Test Systems
group of interoperable devices whose integration perform a common test purpose.
See Also: Systems, Equipment, System Integrators, System Test, System Integration
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TO-CAN Package Inspection System
7925
Chroma 7925 is an automatic inspection system for TO-CAN package. The appearance defects over 30 um like lens scratch, partial are clearly conspicuous by using advanced illumination technology. Because the height variation of tray and package exists, Chroma 7925 can calculate the focus distance and compensate to overcome the variation with auto focus function.
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Fuel Cell Test Accessories
Scribner extends its groundbreaking line of tabletop fuel cell testing equipment with the 885 Fuel Cell Potentiostat.
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Industrial CT X-Ray Inspection System
X5000
The X5000 is the most versatile system offered by North Star Imaging. The system boasts a large scanning envelope and excellent ergonomics for loading sizable objects while still maintaining the sensitivity to inspect even the smallest of items.
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3R Rated UPS Systems – 1kVA to 6kVA with SSG & SSG-RP UPS
Outdoor NEMA
*Ready-to-install, Falcon’s SSG and SSG-RP pre-configured NEMA 3R-rated UPS systems provide the ideal solution for outdoor and indoor use. The UPS enclosures are available in various sizes.*-20°C to 55°C (SSG) and -30°C to 65°C (SSG-RP) temperature range. The SSG UPS is agency-certified (UL, cUL, CE) to operate reliably in demanding environments. All 120V UPS models are also UL 508 listed.*High-reliability: true on-line, industrial UPS. Tested and designed with robust components and materials, t...show more -
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Flying Probe Systems
Smaller production series and fast prototyping requirements combined with zero fixturing costs are factors driving the development of Flying Probe testers. Today, Flying Probe Technology has matured and Columbia can supply single- or double-sided flying probe testers to be used on both loaded and bare PCBs.
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Memory Test System
T5511
Offering Multi-functionality and Industry's Top Test Speed of 8Gbps.
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Test Handler
M6242
Optimal Test Handler for Mass-Production DRAM, with Double the Throughput.
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Test & Evaluation
Scientific Research Corp. STI Division
Test & Evaluation has been a core capability since the company was founded. Our efforts in T&E span from test range capabilities development to test execution and data analysis, with emphasis on joint service capabilities.
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SMD Tweezer Capacitance Resistance Diode Tweezers Test Pen Multimeter SMD Meter
VA50372
Shanghai Yi Hua V&A Instrument Co., Ltd. CO.,LTD
SMD tweezer Capacitance Resistance Diode Tweezers Test Pen Multimeter SMD Meter VA503 SMD Components Identifier
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Controls Systems for Engine Control and Combustion Analysis
NI Powertrain
NI Powertrain Controls systems incorporate the LabVIEW reconfigurable I/O (RIO) architecture to create some of the world’s most flexible and capable combustion analysis and engine control systems. The engine control systems can drive both solenoid and piezoelectric direct injectors, control timing events with 25 ns of precision, and implement novel engine control strategies such as next- and same-cycle control. The combustion analysis systems are available in both portable and higher performance stationary form factors.
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Probe And Test Adaptors Set (13PCS)
3601B
Peaceful Thriving Enterprise Co Ltd
1. Extra thin test probe.2. Flexible silicone cable.3. For use in conjunction with test probe.4. Bi-color test leads for polarity indication.5. High quality testing and test accessories.
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W-CDMA/HSPA+ Analysis Using NI PXI RF Test Instruments
RFmx W-CDMA/HSPA+
The NI-RFmx W-CDMA personality is a highly optimized API for performing physical layer measurements on W-CDMA cellular standard signals. NI-RFmx W-CDMA is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development efforts.
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Fanless Embedded System With LGA1151 Socket 7th/6th Gen Intel® Core™ I7/i5/i3 & Celeron® Processor, Intel® Q170, HDMI, DVI-D, VGA, 8-CH PoE, 6 USB And 24 VDC
eBOX671-517-FL
The eBOX671-517-FL supports 8-port Gigabit PoE and able to work under harsh temperatures. Its eight Gigabit PoE ports allow multiple cabling to cameras and any PoE power device; and, the eBOX671-517-FL is specifically designed for security surveillance, optical inspection, and edge computing applications. This rugged NVR embedded box PC is powered by the 7th/6th generation Intel® Core™ (Kaby Lake/Skylake) or Intel® Celeron® processors with a 35W/65W TDP and comes with Intel® Q170 chips...show more -
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Low Voltage Test & Measurement
Low voltage testing is able to catch errors such as shorts and opens by applying current to a wire and measuring the voltage. The wire will have a current affected by several factors including resistance and components. If the wire is connected correctly, the test will read low resistance. That means current is flowing through the wire as expected and reaching the required connections. If the tester reads high resistance it means something is impeding the current from reaching its destination. This could be caused by a number of causes.
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ESI(Electronics Systems Integration Unit)
MS 2004
The ESI subsystem provides platform interfaces like Gyro and on board Radar Blanking. This unit receives Analog and Digital GYRO inputs from ship and pre- trigger pulses from on board radars of the ship. This unit measures and provides the ship heading data to VARUNA ESM system. It also provides Heading, Roll and Pitch data to the ECM system. This unit also generates band wise composite ESM Rx. Blanking gates and provides all the required interfaces to ESM receiver, ECM System and System Controller units.
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Tri-Temp Test Handler
SIA-118 Series
Whether you are testing at room, cold or hot temperatures, our tri-temp test handlers are suited for a wide range of applications, from the basic to the most stringent and demanding test requirements. The SIA-118 series offers an open platform for packages from 3 x 3 mm up to 100 x 50 mm at a temperature range from -55 °C to +125 °C and optional full temperature range from -60 °C to +175 °C. Offering easy and flexible configuration, this tri-temperature handler supports both Kelvin and PTB conta...show more -
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Test Development
Best Electronics and Components Co., Inc.
USEA is involved at all levels of test development, including the necessary test board design and layout, software development, socket design and build, etc. We work on programs at all stages of the product development timeline and through to manufacturing.
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System to Handle Wafer Levels
AMI AW Series
Operator-Free Wafer Inspection, Analysis and Sorting The AW Series are advanced high-capacity, high throughput automated wafer C-SAM® instruments specialized to deliver maximum sensitivity for the evaluation of wafer and device level applications.
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Test Package
Shenzhen Bonad Instrument Co., Ltd.
We can provide a variety of different specifications of freezing load test packages, including AHAMHRF-1 2007/ SASO 2664-2007 Sawdust freezing test package, AS1731.4-2003 Australian frozen Load Test Package, AS72-2005 North American Commercial Refrigeration Load Simulation Test Package, IEC 62552 Test Package for Freezing Load Testing in Refrigerators. In addition, we can also provide customization according to test requirements. For more information, please contact us, BONAD will provide you with professional technical advice and high-quality testing equipment.
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Multimedia HDMI Test Instrument
881E/882E
The Teledyne LeCroy quantumdata 881E/882E-HDMI Video Generator model is packed with features for video and audio testing of HDMI 1.4a sink devices. The HDMI transmitter provides 12-bit/component deep color and HDMI 3D testing features. An analog option with 250 MHz analog output and composite analog for NTSC and PAL testing is available as well with the HDMI transmitter only configuration.
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Advanced Power System - Dynamic DC Power Supply, 40 V, 50 A, 2000 W
N7972A
The N7900 Series dynamic DC power supplies are designed for automated test equipment (ATE) applications where high-speed dynamic sourcing and measurement is needed.
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Digital Matrix Intercom System
Gemini
A system that interfaces with existing communication assets such as SIP telephones.A way to reduce costs for linking remote sites by using standard IP infrastructure.An intercom system that operates over LAN or WAN or Internet.Works on any terrestrial or satellite-based network.Virtual and hardware operator panels to configure and manage each unit.Private one-to-one, group and conference calls with the ability to manage simple to complex conference and private conversations simply and quickly.In...show more -
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Test Port Adapter Set, 2.4 Mm To 2.4 Mm
85130G
The Keysight 85130G test port adapter protects the test set port from connecting directly with the device under test. It has a special rugged female connector that connects to the network analyzer test port. This special connector does not mate with a standard male connector but converts the rugged test set port to a connection that will mate with the device under test. This set contains a NMD-2.4 mm (f) to NMD-2.4 mm (m) adapter and a NMD-2.4 mm (f) to PSC-2.4 mm (f) adapter. The frequency range for these adapters is dc to 50 GHz with a return loss of 23 dB or better.
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Next Generation Subsea Inertial Navigation Systems
TOGSINS
The new TOGSINS builds on core TSS fibre optic gyro technology by incorporating inertial navigation (INS) capability. As with TOGS, it is available in three standard heading accuracy variants: 0.1° (TOGSINS1), 0.3° (TOGSINS3) and 0.5° (TOGSINS5), all rated for operational depths to 4,000m or 6,000m giving you a range for all your needs.Inertial position data is produced using an INS algorithm, within the firmware framework of TOGS, whilst attitude data is delivered via accurate roll/pitch measurement of 0.01° (TOGSINS1) and 0.05° (TOGSINS3 and TOGSINS5), and a heave performance of 5cm or 5%.
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In-Line X-ray Inspection System for Secondary battery
X-eye 9000 Series
X-ray Tube100 kV / 200 µAMin. Resolution5 µmInspection Ability120ppm , 150ppm, 180ppmSystemConveyor / Index / Pick&Place 방식 LoadingDimension1,800(W) x 1,560(D) x 2,070(H)mm / 5,000kg
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Cleanliness Inspection System / Microscope
CIX90
The OLYMPUS CIX90 technical cleanliness inspection system is a dedicated, turnkey solution for manufacturers who maintain high quality standards for the cleanliness of manufactured components. The OLYMPUS CIX90 system makes it easy to quickly acquire, process, and document technical cleanliness inspection data to comply with international standards. The system is intuitively designed to guide users through each step of the process so that even novice inspectors can acquire important cleanliness data quickly and easily.
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Walk-In Solar Panel Test Chamber
For testing various size Walk in Solar Panel Test Chamber WIEBER designs and manufactures Walk in Solar Photovoltaic Testing Chamber. The test are to be performed according to various standards of ASTM, IEC, UC etc. Solar panels need to pass environmental tests as per IEC and other standards requirements to prove their long term performance and resistance to temperature and humidity extremes.
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ARINC-708/453 2-Channel Test & Simulation Module for the Weather Radar Display Databus
M8K708
The M8K708 module is an ARINC-708 / 453 2-channel test and simulation module for the Weather Radar Display Databus. The M8K708 supports two ARINC-708 / 453 channels, each selectable as transmit or receive. Each channel implements an 64K×16 FIFO and supports polling and/or interrupt driven operation.The M8K708 comes complete with Windows software, a C-driver software library including source code and may be used with Exalt, Excalibur’s Analysis and Laboratory Tools, a Windows monitoring application. In addition, Excalibur produces adapter cables that convert the carrier board I/O Molex™ connector to two twinax CJ70-49 connectors. The cable may be purchased at an additional cost.
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Development Test Stands for Electric Motors
Development test stands from imc are characterized by high flexibility in electric motor trials. A comprehensive variety of motor types can be tested and a complete range of tests carried out. The mechanical configuration consists of a test bed with a load machine and a torque measuring shaft. The load machine and torque sensor shaft are mounted on a linear guide and precisely aligned axially by means of laser. It can be moved towards the test object on ball bearings, as a complete unit. Especially time-saving: no need to realign the load machine assembly when changing the torque sensor.
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Test Solutions
Making test solutions are still by far the largest division of our company with an activity level of around 65% of our turnover, and with long term relationship to customers like Danfoss, Bang & Olufsen, Siemens, Grundfoss, Vestas and many more, it is still today the very foundation, on which our entire company is based.Our concept is based on high level software development, that is combined with electronical and mechanical engineering, thus controlling all the processes involved to create the most suitable test solution for our customers.
