Chemical Analysis + Surface Analysis

Chemical Analysis + Surface Analysis

Our suite of analytical techniques include: Scanning Electron Microscopy with Energy Dispersive X-ray Spectroscopy (SEM/EDS), Auger Electron Spectroscopy (AES), X-ray Photoelectron Spectroscopy (XPS), Fourier Transform Infrared Spectroscopy (FTIR), Secondary Ion Mass Spectrometry (SIMS), Scanning Probe Microscopy (SPM or AFM), and metallography/cross sectioning.