Showing results: 1621 - 1632 of 1632 items found.
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785971-01 -
NI
PXIe, 18-Slot (5 Hybrid Slots, 11 PXI Express Slots, 1 PXI Express System Timing Slot), Up to 24 GB/s PXI Chassis - The PXIe-1095 features a high-bandwidth backplane and up to 82 W of power and cooling in every slot to meet a wide range of high-performance test and measurement application needs. The chassis incorporates two hot-swappable power supplies to improve the mean time to repair (MTTR) of the PXI system; it also offers a Timing and Synchronization option that includes a built-in oven-controlled crystal oscillator (OCXO) for increased clock accuracy and external clock and trigger routing. It accepts PXI Express modules in every slot and supports standard PXI hybrid-compatible modules in up to five slots.
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782856-02 -
NI
PXIe, ±60 V, ±3 A DC, ±10 A Pulsed, 20 W DC, 100 fA Precision System PXI Source Measure Unit - The PXIe-4139 is a high-precision, system source measure unit (SMU) that features 4-quadrant operation and sources up to 20 W of DC power. This module features analog-to-digital … converters that help you perform high-precision measurements with a current resolution of 100 fA or high-speed acquisitions up to 1.8 MS/s. The module can maximize stability and measurement accuracy with SourceAdapt technology, which you can use to tune the transient response to match the characteristics of any load. You can use the PXIe-4139 for applications including manufacturing test, board-level test, and lab characterization with devices such as ICs, power management ICs (PMICs), and RFICs and discrete devices including LEDs and optical transceivers.
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782856-03 -
NI
PXIe, ±60 V, ±3 A DC, ±10 A Pulsed, 40 W DC, 100 fA Precision System PXI Source Measure Unit - The PXIe-4139 is a high-precision, system source measure unit (SMU) that features 4-quadrant operation and sources up to 40 W of DC power. This module features analog-to-digital converters that help you perform high-precision measurements with a current resolution of 100 fA or high-speed acquisitions up to 1.8 MS/s. The module can maximize stability and measurement accuracy with SourceAdapt technology, which you can use to tune the transient response to match the characteristics of any load. You can use the PXIe-4139 for applications including manufacturing test, board-level test, and lab characterization with devices such as ICs, power management ICs (PMICs), and RFICs and discrete devices including LEDs and optical transceivers.
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786671-01 -
NI
PXIe, Kintex-7 160T FPGA, 16-Channel AI, 1 MS/s, PXI Multifunction Reconfigurable I/O Module - The PXIe-7861 features a user-programmable FPGA for high-performance onboard processing and direct control over I/O signals for complete flexibility of timing and synchronization. With 16 analog input channels connected directly to a Kintex-7 160T FPGA, you have ample space to design applications that require precise timing such as hardware-in-the-loop testing, custom protocol communication, sensor simulation, and high-speed control. The PXIe-7861 features a dedicated A/D converter (ADC) per channel for independent timing and triggering. This design offers multirate sampling and individual channel triggering, which are outside the capabilities of typical data acquisition hardware. The PXIe-7861 also includes peer-to-peer streaming for direct data transfer to other PXI Express modules.
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786672-01 -
NI
PXIe, Kintex-7 325T FPGA, 16-Channel AI, 1 MS/s, PXI Multifunction Reconfigurable I/O Module - The PXIe-7862 features a user-programmable FPGA for high-performance onboard processing and direct control over I/O signals for complete flexibility of timing and synchronization. With 16 analog input channels connected directly to a Kintex-7 325T FPGA, you have ample space to design applications that require precise timing such as hardware-in-the-loop testing, custom protocol communication, sensor simulation, and high-speed control. The PXIe-7862 features a dedicated A/D converter (ADC) per channel for independent timing and triggering. This design offers multirate sampling and individual channel triggering, which are outside the capabilities of typical data acquisition hardware. The PXIe-7862 also includes peer-to-peer streaming for direct data transfer to other PXI Express modules.
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784781-01 -
NI
PXIe, 10-Slot (7 Hybrid Slots, 1 PXI Express System Timing Slot, 1 Peripheral Expansion Slot), Up to 24 GB/s PXI Chassis - The PXIe-1092 features a high-bandwidth backplane and up to 82 W of power and cooling in every slot to meet a wide range of high-performance test and … measurement application requirements. The all-hybrid backplane enables excellent flexibility for instrumentation module placement by accepting PXI Express modules in every slot and PXI hybrid-compatible modules in up to seven slots. It also offers a Timing and Synchronization option that includes a built-in oven-controlled crystal oscillator (OCXO) for increased clock accuracy and external clock and trigger routing. The chassis includes a peripheral expansion slot in Slot 10 to provide power only for multiple-slot wide modules.
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786991-01 -
NI
PXIe, 10-Slot (7 Hybrid Slots, 1 PXI Express System Timing Slot, 1 Peripheral Expansion Slot), Up to 24 GB/s PXI Chassis - The PXIe-1092 features a high-bandwidth backplane and up to 82 W of power and cooling in every slot to meet a wide range of high-performance test and measurement application requirements. The all-hybrid backplane enables excellent flexibility for instrumentation module placement by accepting PXI Express modules in every slot and PXI hybrid-compatible modules in up to seven slots. It also offers a Timing and Synchronization option that includes a built-in oven-controlled crystal oscillator (OCXO) for increased clock accuracy and external clock and trigger routing. The chassis includes a peripheral expansion slot in Slot 10 to provide power only for multiple-slot wide modules.
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786853-01 -
NI
44 GHz, 1 GHz Bandwidth PXI Vector Signal Transceiver - The PXIe-5831 supports validation and production test into mmWave frequency bands. The PXIe-5831 incorporates a vector signal generator, vector signal analyzer, and high-speed serial interface with FPGA-based real-time signal processing and control. The PXIe‑5831 combines fast measurement speed and the small form factor of a production test box with the flexibility and high performance of R&D-grade box instruments, making it an ideal solution in both the lab and the production floor. The PXIe-5831 meets the stringent challenges of 5G New Radio, but it is also able to test a variety of cellular and wireless standards such as Wi-Fi 6. In addition, you can easily expand a test system in the PXI Express form factor to support multiple input, multiple output (MIMO) configurations with phase-coherent synchronization.
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786856-01 -
NI
44 GHz, 1 GHz Bandwidth PXI Vector Signal Transceiver - The PXIe-5831 supports validation and production test into mmWave frequency bands. The PXIe-5831 incorporates a vector signal generator, vector signal analyzer, and high-speed serial interface with FPGA-based real-time signal processing and control. The PXIe‑5831 combines fast measurement speed and the small form factor of a production test box with the flexibility and high performance of R&D-grade box instruments, making it an ideal solution in both the lab and the production floor. The PXIe-5831 meets the stringent challenges of 5G New Radio, but it is also able to test a variety of cellular and wireless standards such as Wi-Fi 6. In addition, you can easily expand a test system in the PXI Express form factor to support multiple input, multiple output (MIMO) configurations with phase-coherent synchronization.
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783761-01 -
NI
PXIe, ±200 V, ±1 A DC, ±3 A Pulsed, Up to 40 W DC, 100 fA Precision System PXI Source Measure Unit - The PXIe-4137 is a high-precision, system source measure unit (SMU). It features 4-quadrant operation and sources up to 40 W of DC power and can pulse up to 500 W. Analog-to-digital converter technology helps you perform high-precision measurements with a current resolution of 100 fA or high-speed acquisitions up to 1.8 MS/s. The module also can maximize stability and measurement accuracy with SourceAdapt technology, which you can use to tune the transient response to match the characteristics of any load. The PXIe-4137 is ideal for a broad range of applications including manufacturing test, board-level test, and lab characterization with devices such as ICs, power management ICs (PMICs), and RFICs and discrete devices including LEDs and optical transceivers.
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783762-01 -
NI
PXIe, ±200 V, ±1 A DC, ±3 A Pulsed, Up to 40 W DC, 10 fA Precision System PXI Source Measure Unit - The PXIe-4135 is a high-precision, system source measure unit (SMU). It features 4-quadrant operation and sources up to 40 W of DC power and can pulse up to 500 W. Analog-to-digital converter technology and native triaxial connectors help you perform high-precision measurements with a current resolution of 10 fA or high-speed acquisitions up to 1.8 MS/s. The module also can maximize stability and measurement accuracy with SourceAdapt technology, which you can use to tune the transient response to match the characteristics of any load. The PXIe-4135 is ideal for a broad range of applications including manufacturing test, board-level test, and lab characterization with devices such as ICs, power management ICs (PMICs), and RFICs and discrete devices including LEDs and optical transceivers.
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783761-02 -
NI
PXIe, ±200 V, ±1 A DC, ±3 A Pulsed, Up to 40 W DC, 100 fA Precision System PXI Source Measure Unit - The PXIe-4137 is a high-precision, system source measure unit (SMU). It features 4-quadrant operation and sources up to 40 W of DC power and can pulse up to 500 W. Analog-to-digital converter technology helps you perform high-precision measurements with a current resolution of 100 fA or high-speed acquisitions up to 1.8 MS/s. The module also can maximize stability and measurement accuracy with SourceAdapt technology, which you can use to tune the transient response to match the characteristics of any load. The PXIe-4137 is ideal for a broad range of applications including manufacturing test, board-level test, and lab characterization with devices such as ICs, power management ICs (PMICs), and RFICs and discrete devices including LEDs and optical transceivers
