correct contactingcharging cable detectionsecurity questionExtensive range of accessories for on-site measurements in a separate caseCharging cable with additional measuring lines (Sense)Convenient control through guided test procedure via WinSAM and tabletElectromechanical locking
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Modulation Distortion Up To 13.5 GHz
S930701B
S930701B enables fast and accurate active-device modulation distortion characterization under modulated stimulus condition up to 13.5 GHz. The wide dynamic range and vector error correction of the PNA-X result in an extremely low residual EVM of the test setup, so you can get a complete picture of your device’s performance without test system interference. S930701B can measure EVM, NPR, ACPR, and can decompose nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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AIS Air Data Test System
F-16
The primary function of the Air Data Test System (ADTS) is to perform testing and fault isolation of pneumatic-type Units Under Test (UUTs). To test a UUT, the operator connects the associated Line Replaceable Unit (LRU) Integrated Test Adapter (ITA) to the rackmount Avionics Intermediate Shop (AIS) test station. The operator connects the ADTS to the IAIS via an RS-232 Interface and then finally, connects the UUT to the ADTS using the supplied cables and hoses.
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PXI Hybrid Single SP6T Switch, DC To 26.5 GHz, Terminated
M9157C
M9157C operates from DC to 26.5 GHz, providing a low-cost operation switching solution for measurement and automation of Automatic Test Equipment (ATE) systems without compromise in the RF performance. It is being used in applications such as ATE, RF communication and RF parametric measurements where a rugged switching module is needed for signal routing. Typical switching applications for multiport coaxial switches include signal routing to a single input to multiple instruments and routing of multiple input signals.
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PXI 2.5W Programmable Resistor Module, 2-Channel, 3Ω to 22.3MΩ
40-251-054
The 40-251-054 is a programmable resistor module with 2 channels which can be set between 3Ω and 22.3MΩ with 2Ω resolution The 40-251 range provides a simple solution for applications requiring up to 2.5W of power handling per channel. The 40-251 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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Interface Panel for SLSC
THROUGHPOINT™
Bloomy's ThroughPoint™ Interface Panel provides a simple, yet highly-flexible connection between the unit under test and resources in a National Instruments Switch/Load/Signal Conditioning (SLSC)-based test system.
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PCI High Density Resistor Card 3-Channel, 24-Bit, 0 To 16M Ohm
50-295A-021-3/24
The 50-295A is a Programmable Resistor card with up to 18-channels of 8-bit resolution resistor chains in a single PCI slot. The flexible architecture allows the card to also be supplied as 12-bit, 16-bit or 24-bit resolution versions for applications requiring finer resolution, greater resistance range or higher channel count. The card is ideal for simulating the sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
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LabVIEW And TestStand Solutions
As a National Instruments Alliance Member, AB Controls offers turn-key solutions based on LabVIEW and TestStand products. Our relationship with LabVIEW goes far back. Our familiarity with LabVIEW and National Instruments DAQ products plus our experience in system integration makes us the perfect candidate for your next LabVIEW project. Here are some of the past solutions we have provided. Advantages of automated test systems are innumerous.
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Test System for Detecting Exact PCB Short Circuit Locations
QT25
Qmax Test Technologies Pvt. Ltd.
QT25 employs a unique method to detect exact PCB shorts circuit locations and pin down the shorted components and tracks. It is designed in such a manner that it precisely detects exact short circuit locations across VCC - GND or a shorted component connected across a Bus or hair-line shorts between PCB tracks, Which is highly impossible to detect using conventional tools especially when they are connected parallel in circuit. It can also be used in measuring the contact resistance of switches and relays in its milli-ohm mode as a value add.
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Isolation Tester UIP
The devices of the UIP (Union Isolations Prüfer) isolation tester series are used to test the pore-free condition of corrosion protection coatings of pipes, vessels or plant system parts. The battery-powered device generates test voltages between 5 kV and 30 kV, which are applied to the grounded test object via test electrodes. The location of a defect is signalized by a spark-over with an additional audible warning.
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Battery Internal Resistance Tester
HDGC-3915
HD Power Test Equipment Co.ltd
Battery Internal Resistance Tester is designed using the advanced AC discharge measurement method to test accurately voltage and resistance of battery. It is strictly designed to evaluate battery performance, state and life-time, which maintain all stationary power systems including Uninterruptible Power System. Battery Internal Resistance Tester can proceed the measurement in a group and in a single section of battery. With accurate testing of resistance and voltage, it gives an indication of ...show more -
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MEMS Device-Oriented Testers
Are your test requirements oriented to defined families of devices, with common characteristics? You do not need to purchase an expensive, general-purpose mixed signal tester: You can rely on SPEA DOT 100, a system designed to answer the test requirements of MEMS and other low-pin-count devices at an incredibly low cost.The DOT 100 is based on a revolutionary per-device architecture: each device under test has a dedicated CPU managing the entire test process, while each card hosts all the resources for the parallel test of 3 devices, in the size of a postcard.
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Precise Temperature Forcing System
TA-5000A Series
The ThermalAir TA-5000 Series of temperature forcing systems bring precise thermal testing capabilities directly to your test application, exactly localizing to where thermal conditioning temperature cycling is required. ThermalAir TA-5000 temperature systems provide flexible thermal test solutions for an array of products and technologies.
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30W Power Supply, 35V, 0.8A or 60V, 0.5A
E3641A
Keysight basic DC power supplies offer essential features for a tight budget. The single & dual output, 30-100 W GPIB E3640 series provide small, compact size for bench and system use; low output ripple and noise; and built-in measurements and basic programmable features. The Keysight 30W, single output E3641A is a stable and reliable power supply for benchtop and basic automated test applications, and enables versatile solutions for tests that require moderate speed and precision with both GPIB and RS232.
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Wireless Test Fixtures
At Forwessun, we have vast experience in designing and delivering wireless in-circuit test (ICT) fixtures. We have experience in providing fixtures tailored to the unique needs of various different industries. While our primary customer focus has been on full and half-bank fixtures for the HP3070 system, we offer bespoke solutions for other platforms as well including GenRad, Teradyne, and SPEA systems.
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AOI & SPI Test Systems
Xceed AOI
Most defects in the circuit-board assembly are due to the solder paste or the process of printing solder paste. Since the transition to lead-free soldering, a whole new spectrum of problems has emerged in older paste printing and its due processes. Incomplete coalescence of ball grid array (BGA) spheres and solder paste deposits are failure modes that have increased in frequency since the transition to lead-free soldering. The Xceed enables true 3D measurement and provides the most accurate and repeatable inspection results with the minimum false calls. It’s designed with Advanced Signal Processing which gives results in noise-less, clear, and accurate 3D images.
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PXI Software
Keysight modular products include software tools to help you quickly access your test equipment and make measurements. The Keysight IO Libraries Suite allows you to display and configure all of the modules in your system such as LXI, VXI, PXI, AXIe and USB. In addition, software drivers support the most common programming environments such as Visual Studio, C, C++, Visual Basic, MATLAB and LabVIEW.
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Standard Test Systems
WaveCore™ Products
Textron Systems’ WaveCore family offers a variety of standard test systems with a primary application of satellite payload lab testing. Our systems can be deployed affordably for both production and engineering applications, providing industry-leading levels of data correlation with high system mean time between failures and low mean time to repair.
