Fine Pitch Probes FP800D2901B050G025L057

Fine Pitch Probes FP800D2901B050G025L057

The Fine Pitch Probes FP800D2901B050G025L057 are engineered for precision applications requiring outstanding reliability and performance across various temperature ranges. Designed within the FP-D family, these double plunger probes are optimal for tight pitch applications, featuring a pitch measurement of 1.00 mm / 39 mils, and are capable of operating effectively from -45°C to +200°C. Their compact design, with an overall length of 5.70 mm and a projection height of just 1.10 mm, makes them suitable for use in high-density electronic assemblies where space is a critical factor.

In terms of electrical performance, the FP800D2901B050G025L057 probes can handle a continuous current of up to 3.50 A, while maintaining a minimal typical contact resistance of 55 mOhm. Moreover, they are designed to perform at frequencies of up to 7.10 GHz, ensuring high-speed data integrity for demanding applications. Mechanically, these probes exhibit a preload of 10.00 cN with a maximum travel capability of 0.85 mm, ensuring optimal contact while minimizing wear. Crafted from high-quality materials, the probes feature beryllium copper plungers with gold plating, ensuring both excellent conductivity and resistance to corrosion, thereby enhancing their lifespan and reliability in various environments.

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