Failure Analysis
examination of faults, determine root cause and recommend corrective actions.
See Also: Crush, Performance Testing, Investigation
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Data Analysis
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Power Monitoring and Diagnostic Technology Ltd.
PMDT Engineers are always available to review your test samples and to provide guidance to users in the field. Our PD experts have the ability to accurately analyze various types of field test data based on PRPD/PRPS spectrums, waveforms and audio files collected during a field test.
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Phase Failure Detectors
DSP
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Your product The DSP-1L or DSP-1LM is used to protect your three-phase motors against phase loss, imbalance, or reversal. It continuously monitors each phase of your power supply. In case of a problem, it cuts the power to the control circuit to protect the affected motor.
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Time-Frequency Analysis, Time-Series Analysis and Wavelets
LabVIEW Advanced Signal Processing Toolkit
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Includes the LabVIEW Digital Filter Design Toolkit (also available separately)Time-series analysis -- statistical analysis for description, explanation, prediction, and controlTime-frequency analysis -- analytical, graphical tools for signals with evolving frequency contentWavelet and filter-bank design for short-duration signal characterization, noise reduction, and detrendingIncluded in all NI Software Suites
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Spectrum Analysis
S95090B
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The S95090B spectrum analyzer (SA) measurement software adds high-performance microwave spectrum analysis to PXI VNAs. With fast stepped-FFT sweeps resulting from optimized data processing, the SA software application provides quick spurious searches over broad frequency ranges. The S95090B software uses the PXI network analyzer's test and reference receivers to complete simultaneous spectrum measurements. Multi-channel SA measurements leverage the PXI VNA's internal swept-signal generators for efficient measurements of spurious signals emanating from mixers and frequency converters. The S95090B spectrum analyzer software application employs source-power and receiver-response calibration as well as fixture de-embedding, providing in-fixture and on-wafer spectrum measurements with the highest level of accuracy. Optional external attenuators should be connected with the VNA’s test ports to avoid receiver compression when measuring large signals.
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Sound and Vibration Analysis
Compact Analysis
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Compact Analysis is an ArtemiS SUITE module which is focused on the basic functions and the ideal tool for tasks that only require a few clicks.
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Analysis Software
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We offer comprehensive software solutions for analyzing sound and vibration as well as communication and audio quality. Thanks to a modular structure, users can tailor specific solutions to their individual requirements.
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Vibration Control & Analysis Systems
APEX Series
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The UD APEX Vibration Controller is now available with up to 32 input channels. Two hardware configurations are offered, the popular APEX SL with 4-16 channels, and the all new APEX PRO with 20-32 channels (both configurable in 4 channel increments). Each unit offers the latest technology in digital signal processing and shaker control algorithms providing real time vibration test control for Random, Sine, Shock, Resonance Dwell, SRS, Random on Random, Multi-tone Sine on Random, Multi-Sine Control, TRAC (time replication acceleration control) testing and Transducer Calibration, as well as extensive data acquisition and analysis. The vibration controller modular software may be initially customized for specific applications or easily expanded in the future without performance penalties. The vibration controller software provides an abundance of comprehensive features that ensure simple, safe, accurate and reliable vibration testing.
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High Power Beam Analysis
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The advantages of fiber lasers are their high power, mechanical stability and good beam quality; however beam quality and beam profile has to be periodically checked. In general, there are many difficulties in checking beam quality especially at the focal point, where densities will exceed 50KWatt per square cm. On one hand those energies are capable of melting and destroying most known materials, while on the other hand measuring a focused profile is the most significant measurement.
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Simulation And Analysis Software
fcXplorer Analyzer
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Avionic Interface Fiber Channel Simulation and Analysis Test Software, fcXplorer, is an easy-to-use graphical user interface for Fiber Channel Simulyzer modules. fcXplorer is designed for troubleshooting, optimization, planning and configuration of fiber channel data. The low and high level protocol analysis offers acquisition, filtering, time stamping and interpretation of Fiber Channel data traffic and generates statistics.
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Electrical Grounding Analysis
GroundMat
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SKM GroundMat is a program for substation ground grid design and analysis. It is designed to help optimize grid design or reinforce existing grids of any shape. It uses a general-purpose finite element algorithm for potential analysis and graphical facilities to validate ground system efficiency
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Dynamic Image Analysis (DIA)
CAMSIZER
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Dynamic Image Analysis (DIA) is a modern particle characterization method for the determination of size distributions and shape parameters. It allows quick analyses with excellent accuracy and reproducibility over an extremely wide measuring range. With the renowned CAMSIZER system, Microtrac introduced its first Dynamic Image Analyzer over 20 years ago and has pushed technological innovation ever since.
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Enable Non-Invasive Analysis
Sparklike Handheld™
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Sparklike Handheld™ is practical and quick method to test IG gas concentration. Technology is based on plasma emission spectroscopy. A high voltage spark is launched in the IG unit's cavity causing a light emission which is observed and analyzed further.
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MPI Automated Probe Systems
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MPI Advanced Semiconductor Test
MPI’s 200 mm and 300 mm automated probe systems are dedicated and designed to address current and future requirements for all facets of Device Characterization for Modeling and Technology/Process Development, Failure Analysis, Design Verification, IC engineering, Wafer Level Reliability as well as special requirements for MEMS, High Power, RF and mmW device testing.
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Signal Analysis
FFT Analysis
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The program FFT (Fast Fourier Transform) Analysis is used for narrow-band spectral processing of signals coming from the input channels of ADC modules and FFT spectrum analyzers (in real-time or recorded time realization view mode), as well as for viewing various spectral characteristics of signals.
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Machine Tool Analysis
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HEIDENHAIN offers comparator encoders for the calibration and acceptance testing of machine tools. These modular sytems deliver very high measurement accuracies with optical scanning and a sturdy measuring standard. Robust and easy-to-use, they are well-equipped for frequent usage under shopfloor conditions.
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Chemical Analysis
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The chemists at IMR have numerous analytical tools at their disposal, all geared toward providing accurate, NIST traceable analyses of metals and process solutions. The staff is experienced, professional, and knowledgeable in the latest analytical techniques.
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DFT Testability Analysis Software
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Landrex Technologies Co., Ltd.
DFT Testability Analysis Software
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Dynamic Signal Analysis Software
ObserVIEW
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Vibration Research Corporation
View, edit, and analyze waveforms from recorded or live data. This powerful and efficient vibration analysis software package includes specialized modules for waveform recording and test generation.
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Elemental Analysis Instruments
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Chongqing TOP Oil Purifier Co., LTD
Your product description goes here.
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Thermal-Optical Analysis
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As with other current organic carbon and elemental carbon (OC/EC) procedures, Thermal-Optical analysis is method-defined. However, this unit has been designed to specifically address some of the problems observed in other methods in assigning carbon to either the organic or the elemental fraction.
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X-ray Diffraction and Elemental Analysis
N8 HORIZON
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The N8 HORIZON is a powerful tool for both high-end research and for multi-user facilities investigating a variety of nano-materials from solid bulks, to fibers, surfaces or biological samples.
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Imaging & Analysis
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Microscopes offered by Buehler generally fall into the categories of stereo microscopes, upright microscopes, or inverted microscopes. Inverted microscopes are commonly referred to as metallurgical microscopes. Microscopes may offer episcopic (reflected light) observation, diascopic (transmitted light) observation, or both possibilities. Illumination may be delivered in bright field mode (BF) or dark field mode (DF), and several techniques such as differential interference contrast (DIC) and polarized light microscopy make use of the nature of light to reveal specific pieces of information when studying materials.
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Failure and Technology Analysis
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Failure analyses in order to clarify the failure cause soonest possible.From single device to the whole system - and from highly complex IC up to printed circuit board (PCB), mounting & interconnection technology and printed board assembly (PBA).
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DisplayPort v1.3 Protocol Analysis Probe
FS4500
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The FuturePlus FS4500 DisplayPort Analysis Probe provides a mechanical, electrical and software interface to the DisplayPort bus, a digital display interface standard supported by the Video Electronics Standards Association (VESA). The FS4500 is used to design and debug computer motherboards, monitors, home theater systems, and silicon chips incorporating DisplayPort technology.
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Fatigue Failure Tester
EKT-2002FF
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EKT-2002FF Flexing Fatigue Tester is designed in accordance with ASTM D4482 to test the fatigue life under a tensile strain cycle on different kinds of vulcanized rubber compound to determine the fatigue life at various extension ratios.
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Measurement, Data Analysis, Visualization, Automation
Imc STUDIO
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With imc STUDIO, you are ready to start your measurement in a few minutes. A clearly organized channel configuration list, extensive sorting and filtering functions, numerous assistants, built-in sensor management and support of TEDS are just some of the useful functions for achieving quick, intuitive system configuration.
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Wafer Analysis Systems
Tropel®
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Corning Specialty Materials has a long heritage of providing solutions to semiconductor equipment manufacturers. The Tropel line of wafer analysis equipment enables measurement of wafer substrates from 2” to 450mm regardless of material type and surface finish.
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Liquid Analysis
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Sensors for conductivity measurements and detection of air and gas bubbles.
