Auto Spectroscopic Ellipsometer

The PH-ASE spectroscopic ellipsometer measures thickness, refractive index and extinction coefficient of single films and multilayer stacks. Reflection measurements at different incident angles and transmission measurements can be carried out and combined with ellipsometric data.

Product Home Contact/Sales Company Catalog Share Add To List

Topics

Ellipsometers
Phase Angle
Refractive Index
Single Phase
Measurement
Data
Phase
Film
Transmission
Reflection