Silicon Drift Detectors
measure X-ray radiation energy at high resolution. Also known as: SDD
See Also: SDD, Energy Dispersive X-ray Fluorescence
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Product
Micro-XRF spectrometer
Atlas™
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The Atlas™ Micro-XRF spectrometer (µXRF) from IXRF Systems introduces a new world of x-ray mapping and automation. The Atlas™ boasts the largest chamber volume and SDD detection area (150mm2) well as the smallest spot size (10µ) available on the market. Additionally, the Atlas™ is complimented by the most comprehensive software suite including multi-point analysis, unattended automation, in-depth feature/image analysis, unprecedented mapping and reporting features, and much more.
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Product
Robust DIN-rail Fanless Embedded System With Intel® Celeron® Processor N3060/N3160, 2 COM, 4 USB, 2 GbE LAN (1 PoE PD), DIO And RTC
ICO310
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The ICO310, a robust din-rail IIoT (Industrial IoT) embedded platform, supports low power Braswell Intel® Celeron® processor N3060 1.6 GHz dual-core or N3160 1.6 GHz quad-core with up to 8GB DDR3L system memory, delivering high performance and low power consumption at competitive price. The outstanding Braswell Intel® Celeron® SoC-based embedded field controller offers complete expandability and full featured I/O, including two Gigabit LAN ports, two RS-232/422/485 ports, two USB 2.0 ports, two USB 3.0 ports, one VGA port, and one DIO interface. Two PCI Express Mini Card slots, one SIM card slot and three internal antennas are available for 3G/GPRS and Wi-Fi connections. Furthermore, the ICO310 features PoE PD function, which can simplify network installation and minimize the total costs of replacement and maintenance. Its storage interfaces include an SATA SDD, as well as mSATA support on the PCI Express Mini Card slot. Additionally, the wide range 12V-24V DC terminal block power input with overvoltage and reverse protection can lower the risk of data loss under human manipulation. The reliable yet robust ICO310 is a perfect solution for industrial IoT applications such as smart energy, smart factory automation, facility monitoring systems and many more.
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Product
Energy Dispersive Spectroscopy (EDS) Platform
Octane Elect EDS System
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The Octane Elect EDS System is an enhanced Energy Dispersive Spectroscopy (EDS) platform with the latest advancements in Silicon Drift Detector (SDD) technology and high speed electronics. Tailored for users who demand higher performance and functionality than the options available in entry-level systems, the Octane Elect EDS System provides excellent resolution and high throughput at an optimal value with a remarkable low energy sensitivity for light element detection and low voltage (kV) microanalysis.
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Product
High Performance Fluorescent X-ray (XRF) Coating Thickness Gauge
FT150 Series
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Hitachi High-Technologies Corp.
The FT150 is a high-end fluorescent X-ray coating thickness gauge equipped with the polycapillary X-ray focusing optics and Vortex silicon drift detector. The improved X-ray detection efficiency enables high throughput and high precision measurement. Furthermore, new design to secure wide space around sample position gives exellent operability.
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Product
XRF
L Series
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The L Series is the most versatile instrument that Bowman offers. It combines all of the features of the P Series with a larger sample chamber and greater X-Y stage travel. For samples larger than ~12 inches (300 mm) in any direction, the L Series is a must-have. The large sample stage and travel allows for both large parts, or large sample fixtures holding multiple parts, to be measured. The chamber is fully enclosed and boasts a capacity to hold samples up to 22″ (550mm) x 24″ (600mm) x 13″ (330mm) (LxWxH). The X-Y stage travel distance is 10″x10″ (254mm x 254mm). The standard configuration includes a 4-position multiple collimator assembly, and a variable focus camera allowing for measurement in recessed areas. As with other models, the collimator sizes and focal distances are customizable for different customer applications. The programmable X-Y stage is included, but can be removed to allow for the maximum sample height capacity (10″ (254mm) z-height with stage, 13″ (300mm) without). The solid-state PIN detector is included along with our long-life micro-focus x-ray tube. The high performance SDD detector is an optional upgrade.
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Product
Energy Dispersive Spectroscopy (EDS) Detector Technology
EDS
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The Element SDD is a solutions based detector, which excels at basic analysis. Focused primarily on serving the needs of the industrial market segment, it provides application specific software and analysis that can quickly provide answers in the industrial environment.
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Product
X-Ray Fluorescence Analyzer
MESA-50
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HORIBA has been selling the XGT-WR series of EDXRF analyzers for many years, providing screening measurements of samples containing hazardous elements such as Pb, Cd, Hg, Cr, Br, Sb, As for RoHS, ELV, and Cl for halogen free applications.XGT systems are used daily throughout the world. HORIBA has now developed the new MESA-50 EDXRF analyzer, based on its long experience with customer requirements and knowledge. MESA-50 provides user friendly operation and good performance. MESA-50 includes three analysis diameters, suitable for every sample, from thin cables and electronic parts to bulk samples. The combination of SDD detector and Digital pulse processor(DPP) changes the image of EDXRF.HORIBA's new MESA-50 supports ecological procurement; it contributes not only to EU RoHS and ELV compliance testing, but also regulatory work for many other countries.
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Product
Silicon Drift Detector
Octane Elite (SDD) Series
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The game changing advancements in the Octane Elite Silicon Drift Detector (SDD) Series take detector technology to the next level. This line of detectors incorporates a new silicon nitride (Si3N4) window, which offers remarkable improvements in low energy sensitivity for light element detection and low kV microanalysis. The Octane Elite Series also uses the widely praised CUBE technology, which yields high speed X-ray data processing within a smaller and fully vacuum encapsulated detector device.
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Product
Bias Boards
CUBE
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The CUBE Bias Boards are a set of off-the-shelf biasing boards developed to speed-up the integration process of the CUBE CMOS preamplifier family of XGLab. These boards allow to bias both the detector (SDD as standard, other detector upon request) and the CUBE preamplifier.
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Product
Low cost EDXRF Elemental Analyzer
NEX QC+ QuantEZ
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Applied Rigaku Technologies, Inc
As a premium low-cost benchtop EDXRF elemental analyzer, the Rigaku NEX QC+ QuantEZ delivers wide elemental coverage with easy-to-learn Windows®-based QuantEZ software. Non-destructively analyze from sodium (Na) through uranium (U) in almost any matrix, from solids and alloys to powders, liquids, and slurries. The 50 kV X-ray tube and Peltier cooled silicon drift detector (SDD) deliver exceptional short-term repeatability and long-term reproducibility with excellent element peak resolution. This high voltage capability, along with multiple automated X-ray tube filters, provides a wide range of XRF applications’ versatility and low limits-of-detection (LOD).
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Product
Electron Microscope Analyzer
QUANTAX FlatQUAD
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QUANTAX FlatQUAD is the EDS microanalysis system based on the revolutionary XFlash® FlatQUAD. This annular four-channel silicon drift detector is inserted between SEM pole piece and sample, achieving maximum solid angle in EDS.
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Product
Silicon Detectors
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Through the photovoltaic effect, detectors provide a means of transforming light energy to an electrical current. The root of the theory behind this phenomenon is a small energy gap between the valence and conduction bands of the detector. When light, with enough energy to excite an electron from the valence to the conduction band, is incident upon the detector, the resulting accumulation of charge leads to a flow of current in an external circuit. Since light is not the only source of energy that can excite an electron, detectors will have some amount of current that is not representative of incident light. For example, fluctuations in thermal energy can easily be mistaken for light intensity changes. A variety of these "non-light" contributions are present and, when summed up, make up the total noise within the detector.
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Product
Silicon Based Thermopile Detector: 4 Channels
ST150 Quad
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A four-channel silicon-based thermopile detector in a TO-8 package. Each active area size is 1.5mm x 1.5mm. Affordable four-channel design with strong output and a very low Temperature Coefficient of Responsivity of -0.04%/C. This detector has a very short thermal shock response to ambient temperature change.
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Product
Silicon Oscillators
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Analog Devices silicon oscillators are frequency programmable via pin-strapping, or through the resistor connection or serial interface (SPI or I2C). These solid-state clocks are well-suited for general-purpose usage, such as PGAs, ASICS, microprocessors, or UARTS, and they operate from 1 kHz to 170 MHz. Silicon oscillators are also ideal switching regulator clocks as they provide synchronization and EMI reduction (via spread spectrum).
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Product
Quick Silicon Discriminator
HS-QSD
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HS-QSD Quick Silicon Discriminator is specially designed for silicon sorting，it can quickly test the silicon type, heavy-dopedt, and can be widely used in all kinds of silicon sorting, like granular polysilicon material, break semiconduct silicon wafer, chunk material, top and tail material and so on. With the three probes, it could show type and heavy type simultaneously, strongly improved the sorting efficiency.
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Product
Silicon Based Thermopile Detector: 4 Channels
ST120 Quad
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A four-channel silicon-based thermopile in a TO-5 package. Each small active area is 1.2mm x 1.2mm . Time constant of 25ms with Nitrogen encapsulation gas. Delivers a very low Temperature Coefficient of Responsivity of -0.04%/C. This detector has a very short thermal shock response to ambient temperature change.
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Product
Silicon Charged Particle Radiation Detectors
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ORTEC introduced the first silicon surface barrier detectors for charged particle spectroscopy in the early 1960’s. Since then, ORTEC has expanded the product line with more than ten different options to choose from.
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Product
Detectors
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Keysight detectors offer very flat frequency response versus frequency and temperature and exhibit excellent square law response with very low junction capacitance. Planar Doped Barrier Diode Detectors are available only from Keysight.
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Product
Silicon O/C Content Tester
HS-OCT-6700
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The HS-OCT-6700 system used to measure the O&C in silicon ingot and wafers. The system is the highest performance FT-IR systems available. While the spectrometer has the power to handle the most advanced research-level experiments, routine analyses are performed just as conveniently. Every facet of the Nicolet FT-IR spectrometer has been engineered to facilitate sample handling, introduce options to scientists, and increase laboratory throughput.
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Product
Detectors
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Solar blind detector for operation in the 1 to 180 nanometer region. It is encased in a vacuum tight housing for vacuum operation. The Model 425 is ideal for measurements in the Extreme and Vacuum UV (EUV and VUV) where the solar blind feature eliminates potential interference from long wavelength ultraviolet and visible light. It may be operated in pulse-counting mode or DC. The CEM is also available with coatings like Cesium Iodide or Magnesium Fluoride to enhance response in different energy regions.
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Product
Silicon Test & Yield Analysis Solutions
Tessent®
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The Tessent product suite combines features of deterministic scan testing, embedded pattern compression, built-in self-test, specialized embedded memory test and repair, and boundary scan, as well as board and system-level test technologies. This comprehensive silicon test and yield analysis solution is built on the foundation of the best-in-class solutions for each test discipline
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Product
Pinhole Detector
NOVOTEST ED-3D
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NOVOTEST ED-3D Pinhole Detector was designed for rapid non-destructive testing of the continuity of coating (e.g. porosity of film) with thickness up to 500mkm according to ASTM G62-A.Pinhole Detector is designed for testing the porosity of partially painted places and other discontinuities of protective dielectric coatings on metal products by putting low voltage through a sponge which is soaked in a liquid electrolyte with high penetrating properties.
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Product
Silicon Steel Sheet Iron Loss Tester
DX-30SST
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DX-30SST Silicon Steel Sheet Iron Loss Meter adopts SCM technique and analog electronics technique, the magnetic circuit of permeameter adopts low loss silicon steel iron core, it is a small tester for measuring the characteristics of silicon steel sheet, met the requirements of tracing the brand of silicon steel sheet.
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Product
Silicon Phosphor and Boron Analyze system
HS-ICP-MS
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The Silicon Phosphor and Boron Analyze system HS-ICP-MS is the best system to measure the element like P&B in silicon material, the HS-ICP-MS can detect and analyze over 75 elements.
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Product
Amplitude Detectors
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Amplitude detection, which eliminates the carrier (or the subcarrier) at the Doppler filter output
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Product
Pinhole Detector
270
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The Elcometer 270 Pinhole Tester range utilises the wet sponge technique and has been designed to set a new standard for wet sponge pinhole detectors.
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Product
Metal Detectors
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Guarantee the quality of your product with our WIM-Systems metal detectors. Wide variety of metal detectors that will help you to cover your quality controls in the production line, guaranteeing the quality of your products with an adequate inspection.
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Product
Tunable Detectors
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Due to their spectral properties and robustness, pyroelectric detectors have proven themselves for many years in numerous applications in gas analysis, flame detection and spectroscopy. They enable the tuning of the optical filter over a defined spectral range by simply adjusting the control voltage. Instead of mounting filters to inspect specific areas of interest as is conventionally common, the detector with tunable Fabry-Pérot filters (FPF) can be used to monitor a broad spectral region continuously.
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Product
CBRN Detectors
RIID
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A Radioisotope Identification Device (RIID) is a small, lightweight, portable instrument that identifies radioactive materials by measuring the energy of gamma rays they emit. RIIDs can also perform spectroscopic analysis to distinguish between different radioactive isotopes.
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Product
DFT Validation And Silicon Debug Platform
NEBULA Silicon Debugger
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NEBULA provides advanced features for performing early validation of DFT infrastructure and ATPG patterns in first silicon. The NEBULA solution directly imports test pattern formats and DFT information from leading EDA vendor tools, such as Synopsys' TetraMAX and Cadence's Encounter Test.
