Showing results: 31 - 45 of 54 items found.
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Applied Image, Inc.
Siemens/RIT/Other Targets by Applied Image - RIT Alphanumeric Chart, Siemens/Star Sector Target, Resolution 2-Cycle Long Test Chart, Sayce Target, Resolution Linear Test Chart, Ultra-High Resolution Target, Digital/Electronic Pixel Target
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Applied Image, Inc.
Barcode symbol quality has been at the forefront of discussion among practitioners in the automatic identification and data capture (AIDC) industry since they were invented in 1951. Barcodes became commercially successful when they were used to automate checkout systems at grocery stores, with the very first scanning of the Universal Product Code (UPC) on a pack of Wrigley Company chewing gum in June 1974. The Uniform Code Council (UCC) published barcode quality guidelines, and ANSI X3.182-1990 became the first published standard for barcode quality. Since then, ISO/IEC 15416 for 1D symbols and ISO/IEC 15415 for 2D symbols have become the global standards for grading printed barcodes.
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AP-M Series -
Applied Image, Inc.
With both X & Y axis metric scales, these dual axis targets are ideal for calibrating optical magnification in microscopes, linear distance, stage motion and squareness. In addition, with the larger area calibration scale, the calibration of low power optical systems over the longer distances can be easily carried out. The AP-M is offered on two standard materials; Glass (CG) and Opal (OP).
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Applied Image, Inc.
The Sinusoidal Array SINE M-13-60 is designed to be used for evaluating systems that work in the reflective mode such as scanners, machine vision systems and cameras. It is imaged on Photo Paper in four different sizes getting larger from 1X – 8X. The ½X and 1X slides incorporate the same spatial frequencies. Spatial frequencies for the 2X, 4X and 8X versions are 1/2, 1/4 and 1/8 respectively.
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Applied Image, Inc.
Verifier and scanner manufacturers often require custom barcodes for product evaluation, calibration, and quality control. Whether it’s a single code or a composite sheet of multiple codes, symbologies, minimum x dimension, etc., APPLIED IMAGE produces these custom, photo-composed standards to meet the needs of our global base of customers using our proprietary ACCUedge® technology.
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Applied Image, Inc.
FBI / MITRE Test Charts & Kits by Applied Image - FBI SIQT Scanner Test Chart, Individual Personal Identity Verification Test Charts for Single Fingerprint Capture Devices, Personal Identity Verification Kits for Single Fingerprint Devices
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Applied Image, Inc.
AIIM Test Charts (Scanner/Microfilm/Digital/ Copier) by Applied Image - Motion-Rotary Target, Planetary-Static Target, Small Area Target/AIIM MS-303-1980, Small Scanner Resolution Target , Copier Test Array, Rotary Test Target/AIIM X113, Film Strip Target, Eastman Kodak Copier/Scanner Digital Test Target, Small Color MTF Target
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Applied Image, Inc.
With the amount of applications that optical components have, no one could hope to have the perfect component for every possible scenario. For this reason, APPLIED IMAGE makes easy the process of designing, building, and delivering custom components to our customers. Our engineering process is designed to produce the best parts in the industry and more importantly, the best component for your specific needs. The APPLIED IMAGE experience will cover the project with expert engineers from start to finish. Use the form below to start the conversation for checkerboard and dot arrays, stage and image analysis micrometers, reticles and machine vision components.
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Applied Image, Inc.
For calibrating and analyzing microscopy measurement systems, the IAM line of Image Analysis Micrometers are perfectly suited. Calibrated to NIST Standards, and imaged with the best line edge quality in the industry, the IAM series is a diversified line of slides that function in areas of color calibration (IAM-9C), Optical Magnification, Frame Distortion, and other applications. Custom features, substrates, sizes and designs are available as custom solutions.
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Applied Image, Inc.
The SM Series of Stage Micrometer Calibration Standards is ideally suited for calibrating optical, imaging, video as well as reticle based measurement systems. Designed for ease of use and manufactured for durability, the SM Series has both English and Metric scales in one or two axis configurations. Our SM series covers a range of low to high power systems, and can always be custom manufactured to perfectly fit your needs.
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Applied Image, Inc.
The APPLIED IMAGE series of Image Analysis and Stage micrometers are ideally suited for calibrating optical, imaging, video, and reticle-based measurement systems. Designed for ease of use and manufactured for durability, the SM Series has both English and Metric scales in one or two axis configurations. Both types of micrometers come with NIST traceable calibration standards and are available on multiples substrates to perfectly fit your needs. The experience APPLIED IMAGE has in manufacturing precision imaged optical components makes us the trusted source for standards for magnification system microscopy and vision applications. Should you need to alter feature patterns, size, or substrate, fill out our Custom Optical Components and Standards form to start the conversation.
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AI-CCS-ITF-14 -
Applied Image, Inc.
This test card is ideal for testing verifiers, scanners, and other ITF-14 (Interleaved 2 of 5) barcode reading equipment. It also can serve as an excellent training aid to ensure new operators are using the proper methodology and are proven competent in the use of verifiers.
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AI-CCS-DATABAR -
Applied Image, Inc.
This test card is ideal for testing verifiers, scanners, and other GS1-DataBar barcode reading equipment. It also can serve as an excellent training aid to ensure new operators are using the proper methodology and are proven competent in the use of verifiers.
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AI-CCS-128-E Rev B -
Applied Image, Inc.
This test card is ideal for testing of verifiers, scanners, and other GS1-128 barcode reading equipment. It also can serve as an excellent training aid to ensure new operators are using the proper methodology and are proven competent in the use of verifiers.
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AP-D Series -
Applied Image, Inc.
All machine vision lenses will show some type of distortion. Minimizing or correcting that distortion is crucial in most applications. The ACCUplace Dot Patterns target is designed to check, verify, or quantify barrel distortion in vision systems, alignment between multiple optical systems, and can calibrate instruments with both vision and motion systems. The indexed columns and rows of dot features provide reference points that make alignment and distortion detection simple and straightforward. The AP-D is offered on four standard materials; Glass (CG) Opal (OP) Photopaper (RM) and Film (TM).