System Test
Testing conducted on a complete, integrated system to evaluate the system's compliance with its specified requirements .
See Also: Systems, Equipment, Test Systems, System Integrators
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Antenna Test System
ATS1000
Offering measurements on active and passive devices - supporting also extreme temperature testing. 5G is all about data, speed and reliability using high frequency millimeter wave bands. The lack of conventional external RF connectors makes 5G antenna characterization challenging. 5G antenna, chipset and UE manufacturers as well as wireless market operators need a viable solution for research, diagnostics and debugging up to type approval.
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120 A Manual Pulse Width Extender
TLP-12012A6
High Power Pulse Instruments GmbH
- Pulse width extender for the high current TLP/HMM test system TLP-12010A and TLP-12010C- 6 manual selectable pulse width: 5, 10, 50, 100, 200 and 500 ns- High pulse output current up to ±120 A- High performance and high quality components
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Modulation Distortion Up To 26.5 GHz
S930702B
S930702B enables fast and accurate active-device modulation distortion characterization under modulated stimulus condition up to 26.5 GHz. The wide dynamic range and vector error correction of the PNA-X result in an extremely low residual EVM of the test setup, so you can get a complete picture of your device’s performance without test system interference. S930702B can measure EVM, NPR, ACPR, and can decompose nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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Motor Drive Analyzer, 2 GHz, 8 Ch, 12 bits, 10 GS/s, 50 Mpts/Ch
MDA 8208HD
Static power analysis - like a dedicated power analyzer.Dynamic power analysis – capture more information.Complete test coverage – control system, power section, motor.Comprehensive mechanical interface.Harmonics calculation option.Vector display option (THREEPHASEVECTOR).Waveform Transformations option (THREEPHASEdq0).16 Channels with OscilloSYNC™.
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Camera Testing
FLIR
CI Systems' FLIR turn-key test stations carry out all the necessary tests to verify and compare the quality of an infrared/thermal camera. The FLIR test systems are based on CI Systems' NIST traceable blackbody radiation sources, collimators and special thermally controlled targets, designed to provide very accurate IR test patterns. All these combine to project standardized targets with known geometry and intensity to the Unit Under Test(UUT).
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PXI 2.5W Programmable Resistor Module, 2-Channel, 2Ω to 13.6kΩ
40-251-131
The 40-251-131 is a programmable resistor module with 2 channels which can be set between 2Ω and 13.6kΩ with 0.25Ω resolution The 40-251 range provides a simple solution for applications requiring up to 2.5W of power handling per channel. The 40-251 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems.
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Engineering Services
In addition to the highest quality test programming, maximizing board coverage, and efficient board testing, TTCI offers a full array of other engineering services, including CCA (Circuit Card Assembly) Testing, Design for Test, ASTER TestWay electrical design for test analyzer, Feasa LED analyzer, SMH Technologies FlashRunner in-system programmer, finite element analysus, installation, reverse engineering of Gerber to CAD, Training, Test System PC, Hardware, and Software Upgrades, and more.
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Burn-in or Rapid Temperature Cycling Chamber
KDL Series
The Bemco KDL series is designed for production testing of electronic circuit boards and completed electronic systems. They accept Bemco KDLC Carts that have a working area of 42 wide by 60 high by 48 deep suspended on insulated runners and casters 11 inches above the test area floor.
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Testing Software
Materials testing software packages are available for all new Instron systems and as upgrades to existing Instron systems. All software interfaces are designed to be natural extensions of the instruments for efficient test operation, while also providing a powerful post-test analysis tools, like DIC Replay, and data management tools, like TrendTracker™.
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Check Case Definition Language
CCDL
CCDL is a test specification language that provides a dedicated high-level and easy to learn test language for powerful requirements based system testing. The fully automated test execution and evaluation shortens testing cycles and reduces required manpower. The intuitively readable CCDL test specification reduces documentation effort and the test execution flow visualization reveals the dynamic behavior of the system under test (SUT) and clearly spots any deviations against the expected results.
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Custom Assembly Automation
Our team of experienced mechanical, electrical, and software engineers fabricate all types of assembly systems, ranging from complicated multi-step assemblies to simple single step assemblies. We have a full machine shop to manufacture systems from materials such as plastic, aluminum, steel, and stainless steel. All our systems are expandable and allow for future enhancements with modular components. They are available with a variety of options, including human machine interfaces, welding, marki...show more -
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Portable Recorder
DataMAX DTX-3P
DataMAX DTX-3P is a state-of-the-art Windows 2000 based analog instrumentation recorder designed to replace traditional tape based data recorders. Using the latest technology, DataMAX DTX-3P eliminates the time consuming methods of the past with a single precision instrument that will replace a tape recorder, data acquisition system, and monitoring scopes. From calibration to analysis a test can now be run in a fraction of the time, with far greater accuracy than was possible with traditional analog recorders.
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Sand & Dust Testing
Products with moving parts, electromechanical components, filtering systems and electronics are all susceptible to fine and large particle dust that can contaminate a product. These contaminates can cause premature failures and loss of function.Today’s test plans for phones, computers, vehicles, enclosures and aircraft include sand and dust testing to determine if this stress source would cause functional deterioration.Our services include military and automotive dust testing for both blowing and agitated dust and sand.
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SIP-90-2 Test System Interface Probe
SIP-90-2
Overall Length (mil): 700Overall Length (mm): 17.78Rec. Mounting Hole Size (mil): 55Rec. Mounting Hole Size (mm): 1.40Recommended Drill Size: #54 or 1.40 mm
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NFC Physical Layer Test System
IQnfc+
LitePoint provides turn-key software that facilitates test coil calibration, executes test plan and provides detailed waveform analysis and flexible APIs to customize test flow in the labs.
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Protocols
Excalibur Systems provides a large selection of board level products for test & simulation, as well as, the embedded environment. Choose from a number of avionic protocols under platforms such as, USB/Ethernet, PC/104, PMC, PCI, Compact PCI, VME and VXI.
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Electrical Creep and Rupture Testing Machine
ECR Series
Jinan Testing Equipment IE Corporation
This series of computer control electronic creep and rupture testing machine is newly designed with full-digital measuring control system to meet the standards of GB/T2039, GB//T20120, EN ISO 204-2009 and ASTM E139 etc. The electronic creep and rupture testing system can perform not simply creep. stress-rupture test and stress relaxation test on metals under room or high temperatures, but also low cycling test & creep fatigue test. The electronic creep and rupture testing machine is widely used for quality control in factories, material research in R&D department and teaching in universities,
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PCI Resistor Card 4-Channel 1 Ohm To 255 Ohm
50-293-013
The 50-293 is a Programmable Resistor card with either two channels of 16-bit or four channels of 8-bit resistor chains in a single PCI card. The card is ideal for simulating sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
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AC Power Sources
RS Series
AMETEK Programmable Power, Inc.
The RS Series consists of multiple high power AC and DC power systems that provide controlled AC and DC output for ATE and product test applications. This high power AC and DC test system covers a wide spectrum of AC and DC power applications at an affordable cost. Using state-of-the-art PWM switching techniques, the RS series combines compactness, robustness and functionality in a compact floor-standing chassis, no larger than a typical office copying machine. This higher power density has been...show more -
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Automated Thermostat Test System
*Transport mechanism moves thermostats to various temperature controlled locations.*Continuously monitored process status*PC controlled transport and measurements*Operator is shielded from 200 - 210 degree F hot water insertion baths*LabVIEW® test/process language
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Realtime Diagnostics
TEAMS-RT
TEAMS-RT is a fast and compact reasoner running on a vehicle's (or other system's) on-board computer, providing.real-time diagnostics and system health monitoring. It uses a subset of the TEAMS model of the vehicle or machine, and processes the results of on-board, built-in tests to perform diagnostics.
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Test Fixtures & Jigs
A test fixture or test jig is the component containing the bed of nails used for testing the PCB or assembled product. It is powered and controlled by the Yelo Testpoint system which has test cards capable of providing multiple test conditions. This system also controls the probes used in the bed of nails, and relays test information back to the Testpoint system to be analysed.
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RFID Test Instrument
RAIN Xplorer
The CISC RAIN Xplorer is a unique RFID test product developed for convenient tag frequency sensitivity, communication range, and backscatter measurements. The RFID tester is designed for open area tests and measurements in an RF-controlled environment using portable or fixed RF test chambers. The system is supplied with software and a reference tag for self-calibration.
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RMC-8355, 2.4 GHz, 1U Rugged Rack-Mount External Controller for PXI
782568-01
2.4 GHz, 1U Rugged Rack-Mount External Controller for PXI - The RMC‑8355 is a rugged 1U rack-mount controller for PXI- or PXI Express-based systems intended for test and measurement applications requiring rack-mount controllers. It features up to two Intel Xeon E5620 quad‐core processors that support up to 96 GB of DDR3 RDIMM ECC RAM. The RMC‑8355 offers hot-swappable fans, options for redundant power supplies, and support for RAID arrays, which allows multiple hard drives to be configured for high performance for mission‐critical, physically demanding applications. The RMC‑8355 meets the PXI standard’s mechanical shock and vibration specifications and functions over wide operating ranges.
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IEC60529 IPX3-IPX4 Rain Proof Test Machine
CX-IPX34A
Shenzhen Chuangxin Instruments Co., Ltd.
IEC60529 IPX3-IPX4 Rain Proof Test Machine Application The rain test system is strictly designed according to IEC60529. It’s applied to the Electrical equipment of the waterproof test of IPX3 and IPX4.
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AXIe Chassis and Controllers
AXIe is a new open standard for high-performance, modular instrumentation, and incorporates the best features of other modular formats including VXIbus, LXI and PXI. Keysight has designed a new line of scalable chassis in this new format. Along with controller options, these new AXIe chassis will form the basis of a high-performance, AXIe-based test system.
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STANAG3910/EFEX Modules
AIM’s STANAG3910/EFEX test, simulation, monitoring and analysis modules use our field proven Common Core hardware design giving you the best performance, best feature set and highest functional integration on the market. The use of SoC (System on Chip) based core designs with multiple processors for real time bus protocol and application support, massive memory and IRIG-B time code encoder/decoder functions are standard. The latest versions also support avionics discrete I/O. Configurations with...show more -
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Benchtop/Portable Cable/Harness Wiring Test System
CKT1175-10
Designed for wiring testing requirements requiring up to 2,000 test points, the CKT1175-10 is ideal as a benchtop or portable test system. The system is packaged in an enclosure specifically designed to be used in rugged environments. The basic 500 test point system is 20.5 in. (521 mm) wide X 12.0 in. (305 mm) high X 16.05 in. (408 mm) deep; the 500 test point expansion units are 20.5 in. (521 mm) wide X 6.00 in. (153 mm) high X 16.05 in. (408 mm) deep.
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Integrating Sphere
The simpler way to measure the total luminous flux of lamps and luminaires is to use an integrating sphere photometer system. It is a device to perform spatial integration of flux optically, thus the total luminous flux can be measured with one fixed photometer head and measurement can be instant. An integrating sphere photometer is calibrated with a total luminous flux standard lamp. A test light source is measured by comparison to a standard lamp calibrated for total luminous flux.
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Motor Drive Analyzer, 1 GHz, 8 Ch, 12 bits, 10 GS/s, 50 Mpts/Ch
MDA 8108HD
Static power analysis - like a dedicated power analyzer.Dynamic power analysis – capture more information.Complete test coverage – control system, power section, motor.Comprehensive mechanical interface.Harmonics calculation option.Vector display option (THREEPHASEVECTOR).Waveform Transformations option (THREEPHASEdq0).16 Channels with OscilloSYNC™.
