Ametek Scientific Instruments
AMETEK Scientific Instruments has been recognized as a global leader in the design and manufacture of instrumentation for scientific research, particularly in the field of electrochemistry and weak AC signal recovery.
- 801 S Illinois Avenue
Oak Ridge, TN 37830
United States of America
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Product
Non-contact Optical Surface Profiler
VS-OSP
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The VersaSCAN OSP integrates the Base with a high-accuracy, high-speed laser displacement sensor. The OSP technique uses diffuse reflection mechanism to measure topography of a sample. OSP can be used to measure topography, as a very sensitive leveling mechanism, or charting topography to be implemented with other scanning probe techniques for constant-distance mode operation.
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Product
Photoelectrochemical Test System
SolarLab XM
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SolarLab XM is an application specific XM (Xtreme Measurement) product that is primarily focused on solar cell / photovoltaic research, developed in conjunction with Professor Laurie Peter of the University of Bath, UK.
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Product
Battery Analyzer
SI-9300R
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Conventional cycler systems use PCs to transfer data from cycler channels to disk. SI-9300R instead uses advanced technology to write data direct to disk without PC intervention. For high channel count systems this dramatically reduces PC workload, increases system reliability and allows the PCs to concentrate on test control, channel monitoring and data analysis.
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Product
High Temperature Test System
129620A
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Solartron Analytical, specialists in the design of precision impedance test equipment, has joined forces with high temperature Furnace specialists Carbolite, and sample holder specialists NorECS to produce a range of advanced high temperature materials characterization test systems.
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Product
Constant Distance SECM
VS-STYLUS
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In collaboration with SENSàSION, we are pleased to offer the Soft Stylus Probe contact mode technique developed by Professor Hubert Girault and co-workers of the Laboratory of Physical and Analytical Electrochemistry (LEPA) at the École Polytechnique Fédérale de Lausanne (EPFL) for constant distance SECM. The probe technology offers the following benefits:
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Product
Single Channel Potentiostats
VersaSTAT Series
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This family of instruments combines our option-based hardware and software platforms to create the most popular line of potentiostats. Introduced for the majority of researchers doing typical electrochemical experiments, this entire series gained a key improvement in 2018. As of August 1st, 2018, all VersaSTAT models have ± 2 Amp capability standard. Users can now study larger samples at faster rates.
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Product
Scanning Electrochemical Microscope
VS-SECM (DC And AC)
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The SECM integrates a positioning system, a bipotentiostat, and an ultramicroelectrode probe or tip. The positioning system moves the probe close to the surface of the sample, within the local imaging zone. The bipotentiostat can polarize the probe only (feedback mode) or the sample and the probe independently (generator-collector mode), while measuring the resulting current(s). The probe is specially designed to have a specific tapered polish (per the RG ratio) and active radius below 100 microns. The positioning system scans the probe and charts position with measured electrochemical parameters, creating a data map of local current.
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Product
Potentiostat Galvanostat
PARSTAT 4000A
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The PARSTAT 4000A stands alone in its ability to deliver high compliance voltage and wide dynamic current range, as standard, to cover a range of applications. The PARSTAT 4000A builds on PAR's history as the world-leader in DC electrochemical measurements and takes advantage of a common R/D team with Solartron Analytical, the world-leader in Frequency Response Analyzer (FRA) technology, to provide a best-in-class complete system.
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Product
Solar Test Systems
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AMETEK Scientific Instruments manufactures a range of application specific XM (Xtreme Measurement) products focused on solar cell / photovoltaic research (developed in collaboration with Professor Laurie Peter of the University of Bath, UK). These products are so versatile that they can also be used for photoelectrochemical (PEC) water splitting applications; and make use of Solartron’s unique high performance XM specified potentiostats and frequency response analyzers to provide a full complement of techniques for research into energy, corrosion and analytical electrochemistry.
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Product
Multichannel Potentiostats
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Multi Channel potentiostats/galvanostats from Princeton Applied Research and Solartron Analytical assist researchers increase their scope from the examination of a single sample at a time to multiple samples simultaneously. While providing the same level of accuracy as the single channel potentiostats, multi channel potentiostats can be configured to scale with your research today as well as provide solutions for the next step in your electrochemical research plan tomorrow.
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Product
Potentiostats
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AMETEK SI offers a range of bipotentiostats, single and multi channel potentiostats and galvanostats through both the Princeton Applied Research and Solartron Analytical brands.
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Product
Localized Electrochemical Impedance Spectroscopy
VS-LEIS
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The VersaSTAT 3F applies an AC voltage to the sample emerged in electrolyte. This "global" voltage generates AC current to flow at the electrode / electrolyte interface. A dual-element probe is positioned in solution close to the surface of the sample. The electrometer measures a differential voltage measure between the two measurement elements as a measure of local voltage-drop in solution. This voltage-drop exists in solution because of current flow from local reactions at the sample, the resistance of the electrolyte and the spatial separation of the dual measurement elements.
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Product
Photoelectrochemical Test System
ModuLab XM
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The system, based upon Solartron Analytical's world-leading experience in transfer function measurements, offers a high-quality measurement platform for characterizing a range of photoelectrochemical devices such as DSSC's, Perovskite cells, and Photoanodes," noted Professor Laurie Peter, world leading expert, University of Bath, UK. Professor Peter acted as scientific advisor during the development of the ModuLab PhotoEchem system and helped ensure the system met the requirements of the most demanding photovoltaic researchers in the market today.
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Product
Scanning Kelvin Probe Microscope
VS-SKP
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The Kelvin Probe experiment uses a nondestructive method to determine the relative work function difference between the probe and the sample. Work function describes the energy required to liberate an electron from the surface of a conductor; electrochemists often interpret this as the difference from an electrode’s Fermi Level, average energy of electrons, and that of vacuum.
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Product
Materials Test System
ModuLab XM MTS
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I-V (voltage scans with current measurement - used to characterize electronic and dielectric materials)P-E (polarization / electric field - used to run hysteresis tests to characterize ferroelectric materials) High-speed pulse (used to activate charge carriers in electronic and dielectric materials)Staircase and smooth stepless analog ramp waveformsImpedance, admittance, permittivity / capacitance, electrical modulusC-V capacitance - voltage, Mott-SchottkyAutomatic sequencing of time domain and impedance/capacitance measurements























