Advantest Corp.
Automated Testing Equipment (ATE) verify the quality, performance and reliability of semiconductors by electrically testing these complex and multifarious functions of semiconductors with high accuracy. The automated testing technologies from Advantest at the top of the industry are contributing to higher efficiency in production on customer sites, technological innovations of the electronics industry, and greater safety, security and comfort for society.
- +81-3-3214-7500
- +81-3-3214-7712
- webmaster@advantest.com
- Shin Marunouchi Center Bldg.
1-6-2, Marunouchi, Chiyoda-ku,
Tokyo, 100-0005
Japan
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Product
MASK MVM-SEM® E3600 Series
E3650
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Amid the progress of multiple-exposure technology, and the development of finer-pitch and more complicated circuits, as well as increases in the number of masks and the number of measurement points on each mask, the size of wiring patterns formed on photomasks needs to be measured and evaluated stably with high precision. Advantest’s E3600 series meets the needs of state-of-the-art devices with high measurement repeatability and stable throughput.
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Product
HiFIX High Fidelity Tester Access Fixture
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The HiFIX lineup delivers clean waveform transmission, precision docking, and multi-DUT parallel test, with high reliability.
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Product
Memory Test Systems
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ICs that record and retain data are called memory devices. Our memory test systems are optimized for volume production of memory semiconductors, a market where low-mix high-volume production is the norm, and feature industry-best parallelism (the ability to test a large number of semiconductors at the same time).
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Product
Memory Test System
T5801
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Capable of Testing Ultra-High-Speed DRAM Devices, Supporting Next-Generation GDDR7, LPDDR6, and DDR6 Technologies
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Product
Flash Memory Test System
T5830
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T5830 memory tester, the latest member of its T5800 product family, optimized for testing a wide range of flash memory devices used in mobile electronic devices. The highly flexible T5830 tester has all of the capabilities needed to perform wafer sorting and final testing of price-sensitive flash memories.
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Product
WAFER MVM-SEM
E3300 Family
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The E3310 is a WAFER MVM-SEM* for next generation wafers, supporting 1Xnm node process development and volume production at the 22nm node and beyond. With its high-speed carrier system employing a dual arm vacuum robot, and low-vibration platform to improve measurement accuracy, the E3310 delivers high throughput and performance for wafer measurements. Its multi detector configuration and unique 3D measurement algorithm also enable stable, high-accuracy measurement of 3D transistor technologies such as FinFET. The E3310 makes a significant contribution to reducing process development turnaround time and improves productivity for next-generation devices.
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Product
Memory Test System
T5835
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The new T5835 has full testing functionality, from package testing to high-speed wafer testing, for any memory ICs with operating speeds up to 5.4 Gbps, including all next-generation memories from NAND flash devices to DDR-DRAM and LPDDR-DRAM. It can handle 768 devices simultaneously for final package-level testing. It additionally features functions such as an enhanced programmable power supply (PPS) for advanced mobile memories, and a real-time DQS vs. DQ function to improve yield.
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Product
CD-SEM
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Our CD-SEM tools measure the width, height, sidewall angle, etc. of wiring patterns on semiconductor photomasks and wafers.
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Product
Device Interface
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Providing flexible, dependable services for device interface design, development, ordering, production, and support. The importance of the device interface has greatly increased, as high speed, high density semiconductor devices are more rapidly developed, and as customers more severely demand high accuracy, high reliability, and high productivity of testing.
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Product
SSD Test Systems
MPT3000ES / MPT3000ES2
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Using the same high-performance electronics and powerful software as all products in the MPT3000 family, the MPT3000ES and MPT3000ES2 engineering stations feature a small footprint configured to test up to eight SSDs in parallel. The system's small size and ability to plug into a standard AC outlet enable users to conduct program development and interactive device debugging in either office or lab settings.
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Product
Automated Test Equipment
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These systems test semiconductor performance and quality with industry-leading precision and cost efficiency. Robust support for semiconductor design evaluation, volume production ramps, and yield improvement.
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Product
Memory Test Systems
T5503HS2
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Semiconductor memories are in high demand to meet the needs of fast-growing end markets such as portable electronics and servers. It has been forecasted that applications ranging from mobile devices and data centers to automobiles, gaming systems and graphics cards will consume an estimated 120 billion gigabits of DRAM capacity. To meet this market demand, new generations of memories with data-transfer speeds of 6.4 Gbps and higher are being developed. Advantest’s second-generation T5503HS2 tester is designed to handle these ultra-high-speed memory ICs.
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Product
MASK MVM-SEM® E3600 Series
E3630
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Together with the miniaturization of semiconductors, high-accurate and stable measurement and evaluation is needed for circuit patterns such as mask patterns and holes. Advantest's E3600 series are used by a wide variety of companies, from semiconductor manufacturers to photomask makers to device and materials producers.
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Product
Terahertz Systems
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Terahertz waves are electromagnetic waves in the frequency band between radio waves and light waves. It combines the transmissivity of radio waves and the straightness of light waves and provides fingerprint spectra based on intermolecular interactions from small molecules to high polymers. By utilizing of this characteristic for spectroscopic and imaging measurements, it is possible to apply them to nondestructive analysis that has never been done before.
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Product
Memory Test System
T5851/T5851ES
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The T5851 system is designed to provide a cost-effective test solution for evaluating high-speed protocol NAND flash memories including UFS3.0 universal flash storage and PCIe Gen 4 NVMe solid-state drives (SSD), both of which are expected to be in high demand for the LTE 5G communications market.
Children
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W2BI Inc.
W2BI envisages an optimized user experience of seamless communication between an array of wireless devices defined by adaptability, inclusivity and independence. We envision W2BI as being the global forerunner in shaping this interoperability within the automated wireless industry. A member of the Advantest Group
Children
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Cloud Testing Service, Inc.
CloudTesting™ Service leverages recent advances in cloud computing that have transformed the concept of ownership from physical possession of an asset to a licensing agreement, with the asset itself residing in the cloud. Applying this paradigm to semiconductor test, we built a business model that expands customer access to testers by delivering test IP directly to their personal computers.
Children
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R&D Altanova
R&D Altanova is the leading provider of full turn-key test interface solutions specializing in Advanced Technology Printed Circuit Board Engineering, Design, Fabrication, and Assembly and Manufacturing services.
