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sbRIO-9871, Non-Enclosed, 4-Port, RS485/RS422 C Series Serial Instrument Control Module
780879-01
The sbRIO‑9871 adds RS485/RS422 serial ports to CompactRIO systems. The serial ports are accessed directly from the FPGA to offer you flexibility in communicating with serial devices. The module has individual buffers on every port that save FPGA space and simplify programming. The sbRIO‑9870 supports standard start bit, stop bit, and handshaking settings. It uses an external power to provide maximum compatibility and reliability under all serial port conditions. Non-enclosed modules are designed for OEM applications.
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Integrated AI-ADAS ECU And Cameras For Large Commercial Vehicle
ADM-TJ30
The integrated AI-ADAS ECU is connected to 8 cameras and powered by the vision-AI algorithm. It can detect and classify different kinds of vehicles/ pedestrians/ two-wheeler riders/ lane marking and other objects to perform multiple ADAS functions.
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NVIDIA GPU And Intel® Xeon® AI Computing Platform For Autonomous Drive Applications
AVA-3510
The AVA-3510 Series is powered by an Intel® Xeon® E processor coupled with workstation-grade Intel®C246 chipset to support up to 64 GB ECC DDR4 memory. The system incorporates one 2.5" SSD 256G for easy installation as optional accessories for fast read/write performance.
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Autonomous Driving AI Decision Making ECU
ADM-AL30
ADM-AL30 is dedicated to Autonomous Driving Applications. Powered by Intel® 12th Gen Core i9/i7 CPU and the NVIDIA RTX 4000 SFF Ada GPU, this AI computing platform can process huge amounts of data and make crucial decisions for autonomous vehicles. Equipped with 2 x 10G Base-T and 8 x 1G Base-T1 automotive ethernet ports, as well as 8 x CAN FD and 4 x CAN 2.0 interfaces, it seamlessly integrates into any automotive ecosystem. Plus, its ISO 16750-2 and ISO 7637-2 ensure reliability and safety under the most demanding conditions.
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Scanning Electron Microscopy (SEM Analysis)
Rocky Mountain Laboratories, Inc.
Scanning Electron Microscopy (SEM Analysis) can produce images of almost any sample at magnifications of 15-300,000X. The SEM has tremendous depth of field allowing for imaging that cannot be accomplished using optical microscopy. Conductive and nonconductive samples can be imaged. When operated in the backscatter (BSE) detection mode, differences in material composition can be observed. Elemental analysis can be performed on any feature observed with an integrated Energy Dispersive Spectroscopy (EDS) detector.
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Optical Microscopy
Rocky Mountain Laboratories, Inc.
Optical microscopy from 1X to 1000X is achieved with a variety of microscopes. Images can be formed in bright field, dark field, and differential interference contrast (DIC or ‘Nomarski’) modes. Optical microscopy anlaysis is often used before any other techniques to document samples. Color and morphology are important clues in materials identification.
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Microscopy Software/Hardware
ZEISS Atlas 5
Atlas 5 is your powerful hardware and software package that extends the capacity of your ZEISS scanning electron microscopes (SEM) and ZEISS focused ion beam SEMs (FIB-SEM). Use its efficient navigation and correlation of images from any source, e.g. light- and X-ray microscopes. Take full advantage of high throughput and automated large area imaging. Unique workflows help you to gain a deeper understanding of your sample.
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Microscopy Software
Our modular software platforms enable you to acquire, process and analyze images in multiple dimensions and over various timepoints
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General Microscopy
Nano-scale precision motion and stability are cornerstones of research grade microscopes for high resolution imaging. Mad City Labs provides nanopositioning systems, micropositoining systems, and stabilization systems that assist users with developing and adapting instrumentation for their own application requirements. Contact our sales and engineering team to discuss the right products for your application.
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Electronics
Electromagnetic, Signal Integrity, Thermal and Electro-Mechanical Simulation Solutions. The use of Ansys Electronics solution suite minimizes the testing costs, ensures regulatory compliance, improves reliability and drastically reduces your product development time. All this while helping you build the best-in-class and cutting-edge products. Leverage the simulation capability from Ansys to solve the most critical aspects of your designs
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Laser Raman Microscopy System
RAMANforce/RAMANtouch
Nanophoton is the pioneer of confocal laser scanning microscopy and spectroscopic analysis. To celebrate, we relaunch our fastest and highest resolution confocal Raman microscope RAMANtouch/RAMANforce. With a newly designed spectrograph and the latest optical technologies, RAMANtouch/RAMANforce’s spatial resolution and sensitivity have been highly improved, making it the optimal solution for all applications.
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X-ray Microscopy
Xradia Family
✔ Characterize the properties and behaviors of your materials non-destructively.✔ Reveal details of microstructures in three dimensions (3D).✔ Develop and confirm models or visualize structural details.✔ Achieve high contrast and submicron resolution imaging even for relatively large samples.
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Electronic Instruments
The ORTEC range of modular electronics includes instruments in NIM formats as well as other modular instruments, such as photomultiplier bases, preamplifiers and other accessories. ORTEC also offers modular instruments for pulse height spectroscopy, fast timing, counting, high voltage power supplies and other special functions.
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Electronic Design
We design and build custom racks, special switching systems, RF systems and custom Digital/ Analog sub assemblies. The hardware can be packaged per your requirements, using industry standard modules, rack mounted instruments, or custom made packaging. Extensive LabVIEW, embedded and other programming languages development are available as part of our hardware control support.
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Analytical Software for Microscopy
SPIP
SPIP™ or Scanning Probe Image Processor - is an advanced software package for processing and analyzing microscopic images at nano- and microscale. It has been developed as a proprietary software by Image Metrology and is unique in the microscopy and microscale research market. With the high level of usable features, SPIP provides industrial and academic researchers with an advanced toolkit for working with microscope images, incl. extracting data from most microscopy file types, cleaning and enhancing data, analyzing measurements, visualizing and reporting analysis results. The software is used for research and innovation in a variety of industries such as pharmaceutical, cosmetics, semiconductors, hard disk manufacturing, polymer and aluminum manufacturing. Furthermore, SPIP is widely recognized as the standard microscope image analysis software for research and education at leading universities, and has been cited in more than 1200 scientific publications.
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Electronic
Our electronic switches offer single or dual setpoints, adjustable time delays, external setpoint adjustments and more.
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Electronic Assembly
WinSoft employees succeed in some of the most demanding assembly operations - from aerospace disciplines, automotive, electronic manufacturing services and consumer products to COTS products.
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Electronic Ammeters
The device puts out a voltage that is proportional to a magnetic field to which it is exposed.
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Electronic Autocollimators
The concept of autocollimation as an optical instrument was conceived about a century ago for accurate, non-contact measurements of angles. Recent novel photonics upgrades have created a new breed of Autocollimators, offering intricate measurement capabilities for optics, laser profiling, AR/VR/XR goggles alignment, cameras for auto-driving, VCSEL characterization and many more applications with a single instrument packed with multi-tech technologies.
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Electronic Loads
SLM 1 / 4 Chassis
AMETEK Programmable Power, Inc.
From the leader in programmable power products, Sorensen introduces the SL series electronic loads which offer the best value with the most flexible platform. A wide range of loads are available from 75-1800W with both DC and AC input in benchtop, modular and standalone form factors.
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Microscopy
Our microscopy systems business is focused on providing best-in-class performance within a modular architecture. We design and manufacture Andor products to integrate with our own and third-party software, and all leading microscopes, we also support high quality products from other manufacturers.
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Analytical Software for Microscopy
SPIP
SPIP™ or Scanning Probe Image Processor - is an advanced software package for processing and analyzing microscopic images at nano- and microscale. It has been developed as a proprietary software by Image Metrology and is unique in the microscopy and microscale research market. With the high level of usable features, SPIP provides industrial and academic researchers with an advanced toolkit for working with microscope images, incl. extracting data from most microscopy file types, cleaning and enhancing data, analyzing measurements, visualizing and reporting analysis results. The software is used for research and innovation in a variety of industries such as pharmaceutical, cosmetics, semiconductors, hard disk manufacturing, polymer and aluminum manufacturing. Furthermore, SPIP is widely recognized as the standard microscope image analysis software for research and education at leading universities, and has been cited in more than 1200 scientific publications.
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Electronic Loads
T3EL Series
The T3EL series is a family of single channel, 200 & 300 Watt Electronic Loads that are ideal for R&D, product validation and Q&A in a bench or automated environment for low to medium power applications starting from 60mA, such as electronic components, batteries, portable chargers and power products. Electronic Loads are typically used to provide a load to the outputs of a power supply, usually capable of dynamic loading, and are fully programmable. Electronic Loads help designers to test electronic power products and ensure quality, reliability, and performance.
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Laser Electronics
A device that emits light through a process of optical amplification based on the stimulated emission of electromagnetic radiation.
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Pine Electronics
Specializing in low-mid volume electronic manufacturing services, Pine Electronics, Inc. offers a wide range of printed circuit board assembly (PCB assembly), cable and box build assembly solutions. Our equipment, engineering and technical talent serves both multi-national and regional customers throughout the United States. Known for full-service PCB assembly work, Pine Electronics, Inc. is highly integrated and responsive. Each customer has a designated representative for all commercial and technical questions. This personalized service model enhances communication, expedites project development, and represents Pine’s commitment to customer service.
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Electron Spectrometers
SPECS Surface Nano Analysis GmbH
Nanotechnology is focused on the engineering and the physical properties of small structures. Therefore techniques that have sensitivities at a scale of 0.1 nm to 100 nm are required to study these structures. Different methods of electron spectroscopy (XPS, UPS and AES) have a sensitivity in this range and are therefore key techniques in nanoscience.Thanks to our high level of expertise in electron optics and electronics we can offer electron spectrometers with the highest resolution and transmission possible.
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Electronic System Design
ESD
Smart connected devices are everywhere, in homes, in transportation, and at work. This means electronic system design (ESD) is having a greater influence on almost every type of product requiring new simulation tools to help achieve electronic, electrical, mechanical, thermal, and connectivity goals. Altair’s simulation-driven design tools enable your team of specialized engineers to collaborate across all aspects of printed circuit board development from concept to manufacturing. Our products streamline your process, eliminate design iterations, and reduce time-to-market.
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Electronic Crockmeter
TESTEX Testing Equipment Systems Ltd.
Crockmeter, to determine the colour fastness of textiles to dry or wet rubbing. Electronic Crockmeter complies with ISO 105×12/D02, AATCC 8/165, BS 1006-D02, etc. Crockmeter is useful in crockmeter test and Crockmeter price is competitive.
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Cathodoluminescence Solutions for Electron Microscopy
CLUE Series
HORIBA Scientific's Cathodoluminescence Universal Extension enhances any SEM’s analytical capabilities while maintaining its original functionality. Since the sample is able to remain in the same spot, CLUE can easily be combined with other microscopy applications, such as EDS and EBIC.
