Nanometer
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Product
Coordinate Measuring Machines
VideoCheck® UA
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Ultra Accurate multisensor coordinate measuring machine in fixed bridge designHighest accuracy due to use of low vibration precision air bearings and solid granite constructionThe VideoCheck® UA features scale resolution in the nanometer range and a special design that reduces measurement errorsCan be equipped with high-precision sensors including the high precision 3D Fiber Probe.Use of high precision telecentric lenses in a second optical beam pathModular structure guarantees customized solutions for individual applicationsIntegrated vibration isolation dampeners
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Product
High Resolution Wafer Thickness & Thickness Variation Gauge
MX 10x series
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The MX10x series measure thickness and thickness variation on silicon wafers. It has a resolution of 10 nanometers and can be adapted to different thickness ranges within a few seconds.
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Product
3D Form Measurement
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Ensure that components function and can be fitted correctly with efficient form monitoring. ISRA’s 3D form measurement systems capture component geometries down to the nanometer level while ensuring the shortest cycle times.
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Product
Companion Tool to VS for Test Time & Pin reduction
UltraScan
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UltraScan is SynTest's solution to combat increase in test time. In 130 nm or smaller ? nanometer geometries, many defects become delay defects and it becomes necessary to use delay tests to detect the transition faults and path delay faults. Often bridging tests are also required.
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Product
Detectors
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Solar blind detector for operation in the 1 to 180 nanometer region. It is encased in a vacuum tight housing for vacuum operation. The Model 425 is ideal for measurements in the Extreme and Vacuum UV (EUV and VUV) where the solar blind feature eliminates potential interference from long wavelength ultraviolet and visible light. It may be operated in pulse-counting mode or DC. The CEM is also available with coatings like Cesium Iodide or Magnesium Fluoride to enhance response in different energy regions.
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Product
Surface Form Analysis System
Tropel® FlatMaster®
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Tropel® FlatMaster® Surface Form Analysis System Fast and Precise Measurements of Ground, Lapped, Honed, Polished and Super-finished Components. The Tropel® FlatMaster® offers industry leading performance for surface form measurements to precision component manufacturers. Our non-contact optical technique analyzes the entire surface of the part in seconds, regardless of its size or complexity. The FlatMaster provides five nanometer resolution and a standard accuracy of 50 nm (2.0 μ). It rapidly and accurately measures flatness, line profile, radius and other surface parameters on a variety of materials and surface finishes.
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Product
Nanoindentation Testing in the Micrometer RangeFISCHERSCOPE
FISCHERSCOPE® HM2000
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Nanoindentation for professionals. Reliable hardness measuring instrument for determining properties such as indentation hardness and the depth-dependent elastic indenter modulus – and all of that in the nanometer range.
