AFM Atomic Force Microscope

FM-Nanoview 6800 - Zhengzhou Nanbei Instrument Equipment Co. Ltd (NB)

All-in-one design, smart structure and shape.Scan head and sample stage are designed together, strong anti-vibration performance .Precision laser detection and probe alignment device make laser adjustment simple and easy.Adapt servomotor to drive the sample approaching tip manually or automatically, to realize precision scanning area positioning.