Product

In-circuit Test

i3070

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Keysight Technologies

i3070 - Keysight Technologies

The Keysight i3070 In-Circuit Test (ICT) System embodies proven technology, enhancing test efficiency through time-tested software, hardware, and programmability. Catering to diverse PCBA sizes, it addresses applications such as IoT, 5G, automotive, and energy. Its unique design minimizes undesired effects from parasitic capacitance, enhances immunity to crosstalk, and eliminates stray signal coupling, ensuring consistent and repeatable measurements.

Product

Vibrator QC System

Accelerometer Array

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Seismic Source Co.

Accelerometer Array - Seismic Source Co.

*24-channel input interface for DAQLink-III acquisition system (23 for accelerometers and one for True Reference)*Computes accelerometer weighted sum using input array*Controlled state of current supplies for external accelerometers*LED status indication of every accelerometer input*Differential outputs to the acquisition system*Input channel impedance of 1 Mohm*Bandwidth: 0.1 - 5000 Hz*Crosstalk: -100 dB*Phase tolerance of channels: ±0.2 deg*10 mA current supply for every accelerometer channel*Max input signal: ±10 V p-p (True Reference), ±2.8 V p-p (Accelerometer input)*Power supply: 9 - 18 V

Product

High Performance Raman Spectrometer

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ZOLIX

ZOLIX

Combining volume phase holographic (VPH) grating, wavelength optimized optics and deep-cooled CCD camera, Zolix is proud to present stateof-the-art Omni-iSpecT Raman spectrograph. It solves two essential problems concerned with Raman spectroscopy, speed and sensitivity. VPH spectrograph allows you to have faster acquisition and better S/N ratio, it is ideal for low light Raman applications such as remote detection, ultra fast Raman mapping etc, its lens-based design delivers minimum distortion at focal plane and ensures best image quality, which gives you high resolution and large spectral range simultaneously, also perfect image quality is ideal for multi-channel applications without cross-talking. The Omni-iSpecT's rugged and compact design make an ideal module for in-the-field and industrial applications; It is still suitable for academic research with research-grade performance; The Omni-iSpecT also provides the SDK file for secondary development.

Product

Active Antenna Combiner

M2C

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Lectrosonics, Inc.

M2C - Lectrosonics, Inc.

The M2C active antenna combiner is designed as an ideal matching component to Lectrosonics digital transmitters. Up to eight transmitters can feed a single antenna to minimize cabling in multi-channel systems. The inputs are isolated to minimize crosstalk and IM (intermodulation) between RF channels.

Product

DPSK Demodulator

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Optoplex Corporation

Optoplex Corporation

Optical differential-phase shift keying (DPSK) provides a desired modulation format that offers high receiver sensitivity, high tolerance to major nonlinear effects in high-speed transmissions, and high tolerance to coherent crosstalk. In DPSK, data information is carried by the optical phase difference between adjacent bits. For direct detection of DPSK signal (by conventional intensity detectors), a DPSK demodulator is needed to convert the phase-coded signal into an intensity-coded signal.

Product

Bi-Axial or Axial Averaging Extensometers

Model 3560

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Jinan Testing Equipment IE Corporation

Model 3560 - Jinan Testing Equipment IE Corporation

This extensometer is ideally suited for testing anisotropic materials such as advanced composites as well as for general purpose tests like determining Poisson’s ratio. The Model 3560BIA uses a design unique to Epsilon, where the knife edges remain parallel during the displacement. This approach greatly reduces crosstalk between axes and allows use on round or flat specimens with equal ease. These extensometers are very easy to mount. Integral springs hold the unit on the test sample. The parallel multiple flexure design makes these units very durable.The Model 3560AVG reads axial strain only as a single averaged output. It may also be supplied with two independent outputs, one measurement from each side of the specimen. This set-up is most commonly required when an indication of specimen bending is desired. The second version, the Model 3560BIA, includes both the averaged axial strain and the transverse strain. Again, this may also be configured as dual independent axial readings, which results in a three channel extensometer.The Model 3560 extensometers are strain gaged devices, making them compatible with any electronics designed for strain gaged transducers. Most often they are connected to a test machine controller. The signal conditioning electronics for the extensometer is typically included with the test machine controller or may often be added. In this case the extensometer is shipped with the proper connector and wiring to plug directly into the electronics. For systems lacking the required electronics, Epsilon can provide a variety of solutions, allowing the extensometer output to be connected to data acquisition boards, chart recorders or other equipment.

Product

Detector Testing

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CI Systems Inc.

CI Systems Inc.

CI Systems' Optical Test benches are especially built to test many types of detector arrays used as the sensors of a camera, from visible to far infrared ranges. With CI Systems' expert know-how, these test benches can be tailored to a customer's design requirements. MTF, spectral response, crosstalk, NETD and sensitivity are some of the basic parameters that can be tested with CI's Optical Test benches during the design, manufacturing and integration of detector arrays.

Product

Software

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Kathrein group

Kathrein group

CrossTalk Software - Flexible Intelligence for AutoID and IoT Efficient AutoID systems for automatic object identification and data acquisition, as well as Internet of Things (IoT) systems, require excellent hardware and an at least equally excellent AutoID and IoT software. In addition to the hardware, we offer you such a software solution: the CrossTalk IoT Suite.

Product

Comparators for Space & Harsh Environment

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Renesas Electronics Corp.

Renesas Electronics Corp.

Renesas' MIL-STD-883-compliant monolithic, quad, precision comparator is qualified to QML Class Q military standards and offers fast response time, low offset voltage, low offset current and virtually no channel-to-channel crosstalk for applications requiring accurate, high-speed, signal level detection.

Product

16 Channel WDM Mux/DeMux

S-106

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Notice

S-106 - Notice

16CH WDM Mux/DeMux module of FOTS system offers a function of multiplexing or demultiplexing up to 16 channel of WDM signals. This module offers low insertion loss, low crosstalk, and high temperature stability. An internally built-in AWG module functions as 1 X N optical Multi/Demultiplexers. The bi-directional feature of this module is ideal for wide range of applications. In combination with an optionally built-in circulator or C/L-band WDM coupler, this module can be applied to the WDM-PON test. User can easily make his or her test set-ups for FTTX-PON systems, especially for WDM-PON test, by combining this module with other FOTS modules such as SLED Driver, SOA Driver, C+L-FOTS modules such as SLED Driver, SOA Driver, C+L-band ASE source, Wavelingth meter, Transceiver Driver and so on.

Product

Thin Film Based Thermopile Detector: 2 or 1 Channels

DR46

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Dexter Research Center, Inc.

DR46 - Dexter Research Center, Inc.

A two-channel or a one-channel compensated thin-film thermopile in a TO-8 package. Each active area is 4mm x 0.6mm. Offers high output with excellent signal-to-noise ratio. An internal aperture minimizes channel-to-channel crosstalk increasing sensitivity.

Product

MPI PCB Probe Systems

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MPI Advanced Semiconductor Test

MPI Advanced Semiconductor Test

Every MPI manual probe systems can be configured with a variety of different holders for printed circuit boards (PCB’s) in order to provide in addition to on-wafer, versatile, convenient, and accurate Signal Integrity (SI) measurements with single-ended or differential RF probes. Measuring signals at the end of the channel for eye-patterns, deterministic jitter, distortion, TDR (Time Domain Reflectometry) impedance, cross-talk, coupling, and losses, or even S-parameters is easily accomplished.