Showing results: 2581 - 2595 of 2988 items found.
-
AV6416-OTDR -
Radiasun International Group Ltd.
AV6416 Palm-OTDR is new Optical Time Domain Reflectometer with integrated VFL(visual fault locator). AV6416 Palm-OTDR feature handheld, compact, lightweight, long battery life and easy-to-use. It supports auto test, manual averaging, manual real time test mode. Besides, the AV6416 Palm-OTDR can save and transfer the measurement data to PC. The AV6416 Palm-OTDR has become the indispensable and ideal tools for fiber
-
Planet Technology Corp.
PLANET Last Mile Transmission Solution includes technologies such as GPON, GEPON Fiber, VDSL2 and ADSL2+ for various applications. It provides the OLT or CO (central office) which serves as the service provider endpoint of a passive optical network whereas the ONU, HGU and CPE (customer premises equipment) serve as a client endpoint. Its high bandwidth meets the requirements of triple play devices for today’s home entertainment and communications.
-
Huihong Fiber Inc
Fiber optic power meter is a test instrument used for absolute optical fiber power measurement as well as fiber optic loss related measurement .This hand held type fiber optic test equipment features ingenious appearance,wide range of power measurement, high accurate test precision and user automatic self calibration function. Fiber optic power meter is a tool for telecom and CATV network.
-
Keysight Technologies
Keysight Technologies is a world leader in the design and manufacture of laser interferometry systems, advanced electronic measurement systems, high-precision optical components, complex monolithic optics (CMOs), and opto-electronic systems design for the most demanding metrology applications. Keysight systems offer high precision in a wide dynamic range, the ability to simultaneously measure a position with multiple degrees of freedom, and the highest accuracy available in both air and vacuum systems.
-
InfraScan™ LTM -
Checkpoint Technologies, LLC.
Checkpoint Technologies' laser probing tool, the InfraScan LTM (Laster Timing Tool), employs a cw laser to optically probe circuit node to produce electronic waveforms. Checkpoint Technologies' stabilized laser source and optical-to-electronic conversion module provides high bandwidth optical probing up to 12 GHz. The LTM can be integrated into an existing InfraScan product such as an INV or TDE or installed as a stand alone system.
-
DP-VME-5838 -
Data Patterns Pvt. Ltd.
The DP- VME-5838 is a VME64x slave, high performance 335M, six channel Digital receiver card. It samples and down converts the analog IF signals into the digital base band data. The processed I/Q data are pulse compressed and decimated to the base band rate. In the Central Unit system, this pulse compressed I/Q data has to be sent to the signal processing unit through a 2.5G speed Optical SFPDP link.
-
Edmund Optics Inc.
General Purpose Integrating Sphere Systems are designed to spatially integrate radiant flux in order to measure optical radiation. The spheres can be coupled with a sensor to create radiometers, photometers, or spectroradiometers in order to measure the total geometric flux emanating from a light source or the flux density of an illuminated area. Additionally, these sphere systems can be used to measure the output of high power lasers and laser diodes or to measure the reflectance and transmittance of materials.
-
Ametek Scientific Instruments
Frequency Response Analysis (also referred to as Transfer Function Analysis) measures the output spectrum of a system relative to a stimulus, and is used to characterize the dynamics of the system under test. The technique measures the magnitude and phase relationship between output and input waveforms as a function of frequency. The input signals may be from a wide range of sensors including acoustic (microphones/sonar), mechanical (accelerometers/displacement transducers), optical (photodetectors), and electrical (amplifiers).
-
Pol 1000 Series -
Quantifi Photonics Inc.
The Pol 1000 Series PXIe module enables high-speed automated polarization control for polarization dependent testing procedures.Rotate or scramble the polarization of your signal with no need for manual adjustment of paddles or tension screws using intuitive software, LabVIEW or comprehensive SCPI commands. Pol 1000 Series can be used with our wide range of optical and electrical PXIe test modules, and can be used to build complete mixed-signal test platforms.
-
KLA-Tencor Corp
KLA’s extensive portfolio of packaging solutions accelerates the manufacturing process for outsourced semiconductor assembly and test (OSAT) providers, device manufacturers and foundries for a wide range of packaging applications. Innovations in advanced packaging, such as 2.5D/3D IC integration using through silicon vias (TSVs), wafer-level chip scale packaging (WLCSP), fan-out wafer-level packaging (FOWLP) and heterogeneous integration as well as a wide range of IC substrates create new and evolving process requirements. KLA offers systems for packaging inspection, metrology, die sorting and data analytics focused on meeting quality standards and increasing yield before and after singulation. SPTS provides a broad range of etch and deposition process solutions for advanced packaging applications. Orbotech offers a portfolio of technologies that includes automated optical inspection (AOI), automated optical shaping (AOS), direct imaging (DI), UV laser drilling, inkjet/additive printing and software solutions to ensure manufacture of the highest quality of IC substrates.
-
S-102 -
Notice
The EDFA slot module of FOTS system with built-in power booster EDFA module offers a special function that is able to change the optical signal amplification feature variously, which is followed by user’s driving embedded pump LD freely. The output power of eash pump LD can be controlled separately by the program that is set up by user. When an optimum optical signal amplification particularity is needed, it is made up so that it can be materialized by choosing the Default mode provided along with User mode. More stable application of EDFA is possible through the monitoring of the factors such as in/out signal power, gain, alarm status and pump LD enabled by the application of FPGA processor which makes high speed driving possible. It is also set up that user’s present-time monitoring and control through LCD monitor of system main frame or GUI display for remote control can be possible. Through optimization of amplifier gain, noise figure, and saturated output power, this EDFA module will expand test capabilities in systems, components or sub-assembly manufacturing.
-
Rocky Mountain Laboratories, Inc.
Scanning Electron Microscopy (SEM Analysis) can produce images of almost any sample at magnifications of 15-300,000X. The SEM has tremendous depth of field allowing for imaging that cannot be accomplished using optical microscopy. Conductive and nonconductive samples can be imaged. When operated in the backscatter (BSE) detection mode, differences in material composition can be observed. Elemental analysis can be performed on any feature observed with an integrated Energy Dispersive Spectroscopy (EDS) detector.
-
Macom Technology Solutions Holdings Inc.
MACOM's optoelectronics products include a wide range of transimpedance amplifiers (TIA) for line and client side fiber optic receivers up to 1.6 Tbps . Our portfolio includes linear TIAs for coherent and PAM-4 receivers and limiting TIAs for NRZ based receivers. These parts feature market leading gain, noise performance and power dissipation. They are available in die form for integration with photo-detectors in an optical sub-assembly as well as integrated TIA with a CDR..
-
Macom Technology Solutions Holdings Inc.
MACOM's optoelectronics products include a wide range of transimpedance amplifiers (TIA) for line and client side fiber optic receivers up to 1.6 Tbps . Our portfolio includes linear TIAs for coherent and PAM-4 receivers and limiting TIAs for NRZ based receivers. These parts feature market leading gain, noise performance and power dissipation. They are available in die form for integration with photo-detectors in an optical sub-assembly as well as integrated TIA with a CDR..
-
Model T100H -
Teledyne Advanced Pollution Instrumentation
The Model T100H SO2 analyzer uses the proven UV fluorescence principle with the high measurement ranges and interferent rejection needed for extractive source monitoring. The Model T100H provides a simple but precise solution for a broad range of CEM and stack testing applications.The instrument design provides minimal quenching by O2 or CO2 and less than a 0.1% response to water in the sample. Additionally, special optical filtering reduces the effects of NO interference.
