Static Program Analysis
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Boundary Scan Test and JTAG Programming Tool Set
onTAP® Series 4000
onTAP is a comprehensive boundary scan testing and JTAG programming tool set that bolsters the most accurate possible fault coverage in an affordable and expedient manner, while providing support for the entire product life cycle.
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WaferPro Express On-Wafer Measurement Program Software
WaferPro Express software performs automated wafer-level measurements of semiconductor devices such as transistors and circuit components. It provides turnkey drivers and test routines for a variety of instruments and wafer probers. Its new user interface makes it easy to setup and run complex wafer-level test plans, while powerful customization capabilities are enabled by the new Python programming environment.
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2D Near-Field Analysis of VCSEL Arrays
VTC 4000
Instrument Systems Optische Messtechnik GmbH
The VTC 4000 near-field camera from Instrument Systems was specially developed for the ultrafast, precise 2D analysis of VCSEL arrays. It enables polarization-controlled characterization of all relevant parameters simultaneously for the single emitters of the array.
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Test Program Development
Today's System-On-Chip-designs require creative development of test system add-ons. Test vector converters for most common simulators are available. Our specification for test program development is available on request. Our specification for test program development is available on request.
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X-ray Fluorescence, XRF Analysis Services
Two XRF systems are available, a wavelength dispersive system (WDXRF) and an energy dispersive system (EDXRF). The difference is the manner in which the x-rays are detected. WDXRF instruments have very good energy resolution which leads to fewer spectral overlaps and improved background intensities. EDXRF instruments have higher signal throughput which can shorten analysis times. The higher signal throughput also makes EDXRF systems suitable for small spot or mapping analysis.
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Boundary Scan Program Development Service
No need for test fixtures. Integrates product development, production test, and device programming in one system. Test and Programming data can be reused in Production. Fast test procedure development. Reduced inventory management. Eliminates or reduces ICT usage time. Pre-production testing can begin as soon as prototype is released.
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Electric Shock Protection Analysis
60364-4-41 StandardBS 7671 StandardEN 50122 StandardTN-C, TN-S, TN-C-S, TT & IT Earthing TypesElectric shock requirementsLoop impedance and current calculationTouch voltage calculation and evaluationCalculation considers resistance to ground / earthGround Fault Current Interrupter (GFCI) or Residual Current Circuit Breaker (RCCB) or Residual Current Detector (RCD) protectionReports in Crystal Reports and MS Excel
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Destructive Physical Analysis & Failure Analysis
DPACI's component analysis laboratory performs major analytical functions, such as destructive physical analysis, failure analysis, counterfeit analysis, and material analysis on components & devices. Our destructive physical analysis techniques are performed in accordance with standards and methods used in most military and space program requirements. Solutions for difficult production problems are resolved through our failure analysis procedures.
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Spectroscopy & Scientific Analysis Systems
Advancing Knowledge. Empowering Breakthroughs. Our spectroscopy instruments and software help advance knowledge and understanding of radioactive materials, empowering the next wave of breakthrough science and innovation.
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X-ray Diffraction and Elemental Analysis
D8 ADVANCE
The intelligent beam path components of the D8 ADVANCE with DAVINCI design provide true plug'n play functionality requiring minimum or even no user intervention. Featuring automatic and tool-free switching of the diffraction geometry without the need for complex adjustments, the D8 ADVANCE with DAVINCI design broadens the analytical capabilities for a wide community of X-ray diffraction users.
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Fully automated Crude and Detergent Fibre analysis
Fibertec™ 8000
The Fibertec 8000 is a fully automated system for determination of crude fibre, detergent fibre and related parameters according to standard reference 'crucible' methods such as Weende, van Soest and other recognised methods. Approvals for the crucible method include ISO, EEC, AOAC, AOCS. The Fibertec 8000 provides unrivalled accuracy, the highest safety and the lowest operator time of any fibre solution.Parameters: Crude fibre, neutral detergent fibre, acid detergent fibre, acid detergent lignin. Sample types: Raw materials and finished products in Feed and Agriculture.
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Failure Analysis
MicroINSPECT 300FA
The MicroINSPECT 300FA is an automated wafer inspection tool used for semiconductor wafer failure analysis. Its small footprint, high speed, and low cost relative to its rich features yield a superb cost of ownership and makes this an ideal tool for your fab or failure analysis lab. The MicroINSPECT 300FA combines advanced robotics, wafer sorting, an intelligent wafer inspection microscope together with SiteVIEW Software to produce an integrated failure analysis tool.
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Universal Partial Discharge Measurement and Analysis System
MPD 800
Our MPD 800 universal partial discharge (PD) measurement and analysis system represents the next generation of our widely-used and innovative MPD PD testing technology. Enhanced and newly-added hardware and software features ensure highly-sensitive multi-channel PD measurements for reliable, industry-standard PD testing on a variety of electrical equipment and components.
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On-line FT-NIR Analysis
MATRIX-F
The advantages of real time, on-line FT-NIR analysis have been well established. However, conventional spectrometers can only be installed close to the process that they are monitoring, which makes the analyzer be exposed to a hostile environment, like drastic temperature changes and exposure to dust and dirt. Furthermore, the instrument needs to be positioned in hard-to-access and often Ex-protected area.
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Serial to Parallel Analysis Package
B4601C
Your system uses serial buses to communicate between ICs and transfer data to and from peripheral devices. Sifting through thousands of serial bits by looking at long vertical columns of captured 1's and 0's can be very tedious, time-consuming, and error prone. The Keysight Technologies B4601C serial to parallel analysis package is general-purpose software that allows easy viewing and analysis of serial data.
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Analysis In Real Time
Live Analyzer
Vibration Research Corporation
With Live Analyzer, you don’t have to wait until post-process to begin data analysis. View data in real-time and then pause the live stream to select, analyze, and export a section of the time waveform. Access the ObserVIEW graphing packages, employ averaging, analyze tachometer channels, and more.
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Gas Analysis
FLOW EVO
SmartGAS NDIR sensors offer many advantages for successful gas analysis and are ideal for process control. They are convincing where extreme precision and reliability are required. Various versions can be combined easily, which thus allows complex measurement tasks. All smartGAS sensors are characterized by low detection limits, low drift, a wide temperature range and extremely low operating and maintenance costs.
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PXI-6704, 16-Bit, 32-Channel, Static PXI Analog Output Module
777796-01
16-Bit, 32-Channel, Static PXI Analog Output Module—The PXI‑6704 is a static analog output device. You can use the PXI‑6704 to create software-timed voltage and current output applications. You can independently set the output voltage range on each channel. The PXI‑6704 also includes eight 5 V TTL/CMOS digital I/O lines.
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Bug Finder Analysis
Polyspace
Polyspace Bug Finder checks compliance with coding rule standards such as MISRA C, MISRA C++, JSF++, and custom naming conventions. It generates reports consisting of bugs found, code-rule violations, and code quality metrics, including cyclomatic complexity. Polyspace Bug Finder can be used with the Eclipse IDE and integrated into build systems.
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Remote Assisted Programming in Your Shop with Guaranteed Results!
RAP®2
*Free up your technicians to do higher-skilled work and increase your profitability, with Opus IVS' team of experts doing the programming for you remotely.*No need to send complex vehicles to the dealership or call a mobile technician for flashing.*Have confidence that all vehicles will be successfully programmed and your customers will leave your shop satisfied.
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Complete Graphical Power Quality Analysis System
PK5064-PRO+
The PK5064-PRO+ is the top choice for comprehensive power quality studies, energy audits, load studies, harmonic analysis, and more. Wide-range flexible current probes allow you to get into tight and confined spaces, wrap around large conductors, and measure almost any AC circuit that comes your way.
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Impedance Analysis For E5061B-3L5 LF-RF Network Analyzer
E5007A
The E5007A provides the impedance analysis (ZA) firmware for the E5061B LF-RF network analyzer. This option enables the analyzer to measure impedance parameters of electronic components such as capacitors, inductors, and resonators. The combination of NA and ZA capabilities further enhances the analyzer’s versatility as a general R&D tool. Basic ZA functionalities including fixture compensation and equivalent circuit analysis are supported by the firmware. The DC biased impedance measurement is possible with the built-in DC bias source provided by the E5061B-3L3/3L4/3L51.
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Surface Plasmon Resonance Analysis
Surface plasmon resonance (SPR) is an optical-based, label-free detection technology for real-time monitoring of binding interactions between two or more molecules. The throughput, flexibility and sensitivity of the SPR platform gives researchers the potential to characterize biomolecular interactions in any binding study.
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Static Weathering Testing
Atlas Material Testing Solutions
Atlas' outdoor exposure sites provide a wide range static exposure testing for a variety of materials and end use conditions. Static (real-time) weathering testing capabilities include direct exposure using fixed or variable angle, backed or unbacked racks; indirect (under glass) exposure for interior materials; and black box exposure for paints and coating materials. Contact one of our qualified representatives to see which tests are right for you.
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Network Analysis
Network development solutions come in different formats to support the variety of applications, such as network analysis or node emulation. Network analysis is crucial throughout the development of any networked system or module. The ability to capture, view, and record messages allows monitoring of bus integrity or troubleshooting functionality of the modules on the network. Whether developing a concept or preparing for production, access to the network is essential. Node simulation can be done with software, such as ATI's CANLab Software, or hardware components, possibly CANverter, depending on whether the environment is on the bench or in the vehicle.
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Acoustic Analysis
Noise is increasingly the subject of new regulations for the protection of human health and safety as well as for improving the environment in general. As well as sound levels, the perceived sound quality of products from washing machines to vehicles is often an important part of the customer buying decision so must be considered during product development. m+p Analyzer for noise and vibration measurement and analysis provides a full range of capability for these applications. Real-time fractional octave filters satisfy all acoustic applications from simple sound pressure, sound power for equipment legislative requirements, intensity mapping to isolate sources to sound quality metrics for product refinement.
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Pitot Static Indicator
ADSE 740
The ADSE 740 is a complete high performance dual pressure Ps and Pt standalone test bench specially designed to be used in the workshop or in the laboratory to test and calibrate all air data equipment such as altimeters, vertical speed indicators, air speed indicators, MACH-meter, air data computers ...) and sensors.
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Quantitative Analysis Software
Electron Probe X-Ray Analyzer (EPXA)
The software runs on standard PC’s and operating systems (Windows XP and later). Complete ZAF analysis is possible, with or without standards, using an internal database of fundamental parameters (FP) such as absorption coefficients, fluorescence yields, transition probabilities, etc. There is also an integrated spectrum display.
