Nanometer
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Nanometer Measurement
The Nano-Gauge™ is an ultra high precision, single axis, displacement measuring instrument capable of resolving dimensions down to 1.5 nanometers (0.06 microinches) over a full scale range of 25mm (1 inch). Combining ease-of-use and small physical size, the Nano-Gauge™ can be quickly adapted to a wide variety of precision measurement situations without lengthy or complex setup procedures.
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Capacitance Sensor Systems
MTI Instruments offers high resolution capacitance sensors, probes and systems that generate low noise, highly accurate and high stable measurements. Our Capacitance sensor line-up offers accurate measurements for automated inspection applications such as thread quality inspection, disk drive run-out, leveling or flatness measurement, lens alignment, tire run-out and bulging. Our Accumeasure capacitive sensors offer large stand-off distance that includes single and multiple channel rack systems that connect up to 10 capacitive sensors or capacitance probes with individual analog measurement outputs. We also offer cost-effective customized capacitive sensor amplifier board and probe system for easy integration. Our inspection systems linearity exceeds 0.01% full scale measurement (FSM) and resolution to sub nanometers.
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Spectroscopic Platform
Allalin
The Allalin is a nanometer resolution spectroscopy instrument, based on a disruptive technology known as quantitative cathodoluminescence that integrates a light microscope and a scanning electron microscope (SEM) into one tool.
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Layer Release Systems
EVG's IR LayerRelease Technology is a fully front-end-compatible layer release technology that features an infrared (IR) laser that can pass through silicon, which is transparent to the IR laser wavelength. Coupled with the use of specially formulated inorganic layers, this technology enables an IR laser-initiated release of any ultra-thin film or layer from silicon carriers with nanometer precision.
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3D Form Measurement
Ensure that components function and can be fitted correctly with efficient form monitoring. ISRA’s 3D form measurement systems capture component geometries down to the nanometer level while ensuring the shortest cycle times.
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Photon Counting PMT Detection System
For spectroscopy and microscopy experiments in the UV/Vis/NIR region of the spectrum, a photomultiplier tube (PMT) is the ideal detector for quantitative low light level measurements. A PMT is extremely sensitive, with very wide dynamic range so it can also measure high levels of light. PMT’s are also very fast so rapid changes in optical signals can be reliably monitored. As a practical matter, PMTs are durable, long-lived, and economical.HORIBA provides a simple, self contained PMT housing that operates in either analog or photon counting modes with the flick of a switch. This ambient PMT housing is ideal for standard side-on PMTs that are used from 185 to 900 nanometers. It has a very low dark count for a non-cooled PMT housing providing a dark count of only ~ 50 to 500 counts per second (cps) depending on the PMT selected.
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Deep Ultraviolet Spectrophotometer System
VUVAS-10X
A new ultraviolet spectrophotometer system for optical metrology just arrived at NASA Goddard! The VUVAS-10X spectrophotometer works best in the 90 to 160 nanometer wavelength range, also known as deep or vacuum ultraviolet (VUV) region. It uses a windowless hydrogen plasma light source and differential pump section to reach many wavelengths beyond those of conventional deuterium lamps. The source also works with other gases, or gas mixtures, for atomic spectral line emission from about 30 nanometers (double ionized Helium gas) up to the Visible light range. The new spectrophotometer system, McPherson VUVAS-10X, uses a one-meter focal length high-resolution monochromator with the special light source, scintillated detector and Model 121 goniometric sample chamber. The system is ideal for optical transmission, absorbance and specular reflectance at incident angles up to 60 degrees. This McPherson spectrophotometer system will help develop, inspect and qualify optical materials and coatings used for very high altitude and extraterrestrial space flight missions.
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Chromatic Dispersion Emulator
CS-CDE
The ClearSpectrum™-CDE is a chromatic dispersion emulator suited for test and measurement. This 1U half 19-inch rack-mountable module is designed to emulate tens of thousands of picoseconds per nanometer in a compact unit while maintaining very low insertion loss. It is a passive, ready-to-use emulator which can be cascaded several times to achieve higher levels of dispersion.
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Nanopositioning Stage & Controller
PInano
Physik Instrumente GmbH & Co. KG
PInano® XY and XYZ low-profile piezo scanning stages are optimized for easy integration into high-resolution microscopes. They feature a very low profile of 20 mm (0.8") and a large aperture designed to hold Petri dishes and standard slide holders. The long travel ranges of up to 200 x 200 x 200 µm with nanometer closed-loop resolution are ideal for leading-edge microscopy and imaging applications. PInano® series piezo positioning stages are available in two versions: A) Highest Stability, Linearity and Precision with capacitive feedback sensors. B) High Precision with lower cost piezoresistive sensor feedback. Both types provide very high sensitivity and responsiveness as well as nanometer resolution. A proprietary servo controller significantly improves the motion linearity of the piezoresitive version compared to conventional piezoresistive sensor controllers.
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Submicron Particle Imaging
FlowCam Nano
Yokogawa Fluid Imaging Technologies, Inc.
FlowCam Nano is the next-generation dynamic image analysis instrument for submicron particle imaging and sizing in real-time. FlowCam Nano extends subvisible particle analysis to detect objects between 300 nanometers and 2 micrometers - the smallest visible with light microscopy.
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High Resolution Wafer Thickness & Thickness Variation Gauge
MX 10x series
The MX10x series measure thickness and thickness variation on silicon wafers. It has a resolution of 10 nanometers and can be adapted to different thickness ranges within a few seconds.
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Surface Form Analysis System
Tropel® FlatMaster®
Tropel® FlatMaster® Surface Form Analysis System Fast and Precise Measurements of Ground, Lapped, Honed, Polished and Super-finished Components. The Tropel® FlatMaster® offers industry leading performance for surface form measurements to precision component manufacturers. Our non-contact optical technique analyzes the entire surface of the part in seconds, regardless of its size or complexity. The FlatMaster provides five nanometer resolution and a standard accuracy of 50 nm (2.0 μ). It rapidly and accurately measures flatness, line profile, radius and other surface parameters on a variety of materials and surface finishes.
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Laser Diode Source Product Family
LDS-7200
5 nanometers tuning range• 10 picometer setpoint accuracy• 0.1 picometer resolution• 20mW output power• 0.005 dB power stability• Built-in coherence control• Integrated function generator• USB remote interface• Application program with source code
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Direct Drive Motors And Motion Systems
HEIDENHAIN offers the largest direct drive motor range on the market via ETEL. Solutions range from high-end motion systems with nanometer precision to industrial applications requiring high torque. And like HEIDENHAIN, ETEL builds its linear and torque motors, along with motion systems, on a foundation of superior knowledge and technical expertise, disruptive technology and tireless quality control. Customers reap the benefit: the most cutting-edge, reliable and precise motion control solutions available.
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Spectrometer
LI-180
Plant growth and reproduction are driven by photosynthetically active radiation (PAR), defined as wavelengths between 400 and 700 nanometers. This interval is often separated into three distinct “color” bands for plant research. Modifying the intensity of red, blue, green wavelengths, along with additional near-UV (380-400 nm) and far-red (700-780 nm) bands, can influence a variety of plant characteristics, such as growth rate, chemical composition, and more.
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Surface Charge and Zeta Potential
Surface analysis is a vital method for qualifying new materials in technical and biological applications. Surface charge analysis empowers users to closely monitor the surface chemistry from small particles in the nanometer range up to large wafers. Gain insights into modifications resulting from surface treatment and surface interactions with natural environments under near-ambient conditions. Get a competitive edge in optimizing existing products and developing new ones using the Anton Paar instruments which offer zeta potential measurement for a wide range of applications.
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Surface Analysis
Shimadzu offers a range of instruments that are ideal for all sample forms handled by customers in the fields of steel, non-ferrous metals, environment, foods, chemicals, pharmaceuticals, semiconductors, ceramics, and polymers. EPMA/SEM offers analysis of targets from several centimeters to several microns; XPS offers analysis from several millimeters to several microns; and SPM permits observations from over a hundred microns to several nanometers.
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Detectors
Solar blind detector for operation in the 1 to 180 nanometer region. It is encased in a vacuum tight housing for vacuum operation. The Model 425 is ideal for measurements in the Extreme and Vacuum UV (EUV and VUV) where the solar blind feature eliminates potential interference from long wavelength ultraviolet and visible light. It may be operated in pulse-counting mode or DC. The CEM is also available with coatings like Cesium Iodide or Magnesium Fluoride to enhance response in different energy regions.
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Optical Tweezers
PicoTweezers
Single or dual beam optical tweezers system based on an inverted microscope • 3D real-time video-based force measurements with sub-pN resolution • Huge free space above optical trap for all kinds of sample chambers and carriers • Manipulate and navigate trapped objects with nanometer precision • Easily extendable to fluorescence, STED, Raman spectroscopy, TIRF, or CLS.
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Precise 3D Profilometry
µscan
Using the NanoFocus µscan technology, you can measure up to 100 times faster than with conventional probe systems. Various µscan sensors are available for the different application areas. The optical profilometers of the µscan series are suitable for the fast scanning of surface profiles with precision in the low nanometer range.
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High Voltage Insulation Tester Module
DP-cPCI-5586
DP-cPCI-5586 is a High Voltage Insulation Tester Module. This module facilitates single-board voltage source/measurement features with high voltage output and a nanometer. Occupying a single slot in standard cPCI rack, this module can be used for multiple point cable harness test systems with limited rack space. Applications of this board include automatic test equipment, checkout systems, force voltage measure current, and insulation test.
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CMAS Analyzers and Field Monitors
Backed by at least one of the 8 corrosion sensor patents wholly owned by Corr Instruments, our nanoCorr analyzers and field monitors are widely used for online and real-time localized and general corrosion monitoring. These ultra-high precision instruments measure extremely low currents in the pico-ampere levels, which can be translated into a corrosion rate as low as a few nanometers per year, in some applications (PDF). Our analyzers and monitors are based on the patented coupled multielectrode array sensor (CMAS) technology which measures the flow of electrons from corroding electrodes to one or more cathodes.
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40mA Multi-Channel Amplifier
For the precise nanometer movement of actuators and other piezo products, an amplifier is required. Multi-channel amplifiers allow you to control multiple actuators or piezo products with a single amplifier. The NV40/3 piezo amplifier was designed for controlling low voltage piezo elements. It includes a voltage amplifier, a display and a PC-interface. The high-resolution display shows the voltage of the actuator, along with the mode of operation and the temperature inside the amplifier.
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Instrumented Indentation Tester
With Anton Paar’s versatile indentation testers you can precisely determine the mechanical properties of thin films, coatings, or substrates such as hardness and elastic modulus. The instruments handle almost any type of material, whether soft, hard, brittle, or ductile. You can also conduct creep, fatigue, and stress-strain studies on surfaces in the nanometer range.
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AFM for Large Samples
NaniteAFM
The unparalleled small footprint of the NaniteAFM scan head and its highprecision/quick lock mounting system make it the ideal atomic force microscopefor integration into automated industrial environments. With a resolution below one nanometer, the NaniteAFM is capable of detecting and visualizing even the smallest surface structures.
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EV Profiler Kit V2
Harness the power of single-molecule localization microscopy to characterize EVs across scales. Quantify nanometer small, rare, and precious EV samples with super-resolution precision. ONI’s EV Profiler helps you focus on answering the right questions about your EV populations.
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hpower High Power Amplifiers
For hpower high-power actuators, high-power amplifiers are required. Together these hpower actuators and amplifier systems deliver exceptionally fast response times, superior dynamics, high force generation, and nanometer precision.
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High Precision 3D Metrology
Ensure zero-defect quality in all product deliveries and boost customer satisfaction: ISRA’s precision metrology systems measure all object and surface properties down to the nanometer level while ensuring the shortest cycle times.
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Particle & Molecular Size/Charge Analyzers
Zetasizer Range
Instruments in the Zetasizer range are used to measure particle and molecular size from less than a nanometer to several microns using dynamic light scattering; zeta potential and electrophoretic mobility using electrophoretic light scattering; and molecular weight using static light scattering. The Zetasizer system is available in a range of variants, including the new Zetasizer Pro and Ultra. These two new systems offer unprecedented ease-of-use and flexibility, along with empowering user guidance and novel measurement techniques such as MADLS® and Particle Concentration.
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Surface Analysis
A UHV surface analysis system for thin film depth profilingMeasures the surface composition of the first few nanometers and/or micrometers depth of solid samples.
