Component Test
A combination of two or more interrelated equipment (sets) arranged in a functional package to perform testing of particular components. (atis.org)
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Countermeasures Sequential Timing & Amplitude Tester
C-STAT
C-STAT, or Countermeasures Sequential Timing and Amplitude Tester, is a Firing Pulse Interval Test Set, a suite of test components designed to analyze firing pulse timing and amplitudes from a CMDS system such as ALE-47.
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Automated XY Stage
AT2
The Instron AT2 is a compact automated XY stage that streamlines compression, tensile, and flexural testing for both batches of specimens and single components with multiple test points. Designed for seamless integration with 6800 Series universal testing systems, the AT2 features standard bolt patterns for custom fixturing and accommodates a wide range of specimen geometries. Fully integrated with Bluehill® Universal software, it enables operators to quickly define and execute test sequences using grid, diamond, or custom layouts—boosting throughput, consistency, and testing efficiency.
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C and C++ Testing, Static Analysis, Code Review
C++test
Parasoft C++test is a complete C/C++ developer's quality suite for static code analysis, code review, automated unit and component testing, coverage analysis, and regression testing ? on the desktop under leading IDEs and in batch processes. Available for common enterprise and embedded environments.
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Engine Test Systems
Today''s engines and components require testing in a repeatable manner over a wide variety of conditions, ensuring that the final manufactured product consistently meets customer demands for performance and durability. The need for engines to be both economical and - above all - environmentally friendly, places fresh challenges on developers.
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8 Series Sampling Oscilloscope
The 8 Series Sampling Oscilloscope enables efficient and affordable optical component testing with an innovative disaggregated architecture. With a reconfigurable and compact design, an innovative user interface, and reliable high-end performance, this oscilloscope is an ideal test solution for manufacturing applications. The 8 Series is designed to adapt to a continuous increase in demand for higher bandwidths and baud rates addressing current and future test parameters.
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MPI Fully Automatic Probe Systems
MPI Advanced Semiconductor Test
Addressing the RF and High Power communication devices and discrete passive components production test market requirements, MPI introduced the TS2500 200 mm fully automatic probe system series. The system is based on industry leading production equipment from the Photonics Automation Division and incorporates decades of experience in RF and High Power measurement techniques from the MPI’s Advanced Semiconductor Test (AST) Division in combination with other AST products such as RF Probes, related calibration technology, and High Power accessories.
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IPX5 IPX6 Water Spray Test Device
CX-IPX56B
Shenzhen Chuangxin Instruments Co., Ltd.
Drop rain rain chamber Uses: This equipment is main to test the physical and other related properties of the products in the environment of simulated rain, such as electronic and electrical products, lamps, electrical cabinets, electrical components, automobiles, motorcycles and their parts and components. After the test, through the test result to determine
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Test Bench Automation & Control Software
itk.TACware
Automation software for the effective, time efficient and user friendly operation of component test benches. The structure and implementation of the software is specifi cally optimized for highly dynamic test benches with high demands on control quality. Inparticular, itk.TACware provides a solution for test benches of medium degree of complexity (e.g. steering test benches and suspension strut test benches), that meets all current requirements for test bench automation.
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Component Testers
After a wafer is tested through front-end test and back-end test, the component tester tests this final component or package assuring its quality for the semiconductor makers. DDR, DDR2, DDR3 memory component testers.
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Burn-In Board Tester
Focus-275
Focus275 is a tester for burn-in board.It can improve reliability of burn-in board by inspecting boards for burn-in test by Focus275 regularlyBoth short open test and component test can be done by sending electric signals for special socket contactor and edge part.
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Modular Components & Test Sets
Kratos Defense & Security Solutions, Inc.
Kratos offers a full suite of Flight Termination System modular components and test sets. Modular components can be used individually for system verification, testing, troubleshooting, and low power flight termination requirements or can be combined with other components to form complete turnkey flight termination systems.
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VNA Calibration Kits
Vector Network Analyzers are commonly used to accurately determine the RF Characteristics of microwave components. Accurate Testing of microwave circuits means eliminating measurement errors and ensuring repeatable results. This is only possible when the network analyzers can be calibrated with known and true calibration standards.
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Collins Radar Fixture with Gyro Simulator
TA-3A/B
This weather radar test fixture is a combination of the established WXT-250 series fixture and the RDR-2000 and RDR-2100 radars so that a single panel will provide many features that are still required today. The gyro simulator built into the panel is usable for either radar being tested and eliminate's plugging in any external simulator. The features for both product lines as shown in their respecting CMM's are provided on the panel so that full testing and alignment of these radars and their system components can be tested and/or evaluated. If you require any changes or other product versions please give us a call.
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Ballistics Testing
Dayton T. Brown, Inc.’s 100 m indoor shooting range is here to support your weapons, ammunition, and component testing needs – in accordance with ANSI/SAAMI specifications. Our range provides real-time environmental testing for small and medium caliber weapons.
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Insertion Loss Test Set
OptiConcepts FiberWarrior Pro™ Insertion Loss Test Set is used for the following functions: continuity check, fiber loss, return loss, and connector loss for OEM, lab, and production use as well as transport, metro, access, and FTTx/PON networks. The FiberWarrior Insertion Loss Test Set performs single-mode and multimode loss measurement functions, including single component and multi-fiber testing.
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Electronic Component Testing Services
New Jersey Micro Electronic Testing, Inc.
NJMET is proud to provide procurement and testing services to the commercial, military, aerospace, industrial automotive and medical industries. We also provide custom engineering consultation services. NJMET Inc. is AS9100/ISO9001:2008 certified and has recently successfully completed of The Defense Logistic Agency’s (DLA) laboratory suitability assessment and is qualified to test federal stock classes (FSC) 5961 (Semiconductor Devices) and FSC 5962 (Microcircuits) to DLA’s QTSL test requirements.
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Multi-Meter
Talon-Curve
A portable instrument that enables you to troubleshoot electronic equipment in a powered down state. Simply place the leads across a component and the meter will display a graph allowing you to identify the type and range of each component tested. A helpful capture feature allows you to quickly compare the current component in test to a like component that was previously tested.
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Testing of Voltage Measuring Transformers
In this category you will find components for high-voltage testing as well as for testing electronic or conventional voltage measuring transformers.
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Memory Module Testers
The module tester tests the modules in which the final tested components are assembled together. This test is also one of the most important factors to guarantee the quality of the products. DDR, DDR2, DDR3, FBDIMM,
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Dual Channel Bit Synchronizer for Rates up to 45 Mbps
LS-45-DB
The Lumistar LS-45-DB Dual Channel Bit Synchronizer Daughterboard provides optimal reconstruction of a serial PCM data stream that has been corrupted by noise, phase jitter, amplitude modulation, or base line variations. The all-digitaldesign assures a high performance, consistent product, with excellent reliability and long-term stability. Dual channel design can feed each channel of the LS-55-DD dual decom. The LS-45-DB also has a post D combiner that allows for optimal ratiocombining of the two input signals A unique Built-in-Test feature allows performance verification for the Bit Synchronizer to ensure the highest level of operation. Auto-test BIT is performed for a short duration on the application of power and tests more than 90% of the Bit Synchronizer components. This test verifies that power is properly applied, verifies that there are no internal bit errors, and performs other tests to ensure that the bit synchronizer is fully operational with status indication of results. Command-test BIT performs the same functions and can be initiated by the user at any time through the Lumistar software when used on Lumistar PC products. The user has the ability to generate internal pseudo-random patterns and calculate internal bit error rates with or without the injection of forced errors.Various status indicators are also available through the software. The Bit Synchronizer also contains a BER reader as well as frame sync pattern indicator.
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Rebuilt Testers
Lorlin® manufacturers New and Rebuilt Discrete Component Semiconductor Test Systems for Transistors, Diodes, Zeners, Fets, IGBTs, SCRs, Triacs, Optos, Small Signal and Power Semiconductors. We measure, screen, test, analyze, characterize and sort the critical parameters of semiconductors devices including Leakage Current, Breakdown Voltage, Gain, Saturation Voltages, and offer a comprehensive test parameter library with an easy to use Windows based applications software. The systems us a Windows 10® 64-BIT Operating System with a USB 2.0 Interface. Engineering excellence, innovation, creativity and cutting edge technology has made Lorlin equipment well known for testing discrete components.
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Fuel/Other Analyzers
Our products are used to test fuel in a couple of ways. Fuel blending is the process of ensuring a fuel has the desired composition in terms of relative concentration of components. Testing fuel for contamination ensures that the equipment that burns the fuel will not suffer damage from impurities in the fuel.
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Tunable Laser Source Module
Keysight's has a wide range of tunable laser sources to fit your needs for various applications. In addition to the proven 81600B tunable laser source family, Keysight recently introduced a new family of tunable laser sources - the 8160xx family. The 8160xx tunable laser sources offer the full wavelength range from 1260 nm to 1650 nm with no wavelength gaps. All 8160xx tunable laser sources are modules for the Keysight 8164B lightwave measurement system mainframe. This provides test instrumentation with maximum flexibility. Investing in the Keysight 8160xx family of tunable laser sources can realize the cost efficiency and performance required to test components for coarse and dense wavelength division multiplexing (CWDM, DWDM) and passive optical networks (PON).
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Java Testing, Static Analysis, Code Review
Jtest
Parasoft Jtest is a complete Java developer's quality suite for static code analysis, code review, automated unit and component testing, coverage analysis, and regression testing ? on the desktop under leading IDEs and in batch processes.
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Vibration Testing
Automobiles, electronics, heavy equipment, home appliances and more…consumers want dependability and manufacturers need to deliver quality. The need to comprehensively test components and systems for shock and vibration resistance can often be the key to long-term product success. Trialon’s experienced team will be your partner to provide complete satisfaction throughout the product validation process.
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PXIe-4113, 2-Channel, 10 V, 6 A PXI Programmable Power Supply
782857-02
The PXIe‑4113 is a programmable DC power supply with isolated outputs. It helps simplify the task of designing automated test systems for a wide range of applications—from aerospace and defense to automotive and component test—by eliminating the need to mix multiple instrumentation form factors in a given test rack. It also has standard output disconnect functionality that allows isolation from the device under test (DUT) when not in use, and remote sense to correct for losses in system wiring.
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Precision LCR Meter
TH2817A
Changzhou Tonghui Electronic Co., Ltd.
TH2817A is a new precision LCR meter combined with years of technical experience and newest measurement technology of instrument industry. With powerful measurement functions, high performance and low cost, TH2817A has been one of the world advanced instruments, and it provides users a super value measurement resolution and experience. The meter offers stable 6 digit resolution, wide frequency range (50Hz to 100kHz for TH2817A ), programmable signal level (0.01V to 2.0V), up to 30 meas/sec measurement rate, 9 measurement ranges, 30Ω or 100Ω constant output impedance and friendly operation interface. TH2817A can be used for incoming inspection of components, quality control of product line and high accuracy laboratory use. The HANDLER, GPIB, RS232C interfaces make it easy to build an automatic component test system,
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TestBench & Planar Biaxial Test Instruments
TestBench configurations were designed with component testing in mind, and thanks to their modular approach, a wide array of configurations and performance capabilities are possible. TestBench systems can be multi-channel and multi-axis, including planar biaxial testing.
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Extremely Accelerated Stress Test Chambers
The extremely accelerated stress environment is defined by high temperature, high humidity and high pressure. WEIBER provides humidity resistance evaluation test for electronics components through customized Extremely Accelerated Stress Test Chamber. This chamber provides high performance test in minimal amount of time according to international IEC 60068-2-66 standard. This chamber also known as Accelerated Stress Test Chamber, Halt and Hass Test Chamber, Halt Test Chamber and Hass Test Chamber.This chamber reduces the time taken for humidity testing in electronic components. 2 types of tests saturated and unsaturated extremely accelerated stress test can be performed. In saturated test the temperature is maintained at 1210C at 100%RH, and for unsaturated temperature of 110, 120, 1300C is maintained at 85%RH. Normally for electronic components unsaturated type test is done.
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Magnetic-Inductive Testing
MAGNATEST® Product Family
Foerster Instruments, Incorporated
The MAGNATEST product family is used for the non-destructive testing of metallic materials for magnetic and/or electrical properties. The test instruments are used in the automotive and aviation sectors as well as in the production of semi-finished products. The focus is on testing components relevant to safety such as brake discs, or ball pins and functional components such as camshafts and drive shafts, pivots and piston pins. Typical test tasks include hardness checks, material differentiation and sorting. MAGNATEST can also be used for the automatic testing for the geometric properties of all metallic series components. The high-performance amplifier installed in MAGNATEST test instruments makes it possible to analyze harmonics, which guarantees an extremely reliable and precise repetition, even when impacted by perturbations.
