MICRONICS JAPAN CO.LTD.
Micronics Japan Co., Ltd. ( MJC ) was founded in 1970 to provide maintenance services for electronic measuring equipment. In 1973, we developed and marketed peripheral products for the semiconductor industry. Our first probe card was released into the Japanese market in 1976. Our Manual Prober #1 was completed in 1977. The first LCD Prober was marketed in 1985 by MJC. Today, we are proud to keep the leading company position to provide various probing solutions for the Semiconductor and LCD industries.
- +81-422-21-0201
- sales@mjcelectronics.com
- 68, Samjak-ro 143-gil, Ojeong-gu, Bucheon-si
Gyeonggi-do, 421-806
Korea, Republic of
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product
Probe Cards
Probe cards are the key in measuring reliability in the ever-evolving testing of semiconductor integrated circuits, which are becoming faster, more compact, and more efficient. We provide a variety of probe cards tailored to customer needs and test environments, always at the highest level of quality.
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product
Semiconductor Test Equipment
IC Tester
Equipment to determine the pass/fail of devices in the wafer inspection process and the final inspection process after packaging.
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product
Package Probe
Test Socket
Jigs for testing the electrical characteristics of devices in the final testing stage after LSI package assembly.To match the increasingly high functionality of LSIs for communications and networks, such as mobile phones and mobile devices, we provide two types of test sockets: The "J-Contacts" series suited for high-frequency, high-performance devices, and the "BeeContacts" series, spring probes with a unique structure that delivers excellent contact stability.
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product
Wafer Probers
Devices to align probes to test the electrical properties of IC chips or TEGs (Test Element Groups) formed on wafers. The vast options available will meet various needs, from research to mass production.
