A world leader in the field of IEEE-1149.1 boundary-scan testing, JTAG In-System-Programming (ISP) of Flash memories & CPLDs, JTAG emulation test and debugging, serial bus analyzers, and semiconductor authentication. A division of EWA Technologies Inc.

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  • 562-404-6196
  • 13100 Alondra Blvd.
    Cerritos, CA 90703
    United States

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Showing recent results 1 - 15 of 36 products found.

  • Manufacturing Test


    Today’s high density designs limit the amount of test coverage obtainable through bed-of-nails testing, driving the need for JTAG/boundary-scan based tests to ensure a high level of discovery and diagnosis of manufacturing faults. Whether integrating boundary-scan with an in-circuit-test system using Corelis’ powerful API or operating a standalone benchtop test station, Corelis ScanExpress products offer immense value and high return on investment. Best of all, Corelis tools can be used throughout the product life-cycle, providing additional value and allowing test engineers to re-use and adapt the same boundary-scan tests for all test phases.

  • In-Circuit Tester Integration


    The benefits of boundary-scan are noticed in all phases of a product life cycle. By coupling the power of Corelis boundary-scan tools with an In-Circuit Tester (ICT), a complete, integrated solution is available that offers the best advantages of both technologies.Boundary-scan operates as the perfect companion to ICT. Boundary-scan is capable of testing areas of printed circuit board assemblies that are difficult to access due to physical space constraints and loss of physical access, which is often due to fine pitch components such as Ball Grid Array (BGA) devices. Conversely, the ICT is able to check the non-boundary-scan compatible portion of the unit under test (UUT) such as analog.

  • JTAG Boundary-Scan Controller

    NetUSB-1149.1/SE - Corelis

    8-TAP USB 2.0 and LAN Based JTAG Controller. The NetUSB-1149.1/SE is an advanced 8-TAP USB 2.0 and LAN-based JTAG/boundary-scan controller that can be used in the testing and/or in-system programming (ISP) of devices, boards, or systems compliant with the IEEE-1149.1 standard.

  • JTAG/Boundary-scan Digital I/O Module

    ScanIO-300LV - Corelis

    The ScanIO-300LV JTAG/boundary-scan digital I/O module turns an IEEE-1149.1 boundary-scan controller (such as the Corelis PCI-1149.1/Turbo or NetUSB-1149.1) into a powerful digital interconnect and functional tester. 

  • JTAG Boundary-Scan Toolkit Software & Hardware Bundle

    JTAG Starter Kit - Corelis

    The Corelis JTAG Starter Kit includes the ScanExpress Debugger software application with a USB 2.0 JTAG controller. Engineers and technicians alike can use the system for a variety of tasks. The JTAG Starter Kit has an arsenal of features to control and observe system signals of a boundary scan compatible UUT.

  • JTAG USB Controller

    NetUSB-1149.1/E - Corelis

    The NetUSB-1149.1/E (4 TAPs) is an advanced USB 2.0 and LAN-based controller that can be used in the testing and/or in-system programming (ISP) of devices, boards, or systems compliant with the IEEE-1149.1 standard. The NetUSB-1149.1/E controller supports concurrent (gang) testing and in-system programming of CPLDs and Flash devices at TCK rates of up to 80MHz.The controller connects to the computer either through the USB interface or LAN interface for easy installation at nearby or remote locations. Other features include signal delay compensation for long cable lengths to the UUT, TAP signals, and GPIO discrete signals which are individually programmable from 1.25V to 3.3V, programmable slew rate control and pre-power up test for shorts between power and ground traces on the UUT.

  • High-Speed 4-TAP USB 2.0 JTAG Controller

    USB-1149.1/4E - Corelis

    The USB-1149.1/4E is a high-performance plug-and-play IEEE-1149.1 Boundary-Scan (JTAG) controller for the Universal Serial Bus (USB 2.0). The USB-1149.1/4E is a high-speed device compliant with Revision 2.0 of the USB Bus Specification.

  • High-Speed Multi-IO SPI Host Adapter

    BusPro-S™ - Corelis

    The BusPro-S High-Speed Multi-IO SPI Host is designed with speed, versatility, and value in mind. Featuring a 60 MHz clock rate with up to 200 Mb/s throughput and support for standard, dual, quad, and 3-wire modes, the BusPro-S is the right tool for all SPI debugging applications-present and beyond.

  • High-Speed USB 2.0 JTAG Controller

    USB-1149.1/1E - Corelis

    The USB-1149.1/1E is a high-performance plug-and-play IEEE-1149.1 Boundary-Scan (JTAG) controller for the Universal Serial Bus (USB 2.0). The USB-1149.1/1E is a high-speed device compliant with Revision 2.0 of the USB Bus Specification.

  • High-Volume JTAG Production Test

    ScanExpress Runner Gang™ - Corelis

    ScanExpress Runner Gang enables concurrent (gang) JTAG/boundary-scan testing and in-system programming of CPLDs and Flash devices for multiple boards using a single PC and a single operator.

  • In-System Programmer

    ScanExpress Programmer™ - Corelis

    ScanExpress Programmer is designed to replace the clutter of in-system programmers with a single universal programming solution comprised of a scalable architecture for future expandability. ScanExpress Programmer is a universal in-circuit programming tool that can program and verify Flash memories, serial EEPROMs, CPLDs, FPGAs, and other programmable logic devices. ScanExpress Programmer provides common programming functions including read, erase, blank check, program, verify, device ID check, and others. All of these functions can be performed while the target device is installed in-circuit. Users no longer have to maintain different programming tools to program different parts. ScanExpress Programmer offers users one common GUI for all supported programmable devices.

  • I2C Bus Analyzer and Exerciser Products


    Corelis offers the BusPro-I™ and CAS-1000-I2C™ bus analyzer products to satisfy different technical needs and price points. Corelis bus analyzers and exercisers offer analysis, test, and debug capabilities for product development, system integration, and manufacturing of digital boards and systems. All of our bus analyzers are PC-based and come with a Windows-based software package.

  • In-System Programming


    Whether developing new code for an embedded system prototype, programming components on the manufacturing line, or updating code in the field, Corelis’ in-system-programming (ISP) tools make it easy to integrate device programming with your test process.

  • Interactive Debugging Solution

    ScanExpress JTAG Debugger™ - Corelis

    ScanExpress JTAG Debugger is an excellent tool for engineers doing debug during prototype design verification and testing. It is very useful for finding shorts and opens on and between BGA devices and other fine-pitch components. ScanExpress Debugger allows interactive control and observation of all the boundary-scan controllable inputs and outputs on a Unit Under Test (UUT). It can also apply data to inputs of clusters and read their responses if the cluster I/Os are accessible via boundary-scan components. The ScanExpress Debugger software includes an interactive Graphical User Interface (GUI), as shown to the right, that assists the user in setting and monitoring the state of pins on the UUT. A powerful Pin and Netlist browser with filtering and sorting capabilities allows you to easily select the pins and/or nets of interest and insert them into the main debug window for various data manipulation. All debug sessions can be saved and later recalled for reuse.

  • 4 TAP JTAG Boundary-scan Controller for Teradyne Systems

    QuadTAP/CFM - Corelis

    The Corelis QuadTAP/CFM high-speed multi-TAP boundary-scan system makes advanced, multi-TAP boundary-scan testing within ICT systems a reality. By combining ICT and boundary-scan, test engineers gain benefits from both technologies for the highest possible test coverage, speed, and capability.Specifically designed for integration into Teradyne TestStation and GR228x testers, the QuadTAP/CFM and QuadTAP/CFM Expander enable a clean, convenient multi-TAP boundary-scan solution.