X-ray Fluorescence Spectrometers
See Also: X-ray Fluorescence, XRF
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Spectrometers
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Via the waveScan technology, A·P·E offers a spectrum analyzer for different wavelength ranges of CW and mode-locked laser systems. Featuring high resolution and supreme ease of use, several versions of waveScan are available, to allow measurement of scan rages ranging from 200
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X-ray and CT Inspection Systems
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YXLON X-ray and CT systems come in many different configurations. We've developed a Product Finder to help narrow your search for the system that best meets your needs. Can't find what you're looking for? Our specialists will customize a system to your exact specifications. Contact us today for more information.
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Product
Tunable Filter Spectrometers
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MKS Instruments' platform of innovative optical analyzers based on Tunable Filter Spectroscopy (TFS™) provides real-time gas analysis, while delivering customers a substantially lower total cost of ownership. TFS™ can be utilized from UV (Ultra-Violet) through IR (Infra-Red) spectral regions. MKS TFS™ sensor platforms have been on the market since 2008 with more than 2500 systems deployed.
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Ultrafast Transient Absorption Spectrometer
Harpia-TA
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The transient absorption spectrometer HARPIA offers a sleek and compact design together with intuitive user experience and easy day-to-day maintenance meeting the needs of today's scientific world. Adhering to the standards raised by the OPRHEUS line of devices, the entire spectroscopic system is contained in a single monolithic aluminum casing that inherently ensures excellent optical stability and minimal optical path for the interacting beams. HARPIA can be easily integrated with both PHAROS / ORPHEUS and Ti:Sa / TOPAS laser systems. HARPIA features market leading characteristics such as 10-5 resolvable signals along with other unique properties such as the ability to work at high repetition rates (up to 1 MHz) when used with PHAROS / ORPHEUS system. High repetition rate allows measuring transient absorption dynamics while exciting the samples with extremely low pulse energies up to several nanojoules.
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Optical Emission Spectrometer
PDA-8000
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This instrument is capable of high sensitivity quantitative analysis of iron and steel, copper, aluminum alloys and other solid metals, as well as impurities and other elements, thanks to a high resolution monochromator and discharge energy stabilized excitation unit. Excellent operability is achieved with software that enhances instrument monitoring and maintenance support functionality. In addition, this is an energy saving model that significantly reduces energy consumption.
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CZT Gamma-Ray Detector Spectrometer
GR Family
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The Kromek GR family is a range of CZT-based high-performance gamma-ray spectrometers. They are completely self-contained, with built-in preamplifier, shaping amplifier, baseline restorer, pulse height digitizer, and HV supply. The digitized pulse heights of detected gamma-ray signals are sent to a PC via the USB. The unit is powered entirely from the USB bus, so no external power supply is needed.
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Integrating Sphere FT-NIR Spectrometer
QuasIR 3000™
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The QuasIR™ 3000 was designed from the ground up to offer the industry a new kind of NIR analysis solution – a solution that brings together the portability required to move NIR analysis closer to point-of-need, combined with unmatched spectroscopic performance for the fastest and most accurate results.
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Product
Fluorescence Lifetime Imaging Microscopy (FLIM) Camera
Toggel
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Lambert Instruments today announced the introduction of its next-generation fluorescence lifetime imaging camera: Toggel. This new camera makes fluorescence lifetime imaging microscopy (FLIM) and fluorescence resonance energy transfer (FRET) faster and easier with its excellent light sensitivity, sharp images and fast image acquisition. With Toggel, Lambert Instruments aims to minimize measurement duration, automate image acquisition and simplify data analysis. These factors are of great importance to many of its customers in cell biology, cancer research and high-throughput screening.
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Product
Spectrometers
Elite Series
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Our Elite series spectrometers are for applications that require long integration times that demand high repeatability. These spectrometers can also be configured for ultra-high resolution. They are designed using our Ultimate Diffraction Grating and our Innovative Optical Design configured to be used with Andor iDus cameras. This allows sensitive materials to be measured that otherwise would be damaged using a high powered laser. When tested side by side, our spectrometers consistently outperform our competitors more expensive systems.
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X-ray Inspection System
RTX-113HV
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Precision X-ray Inspection for BGAs, QFNs, LEDs, sensors, medical devices, and other packaged devices.
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Modular Spectrometers
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B&W Tek boasts one of the most comprehensive lines of UV, Vis and NIR spectrometer modules on the market. Combined with our wide selection of spectroscopy accessories, we offer you nearly limitless utility. Due to their small form factor and customizable software control systems, fiber optic spectrometers are the ideal choice for both integration into your OEM system and for the laboratory, where you can combine modular products to form a complete solution.
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Mass Spectrometers & Other MS Solutions
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Waters mass spectrometers provide you with the tools to confidently identify and quantify unknown compounds in complex samples, and confirm trace components at the lowest possible levels. Instrumentation that allows you to comprehensively catalog complex samples in a single analysis is now available.
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Small Footprint NIR Spectrometer
PGS Series
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ZEISS PGS modules with a spectral coverage of 960 - 2200 nm are among the market leading NIR spectrometers, providing a small footprint, highest throughput and excellent SNR. Special TE-cooled/uncooled InGaAs detectors ensure lowest noise conditions.
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Product
Laser Induced Fluorescence (Mixing LIF)
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Planar laser-induced fluorescence (PLIF) is an optical diagnostic technique widely used in fluid and gas applications. PLIF has proven to be a valuable tool for flow visualization as well as for quantitative whole-field measurements of scalars such as concentration and temperature in liquid and concentration in gaseous flows. Applications can be found in process engineering, biomedical engineering, and fluid dynamics research.
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X-ray Non-Destructive Testing (NDT) System
DynamIx HR / Series 5
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High precision 12-bit 50µm reading allows inspection of minute image details. Wide dynamic range resulting in wide allowance of X-ray exposure value.
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X-ray Fluorescence Sulfur-in-Oil Analyzer
SLFA-20
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The SLFA-20 are designed specifically to meet the recent demanding needs of measuring the new low sulfur fuels, diesel and RFG.Using the X-ray fluorescence technique, fast and accurate measurements can be carried out in compliance with the ASTM D4294 method, either in the lab or in the field.
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Detachable X-Ray Detector
RadEye HR
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The Remote RadEye HR x-ray detector is a slim, lightweight, rugged solution for high-resolution radiation imaging. The detector is suitable for industrial inspection applications where images are taken in tight or difficult-to-reach spaces.
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Product
X-ray Inspection System
TruView Prime
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The TruView Prime is a fully motorized radiography system developed to meet the stringent requirements of electronics assembly and component inspection. The TruView Prime is professionaly built - something hard to find in entry level systems in the TruView Prime's price range.
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TEL-X-Ometer X-ray System
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X-ray experiments can include radiography, x-ray fluorescence, and x-ray diffraction. All can be performed with the TEL-X-Ometer, a compact x-ray source designed for student use. Take a look at the TEL-X-Ometer and accessories today.
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OEM Spectrometers
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Ibsen offers a wide range of robust, athermal, industrial-grade OEM spectrometers that can be tailored to your exact needs. We are dedicated to being your preferred OEM partner for spectroscopic modules by offering a lot of competitive benefits.*High sensitivity/optical throughput due to our in-house produced fused silica transmission gratings*Proven, environmentally robust, and thermally stable opto-mechanical benches with low unit-to-unit variation*Volume manufacturing with high quality, consistent performance and flexible delivery*A dedicated OEM support team to assist you throughout your project development and manufacturing phases*Senior level optical and mechanical design experience
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TXRF Spectrometers
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Total reflection X-ray fluorescence spectrometry (TXRF) is a well-established method for trace element analysis on a variety of samples.
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Raman Spectrometer
S-RS
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Main features of this system are an adaptation a super stable single mode 500-picosecond pulsed Diode Pumped Solid State Lasers (DPSSL) with more than 8 kW peak power as a probe beam.
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Inductively Coupled Plasma Mass Spectrometer
ICPMS-2030
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With its newly developed collision cell and optimized internal structure, the ICPMS-2030 provides superior sensitivity. At the same time, thanks to the adoption of its proprietary mini-torch unit and provision of an Eco mode, the quantity of argon gas needed for analyses has been greatly reduced to the industry's lowest levels. As a result, low running costs are assured. The Development Assistant function of the software automatically sets the optimal analysis conditions for quantitative analysis. Then, after measurements are complete, the Diagnosis Assistant function automatically checks the validity of the necessary data. While reducing the burden on the user, the efficiency of analyses is enhanced and the reliability of the data can be increased. It complies with FDA 21 CFR Part 11.
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Bench-top Raman Spectrometer
MacroRAM™
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Bench-top Raman Spectrometer - Best in Class Raman Sensitivity and Software, with Class 1 Laser Safety. The new MacroRAM Raman spectrometer brings simplicity to Raman measurements without compromising the ability to handle even the most complex samples. Its compact and robust design, including Class 1* laser safety means it''''s safe for use in most environments, from undergraduate teaching labs to industrial QC applications.
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Product
Process EDXRF Spectrometer
NEX LS
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Applied Rigaku Technologies, Inc
Featuring advanced third generation EDXRF technology, the Rigaku NEX LS represents the next evolution of scanning multi-element process coatings analyzers for web or coil applications. To deliver superior analytical performance and reliability, the EDXRF measuring head assembly was derived from the established Rigaku NEX Series high-resolution benchtop instrumentation. With this proven technology, the Rigaku NEX LS delivers rapid, non-destructive, multi-element analyses — for coat weight, coating thickness and/or composition — for elements from aluminum (Al) through uranium (U). The measuring head is mounted on a rigid beam and is equipped with a linear traversing mechanism positioned over a roller so that the head-to-surface distance is constant. Common applications include silicone release coaters, converters, denesting Si for vacuum-formed plastics, RoHS compliance, conversion coatings, metalized plastic, top coatings on metal coil and fire retardants on fabric.
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X-Ray Seamless Pixel Array Detector
XSPA-400 ER
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In general, X-ray diffraction measurements using a Cu X-ray source are known to have difficulty detecting trace crystalline phases because of increased background when measuring samples containing transition metals. The high energy resolution of the XSPA-400 ER supresses the fluorescent X-rays originating from the sample, thereby reducing background, enabling highly sensitive measurements of samples containing transition metals, such as iron and steel compounds and battery materials.Therefore, it achieves higher sensitivity measurements than conventional detectors.
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Laboratory Spectrometers
M Series
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Current generation M4000 spectrometers truly represent evolved technology. They represent over two decades of product development, incorporating many of the features that allow our high performance dedicated analyzers to achieve low ppb detection levels in complex gas matrices.





























