Teradyne, Inc.
Teradyne tests and helps build the world’s most innovative products. Our leading-edge testers make sure that new products work right the first time, every time. And our robotics portfolio helps manufacturers to develop and deliver new products quickly, efficiently and cost-effectively.
- +1 800-837-2396
978 370-2700 - 978 370-1100
- customercare@teradyne.com
- 600 Riverpark Drive
North Reading, MA 01864
United States
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product
In-Circuit Test System
TestStation LX
TestStation LX is a cost-effective in-circuit test solution providing high-volume electronics manufacturers with reliable, high-quality test for the latest printed circuit board assembly technologies.
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Autonomous Mobile Robots
AMRs
Teradyne’s portfolio of autonomous mobile robots (AMRs) automates material handling tasks with payloads from 100 kg (200 lbs) to 1350 kg (10,000 lbs).Mobile Industrial Robots (MiR) is the leading company in this space. It offers high-performance, easy to deploy solutions that increase the efficiency of in-house transportation and logistics.
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Test System for High Volume Production Testing of Integrated Circuits
ETS-364
The ETS-364 is a general-purpose precision analog and mixed-signal test platform designed for high volume production testing of integrated circuits; optimized for high throughput applications with a fully integrated multisite software and hardware architecture.
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Semiconductor Testing
Teradyne’s semiconductor test portfolio is transforming the way you test chipsets for automotive, industrial, communications, consumer, smartphones, and computer and electronic game applications. Semiconductor devices span a broad range of functionality, from very simple low-cost devices such as appliance microcontrollers, operational amplifiers or voltage regulators to complex digital signal processors and microprocessors as well as memory devices.
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Functional Test for Engineering Lab
Spectrum BT
Designed to meet the needs of product engineering labs, production lines, test development centers, and repair depots, the Spectrum BT is a configurable and scalable functional test system. This focused system solves typical functional test coverage challenges throughout the defense/aerospace product life cycle—and it’s upgradable as test requirements evolve.
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Image Sensor Testing
IP750Ex-HD Family
The IP750EX-HD has been the test platform that has enabled the industry to manufacture high quality CCD and CMOS image sensors, and it is the most economical platform to meet the needs of newer technologies such as Time of Flight (ToF) sensors. When you use a smartphone, high performance digital still camera, or in-home security and surveillance system, these applications have image sensors most likely tested by Teradyne’s IP750ExHD.
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Smart Factory Solutions
Smart4Metrics Factory 4.0
Teradyne’s Smart4Metrics Factory4.0 solution closely integrates the TestStation in-circuit tester operating conditions, status and health data with existing data collection systems in the factory. By providing a single interface to convey both production data and production tester data, correlation of production results with other equipment or environmental conditions is easily integrated.
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Asynchronous System Level Test Platform
Titan
The Titan System Level Test (SLT) platform delivers maximum flexibility, scalability and density in semiconductor test environments that require the highest levels of system performance testing. Titan is Teradyne’s solution for high-volume mobile application processor SLT requirements.
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Parallel Memory Test Solution
Magnum2
Teradyne’s Magnum 2 test system delivers high throughput and high parallel test efficiency for high performance non-volatile memories, static RAM memories and logic devices.
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TestStation Product Family
TestStation In-Circuit Test Systems provide full structural and functional coverage for a wide-range of manufacturing, component, process, and performance for high-performance analog, digital, and mixed-signal devices used on modern PCBs.
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Memory Test Software
Teradyne’s customers count on us for our Near Device Under Test (DUT) technology that gives memory device manufacturers a guaranteed performance advantage. A brief description of dynamic memory and storage memory devices will highlight why device manufacturers depend on Teradyne’s memory test solutions.
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High-Speed Digital Bus Test Instruments
Teradyne and AIT instruments test legacy and newer digital buses.The enormous variety of digital buses used in defense and aerospace applications requires comprehensive, yet efficient testing.Teradyne and AIT COTS instruments meet these challenging bus test requirements for legacy and standardized buses, as well as evolving digital buses that have faster speeds, larger data volumes, and increasingly complex protocols requiring real-time test and emulation.
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product
High-Performance Integrated Functional Test Platform
Spectrum-9100™
The Spectrum-9100 is a fully integrated functional test system for factory, depot, and intermediate test applications. It’s the “go to” tester for users needing a mix of digital, analog, mixed-signal, and bus test capabilities across a wide range of products—from legacy boards to advanced systems.
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Offline In-Circuit Test Solutions
TestStation’s offline test systems are designed for a human operator or collaborative robot for product handling. TestStation systems scale to support from 128 to 15,000 test points. Our newest Multi-Site systems double productivity per system, reducing Capex and Opex for manufacturers.
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Functional Test System Optimized For Real-Time Digital Bus Test
Spectrum HS
Spectrum HS is Teradyne’s fully integrated functional test system. Optimized for real-time test of low latency buses, it’s a high-performance system delivering excellent test coverage of current and future products.