Showing recent results 1 - 15 of 24 products found.
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USB-1149.1/CFM - Corelis
The USB-1149.1/CFM High-Speed single-TAP boundary-scan controller makes adding JTAG test to Teradyne ICTs a snap. Designed specifically for integration into Teradyne TestStation and GR228x testers, the USB-1149.1/CFM offers a clean, convenient boundary-scan solution.
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Corelis
The benefits of boundary-scan are noticed in all phases of a product life cycle. By coupling the power of Corelis boundary-scan tools with an In-Circuit Tester (ICT), a complete, integrated solution is available that offers the best advantages of both technologies.Boundary-scan operates as the perfect companion to ICT. Boundary-scan is capable of testing areas of printed circuit board assemblies that are difficult to access due to physical space constraints and loss of physical access, which is often due to fine pitch components such as Ball Grid Array (BGA) devices. Conversely, the ICT is able to check the non-boundary-scan compatible portion of the unit under test (UUT) such as analog.
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QuadTAP/CFM - Corelis
The Corelis QuadTAP/CFM high-speed multi-TAP boundary-scan system makes advanced, multi-TAP boundary-scan testing within ICT systems a reality. By combining ICT and boundary-scan, test engineers gain benefits from both technologies for the highest possible test coverage, speed, and capability.Specifically designed for integration into Teradyne TestStation and GR228x testers, the QuadTAP/CFM and QuadTAP/CFM Expander enable a clean, convenient multi-TAP boundary-scan solution.
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JTAG Interrrogator - Corelis
Top manufacturers have used JTAG tests for years to ensure electronic systems are free from defects and assembled correctly. With growing uncertainty in supply chains and the proliferation of counterfeit components, that same technology can be used to verify the authenticity of system components. The Corelis JTAG Interrogator is an affordable solution for semiconductor verification. The software and hardware system provides the means to quickly identify components on an assembled electronic product by reading available information from the JTAG chain.
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Corelis
Corelis offers services to validate the accuracy of Boundary-Scan Description Language (BSDL) files that characterize the boundary-scan functionality of semiconductor devices. These services include validation of a device's BSDL file while the chip is still in development and BSDL file accuracy verification against actual silicon.
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CAS-1000-I2C/E - Corelis
The CAS-1000-I2C/E has all the power, flexibility, and features you need to debug, validate, and test the I2C bus circuitry on your board. It is an advanced instrument used in the monitoring and testing of boards and systems incorporating one or more I2C integrated circuits.
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BusPro-I™ - Corelis
The BusPro-I has all the power, flexibility, and features you need to monitor and debug the I2C bus circuitry on your board. The BusPro I2C can be used to monitor and log I2C bus traffic in real-time, generate I2C transactions to communicate with peripheral components on the bus, and in-system program I2C compatible EEPROMs.
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Corelis
Design for Testability ReviewCorelis can provide you with design consultation and an analysis of your design for boundary-scan testability. We will review your design and make specific recommendations that if implemented will improve the testability. We can also suggest improvements that will increase test coverage and allow boundary-scan to be implemented in a more cost-effective manner.
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Corelis
Detecting faults early with accurate diagnostics is key to maintaining a high quality, rapid production line. The versatility of boundary-scan allows signals to be controlled and observed independently of the system logic, for quick and easy functional testing of logic components as soon as the system can be powered upno additional software required. Tests for logic clusters can be created using simple data vectors, or a powerful C-based scripting language can be used for advanced sequences.
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USB-1149.1/4E - Corelis
The USB-1149.1/4E is a high-performance plug-and-play IEEE-1149.1 Boundary-Scan (JTAG) controller for the Universal Serial Bus (USB 2.0). The USB-1149.1/4E is a high-speed device compliant with Revision 2.0 of the USB Bus Specification.
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BusPro-S™ - Corelis
The BusPro-S High-Speed Multi-IO SPI Host is designed with speed, versatility, and value in mind. Featuring a 60 MHz clock rate with up to 200 Mb/s throughput and support for standard, dual, quad, and 3-wire modes, the BusPro-S is the right tool for all SPI debugging applications-present and beyond.
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USB-1149.1/1E - Corelis
The USB-1149.1/1E is a high-performance plug-and-play IEEE-1149.1 Boundary-Scan (JTAG) controller for the Universal Serial Bus (USB 2.0). The USB-1149.1/1E is a high-speed device compliant with Revision 2.0 of the USB Bus Specification.
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Corelis
Corelis offers the BusPro-I™ and CAS-1000-I2C™ bus analyzer products to satisfy different technical needs and price points. Corelis bus analyzers and exercisers offer analysis, test, and debug capabilities for product development, system integration, and manufacturing of digital boards and systems. All of our bus analyzers are PC-based and come with a Windows-based software package.
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Corelis
Whether developing new code for an embedded system prototype, programming components on the manufacturing line, or updating code in the field, Corelis’ in-system-programming (ISP) tools make it easy to integrate device programming with your test process.
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NetUSB-1149.1/SE - Corelis
8-TAP USB 2.0 and LAN Based JTAG Controller. The NetUSB-1149.1/SE is an advanced 8-TAP USB 2.0 and LAN-based JTAG/boundary-scan controller that can be used in the testing and/or in-system programming (ISP) of devices, boards, or systems compliant with the IEEE-1149.1 standard.
